Attachable/detachable variable spacing probing tip system

• US 6,967,473 B1
• Filed: 05/27/2004
• Issued: 11/22/2005
• Est. Priority Date: 05/27/2004
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Hagerup, William A., Martin, Jim L., Pooley, William R., Reed, Gary W.
• Primary Examiner(s): Nguyen, Vinh
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US10/856,376
• Publication Number:
  US 20050264276A1
• Time in Patent Office: 544 Days
• Field of Search: 324/72.5, 324/133, 324/149, 324/754, 324/755, 324/758, 324156-157
• US Class Current: 324/149
• CPC Class Codes: G01R 1/06711 Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact and the other end coupled to an electrical contact pad on a electrical contact pad portion of the flexible substrate. Each of the probing arm portions has a generally S-shaped fold therein extending from the support members to the electrical contact portion of the flexible substrate. The housing includes means for pivoting the probing arms. The rear surface of the housing has a resilient member disposed therein. Latching means in the housing secures the electrical contact pad portion of the flexible substrate to the rear surface of the housing. Opposing attachment arms from a rear surface of the housing.

Claims

1. An attachable/detachable variable spacing probing tip system for a measurement probe comprising:

a housing having a cavity therein defined by top, bottom, side and rear surfaces with the cavity exposed at an opening in the housing opposite the rear surface and opposing attachment arms extending generally orthogonally from a rear surface of the housing;

at least a first non-compressive set, resilient member disposed in the rear surface of the housing;

first and second pivoting probing arms disposed in the cavity of the housing with the distal ends of the first and second probing arms extending outward from the opening in the housing, the first and second pivoting probing tip arms having first and second support members and first and second probing arm portions of a flexible substrate secured to the respective first and second support members, the flexible substrate having an electrical contact pad portion with at least first and second electrical contact pads and each of the first and second probing arm portions having at least a first electrically conductive trace with one end of each of the electrically conductive traces coupled to one of the first and second electrical contact pads and the other end coupled to a probing contact with each of the first and second probing arm portions having a generally S-shaped fold therein extending from the first and second support members to the electrical contact pad portion of the flexible substrate with the electrical contact pad portion extending from the rear surface of the housing;

means disposed in the housing for pivoting the first and second pivoting probing arms; and

latching means for securing the electrical contact pad portion of the flexible substrate to the rear surface of the housing with the first and second electrical contact pads disposed adjacent to the non-compressive set, resilient member.

2. The attachable/detachable variable spacing probing tip system as recited in claim 1 wherein each of the first and second electrically conductive traces further comprises passive electrical elements disposed on the flexible substrate and electrically coupled to the respective first and second conductive traces.

3. The attachable/detachable variable spacing probing tip system as recited in claim 2 wherein the passive electrical elements comprise discrete surface mounted resistive elements.

4. The attachable/detachable variable spacing probing tip system as recited in claim 2 wherein the passive electrical elements comprise printed resistive elements formed on the flexible substrate.

5. The attachable/detachable variable spacing probing tip system as recited in claim 2 wherein the passive electrical elements comprise discrete surface mounted resistive and capacitive elements.

6. The attachable/detachable variable spacing probing tip system as recited in claim 2 wherein the passive electrical elements comprise printed resistive and capacitive elements formed on the flexible substrate.

7. The attachable/detachable variable spacing probing tip system as recited in claim 1 wherein the electrical conductive traces on each of the probing arms portions of the flexible substrate further comprises a controlled impedance transmission line.

8. The attachable/detachable variable spacing probing tip system as recited in claim 7 wherein the controlled impedance transmission line further comprises a coplanar waveguide having a signal conductor trace and adjacent ground traces disposed on either side of the signal conductor trace.

9. The attachable/detachable variable spacing probing tip system as recited in claim 8 wherein each of the signal and ground traces of each coplanar waveguide is coupled to a corresponding electrical contact pad disposed on the electrical contact pad portion of the flexible substrate.

10. The attachable/detachable variable spacing probing tip system as recited in claim 7 wherein the controlled impedance transmission line further comprises a microstrip waveguide having a signal conductor trace on one surface of the flexible substrate a ground trace disposed below the signal conductor trace on another surface of the flexible substrate.

11. The attachable/detachable variable spacing probing tip system as recited in claim 10 wherein each of the signal and ground traces of each microstrip waveguide is coupled to a corresponding electrical contact pad disposed on the electrical contact pad portion of the flexible substrate.

12. The attachable/detachable variable spacing probing tip system as recited in claim 1 wherein the flexible substrate further comprises a lateral member disposed adjacent to the distal ends of the first and second pivoting probing arms and connected to the first and second probing arm portions.

13. The attachable/detachable variable spacing probing tip system as recited in claim 12 wherein the bottom surface of the housing has a raised surface laterally disposed in the opening of the housing for supporting the first and second pivoting probing arms and an axial raised portion disposed in the opening of the housing having an convex top surface extending above the laterally disposed raised surface coextensive with the lateral member of the flexible substrate.

14. The attachable/detachable variable spacing probing tip system as recited in claim 1 wherein the housing further comprises a first member having the top, side and rear surfaces of the housing with the top surface having an aperture therein and second member mounted to the first member having the bottom surface of the housing.

15. The attachable/detachable variable spacing probing tip system as recited in claim 14 wherein the pivoting means comprises:

a support plate disposed within the housing cavity having an aperture therein;

a knob having a top surface and a bottom surface disposed through the support plate aperture and the housing aperture, the top surface of the knob being exposed above the top surface of the housing and the bottom surface having first and second arcuate channels formed therein;

respective pivot pins disposed in each of the first and second pivoting probing arms and extending into respective pin apertures in the support plate;

respective cam pins disposed in each of the first and second pivoting probe arms and with each of the respective cam pins disposed in one of the first and second arcuate channels in the knob.

16. The attachable/detachable variable spacing probing tip system as recited in claim 15 further comprising a compliant member disposed in the housing adjacent to a rear surface of the support plate providing axial and lateral rotational movement of the first and second pivoting probing arms.

17. The attachable/detachable variable spacing probing tip system as recited in claim 16 wherein the compliant member comprises a non-compressive set, resilient material.

18. The attachable/detachable variable spacing probing tip system as recited in claim 1 wherein the attachment arms have a top surface and the latching means comprises:

an aperture formed in the electrical contact pad portion of the flexible substrate and lateral extensions forming respective downward facing shoulders on the sides of the electrical contact pad portion of the flexible substrate; and

an outwardly extending protrusion on the rear surface of the housing having an upwardly facing recess and recesses formed in the opposing attachment arms that extend downward from the top surface to form shouldered surfaces in the attachment arms that are adjacent to the rear surface of the housing wherein the upwardly facing recess of the outwardly extending protrusion receives the aperture in the electrical contact pad portion of the flexible substrate and the recesses receive the lateral extensions of the electrical contact pad portion of flexible substrate with the downward facing shoulders of the lateral extensions engaging the shouldered surfaces of the recesses.