X-ray inspection system
First Claim
1. An X-ray inspection system that examines an item under inspection located at an inspection region, the system comprising:
- an X-ray source located at the inspection region that exposes the item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of a first dimension, a second dimension and a third dimension;
an X-ray detector located at the inspection region that detects X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension;
a controller coupled to each of the X-ray source and the X-ray detector, that controls movement of the X-ray source and the X-ray detector in the first and second dimensions;
a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information;
wherein the controller is also configured to control movement of the X-ray source and the X-ray detector independently of each other in any of collinear directions and different directions to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation;
wherein the controller further comprises a central processing unit;
wherein the processor is configured to process the plurality of X-ray views to create a tiled scout view of the item under inspection; and
and wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received.
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Accused Products
Abstract
An X-ray inspection system and methodology is disclosed. The system comprises a conveyor, an X-ray source that exposes an item under inspection to X-ray radiation and at least one X-ray detector that detects X-ray radiation modified by the item. The X-ray source and X-ray detector may be movable in any of first and second dimensions. The X-ray source may also be moved in a third dimension to zoom in and out on regions of interest in the item order inspection. The system further comprises a controller that controls movement of the X-ray source and X-ray detector, independently of each other, in any of collinear and different directions, to provide a plurality of X-ray views of the item at varying examination angles of the X-ray radiation. A processor coupled to the controller may be configured to receive and process detection information from the X-ray detector and to provide processed information to an operator interface. The operator interface may also receive instructions from an operator input and provide the instructions to the controller.
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Citations
39 Claims
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1. An X-ray inspection system that examines an item under inspection located at an inspection region, the system comprising:
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an X-ray source located at the inspection region that exposes the item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of a first dimension, a second dimension and a third dimension; an X-ray detector located at the inspection region that detects X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension; a controller coupled to each of the X-ray source and the X-ray detector, that controls movement of the X-ray source and the X-ray detector in the first and second dimensions; a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information; wherein the controller is also configured to control movement of the X-ray source and the X-ray detector independently of each other in any of collinear directions and different directions to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation; wherein the controller further comprises a central processing unit; wherein the processor is configured to process the plurality of X-ray views to create a tiled scout view of the item under inspection; and and wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. An X-ray inspection system, comprising:
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an X-ray source located at an inspection region that exposes an item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of the first dimension, a second dimension and a third dimension; an X-ray detector located at the inspection region that detects X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension; a controller coupled to each of the X-ray source and the X-ray detector, that controls movement of the X-ray source and the X-ray detector in the first and second dimensions; a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information; wherein the controller is also configured to control movement of the X-ray source in the third dimension so as to provide varying levels of zoom of the processed information; further comprising an operator interface, coupled to the controller and the processor, that is configured to receive instructions from an operator input, to provide the instructions to the controller to control the movement of any of the X-ray source and the X-ray detector, and that is configured to receive and to present the processed information to an operator; wherein the controller is additionally configured to control movement of the X-ray source and the X-ray detector independently of each other, in any of collinear directions and different directions, to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation; wherein the controller further comprises a central processing unit; wherein the processor is configured to process the plurality of X-ray views to create a tiled scout view of the item under inspection, and to provide the tiled scout view to the operator interface; and wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received. - View Dependent Claims (20)
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21. A method of inspecting an item with an X-ray system, the method comprising acts of:
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exposing the item to X-ray radiation from an X-ray source; detecting the X-ray radiation modified by the item with an X-ray detector; processing information provided by the X-ray detector to provide processed information; moving the X-ray source in any of a first dimension and a second dimension to expose the item to X-ray radiation at a plurality of positions; and moving the X-ray detector, independently of the X-ray source, in any of the first dimension and the second dimension to detect the X-ray radiation at a plurality of examination angles and independently of a conveyor; further comprising acts of; providing the processed information at the plurality of examination angles to an operator interface; receiving from a remote inspection device information about the item; locating a region of interest in the item based on the information received; and wherein the act of processing the information comprises creating a tiled scout view of the item from X-ray images obtained at each of the plurality of positions. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A method of inspecting an item with an X-ray inspection system, the method comprising acts of:
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exposing the item to X-ray radiation from an X-ray source; detecting the X-ray radiation modified by the item with an X-ray detector; processing information provided by the X-ray detector to provide processed information; moving the X-ray source in any of a first dimension and a second dimension to expose the item to X-ray radiation at a plurality of positions; moving the X-ray detector in any of the first dimension and the second dimension to detect the X-ray radiation at a plurality of positions; and moving the X-ray source in a third dimension so as to provide varying levels of zoom of the processed information; moving a conveyor independently of the X-ray source and the X-ray detector; further comprising acts of; receiving from a remote inspection device information about the item; and locating a region of interest in the item based on the information received. - View Dependent Claims (36, 37, 38, 39)
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Specification