Method and apparatus for two dimensional surface property analysis based on boundary measurement
First Claim
1. A method for determining properties of a conductive film, comprising:
- selecting a plurality of probe locations proximate a periphery of the conductive film;
measuring electrical resistance along a plurality of measurement lines, the plurality of measurement lines comprising line segments extending between each probe location and at least some other probe locations in the plurality of probe locations;
analyzing the measured electrical resistances to determine a lumped parameter resistance model along the plurality of measurement lines; and
estimating an electrical resistivity value at a selected location on the conductive film encompassed by measurement lines extending between at least three of the plurality of probe locations.
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Accused Products
Abstract
An apparatus and method for determining properties of a conductive film is disclosed. A plurality of probe locations selected around a periphery of the conductive film define a plurality of measurement lines between each probe location and all other probe locations. Electrical resistance may be measured along each of the measurement lines. A lumped parameter model may be developed based on the measured values of electrical resistance. The lumped parameter model may be used to estimate resistivity at one or more selected locations encompassed by the plurality of probe locations. The resistivity may be extrapolated to other physical properties if the conductive film includes a correlation between resistivity and the other physical properties. A profile of the conductive film may be developed by determining resistivity at a plurality of locations. The conductive film may be applied to a structure such that resistivity may be estimated and profiled for the structure'"'"'s surface.
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Citations
62 Claims
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1. A method for determining properties of a conductive film, comprising:
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selecting a plurality of probe locations proximate a periphery of the conductive film; measuring electrical resistance along a plurality of measurement lines, the plurality of measurement lines comprising line segments extending between each probe location and at least some other probe locations in the plurality of probe locations; analyzing the measured electrical resistances to determine a lumped parameter resistance model along the plurality of measurement lines; and estimating an electrical resistivity value at a selected location on the conductive film encompassed by measurement lines extending between at least three of the plurality of probe locations. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method for determining surface properties of a structure, comprising:
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applying an electrically conductive film to a surface of the structure; selecting a plurality of probe locations proximate a periphery of the conductive film; measuring electrical resistance along a plurality of measurement lines, the plurality of measurement lines comprising line segments extending between each probe location and at least some other probe locations in the plurality of probe locations; analyzing the measured electrical resistances to determine a lumped parameter resistance model along the plurality of measurement lines; and estimating an electrical resistivity value at a selected location on the conductive film encompassed by measurement lines extending between at least three of the plurality of probe locations. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
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33. A method for determining surface properties of a structure bearing an electrically conductive film over a surface of the structure, comprising:
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selecting a plurality of probe locations proximate a periphery of the conductive film; measuring electrical resistance along a plurality of measurement lines, the plurality of measurement lines comprising line segments extending between each probe location and at least some other probe locations in the plurality of probe locations; analyzing the measured electrical resistances to determine a lumped parameter resistance model along the plurality of measurement lines; and estimating an electrical resistivity value at a selected location on the conductive film encompassed by measurement lines extending between at least three of the plurality of probe locations. - View Dependent Claims (34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47)
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48. A system configured for determining surface properties of a structure bearing an electrically conductive film over a surface thereof, comprising:
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a plurality of probes adapted for measuring an electrical resistance when placed at a plurality of probe locations proximate a periphery of the conductive film; a signal controller operably coupled to each of the plurality of probes and configured for selecting at least one pair of probes of the plurality of probes at any given time; a signal sampler operably coupled to the signal controller and configured for sampling the electrical resistance between probes of the selected at least one pair of probes; and a processor operably coupled to the signal sampler and configured for; analyzing a plurality of sampled electrical resistances to determine a lumped parameter resistance model; and estimating an electrical resistivity value at a selected location on the conductive film encompassed by at measurement lines extending between least three of the plurality of probe locations. - View Dependent Claims (49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62)
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Specification