Calibration method and device for long range guided wave inspection of piping
First Claim
Patent Images
1. A method of calibrating long range guided wave signals from a pipe under test consisting of the following steps:
- first generating near a test area a first guided wave in said pipe under test by a transmitter probe and guided-wave instrumentation;
first propagating said first guided wave along said pipe under test;
first detecting in said pipe under test by a receiver probe and said guided-wave instrumentation first reflected signals from defects, if any;
placing a first reference reflector on said pipe under test near said test area, but outside a dead zone for guided waves;
generating a second guided wave in said pipe under test by said transmitter probe and said guided-wave instrumentation;
second propagating said second guided wave along said pipe under test;
second detecting in said pipe under test by said receiver probe and said guided-wave instrumentation second reflected signals from said first reference reflector and defect signals from said defects, if any;
correcting for attenuation in said reflected signals and said defect signals; and
calculating size of said defects using said first reflected signals and said second reflected signals.
4 Assignments
0 Petitions
Accused Products
Abstract
The present invention is for a simple, reliable and inexpensive method to calibrate a defect signal to determine the size of a defect in a pipe. A first reflected signal is received from the test area of the pipe. After attaching a clamp, a second reflected signal is received from the test area of the pipe. If defects are in the test area, by appropriate calculations using the first reflected signal and the second reflected signal, the size of the defect can be determined.
-
Citations
4 Claims
-
1. A method of calibrating long range guided wave signals from a pipe under test consisting of the following steps:
-
first generating near a test area a first guided wave in said pipe under test by a transmitter probe and guided-wave instrumentation; first propagating said first guided wave along said pipe under test; first detecting in said pipe under test by a receiver probe and said guided-wave instrumentation first reflected signals from defects, if any; placing a first reference reflector on said pipe under test near said test area, but outside a dead zone for guided waves; generating a second guided wave in said pipe under test by said transmitter probe and said guided-wave instrumentation; second propagating said second guided wave along said pipe under test; second detecting in said pipe under test by said receiver probe and said guided-wave instrumentation second reflected signals from said first reference reflector and defect signals from said defects, if any; correcting for attenuation in said reflected signals and said defect signals; and calculating size of said defects using said first reflected signals and said second reflected signals. - View Dependent Claims (2, 3, 4)
-
Specification