Semiconductor device having a storage capacitor
First Claim
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1. A semiconductor device comprising:
- a substrate having a metal surface;
a base insulating film formed on the substrate having the metal surface;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film; and
a storage capacitor comprising a portion of the substrate having the metal surface, the exposed portion of the base insulating film, and the metal wiring.
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Abstract
In a semiconductor device having a substrate which has a metal surface, an insulating film which is formed on the substrate having the metal surface, and a pixel unit which is formed on the insulating film; the pixel unit includes a TFT, and wiring lines connected with the TFT, and a storage capacitor is constituted by the substrate (11) having the metal surface, the insulating film (12), and the wiring line (21). As the insulating film is thinner, and as the area of a region where the insulating film and the wiring line lie in contact is larger, the storage capacitor is endowed with a larger capacity.
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Citations
36 Claims
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1. A semiconductor device comprising:
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a substrate having a metal surface;
a base insulating film formed on the substrate having the metal surface;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film; and
a storage capacitor comprising a portion of the substrate having the metal surface, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A semiconductor device comprising:
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a substrate having a metal surface;
a base insulating film formed on the substrate having the metal surface;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film and electrically connected to the gate electrode of the current controlling thin film transistor; and
a storage capacitor comprising a portion of the substrate having the metal surface, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A semiconductor device comprising:
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a substrate having a metal surface;
a base insulating film formed on the substrate having the metal surface;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film and electrically connected to the semiconductor layer of the switching thin film transistor; and
a storage capacitor comprising a portion of the substrate having the metal surface, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (14, 15, 16, 17, 18)
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19. A semiconductor device comprising:
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a metal substrate;
a base insulating film formed on the metal substrate;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film; and
a storage capacitor comprising a portion of the metal substrate, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (20, 21, 22, 23, 24)
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25. A semiconductor device comprising:
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a metal substrate;
a base insulating film formed on the metal substrate;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film and electrically connected to the gate electrode of the current controlling thin film transistor; and
a storage capacitor comprising a portion of the metal substrate, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (26, 27, 28, 29, 30)
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31. A semiconductor device comprising:
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a metal substrate;
a base insulating film formed on the metal substrate;
a switching thin film transistor and a current controlling thin film transistor, both formed on the base insulating film in a pixel unit, wherein each of the thin film transistors comprises a semiconductor layer and a gate electrode with a gate insulating film interposed therebetween;
an interlayer insulating film formed over the switching thin film transistor and the current controlling thin film transistor, wherein a portion of the interlayer insulating film is removed so as to expose a portion of the base insulating film;
a metal wiring formed on the exposed portion of the base insulating film and electrically connected to the semiconductor layer of the switching thin film transistor; and
a storage capacitor comprising a portion of the metal substrate, the exposed portion of the base insulating film, and the metal wiring. - View Dependent Claims (32, 33, 34, 35, 36)
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Specification