Electronics board life prediction of microprocessor-based transmitters

• US 6,970,003 B2
• Filed: 03/05/2001
• Issued: 11/29/2005
• Est. Priority Date: 03/05/2001
• Status: Active Grant

• Current Assignee: Rosemount Incorporated (Emerson Electric Company)
• Original Assignee: Rosemount Incorporated (Emerson Electric Company)
• Inventors: Eryurek, Evren, Kavaklioglu, Kadir, Rome, Gregory H.
• Primary Examiner(s): Deb, Anjan
• Assistant Examiner(s): Dole, Timothy J.
• Application Number:
  US09/799,824
• Publication Number:
  US 20020121910A1
• Time in Patent Office: 1,730 Days
• Field of Search: 324/718, 324/713
• US Class Current: 324/718
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844

Abstract

A field device includes circuitry to successively measure a parameter related to current drawn by electronics of the field device. The measurements are provided to a prediction engine which calculates a diagnostic output based upon the plurality of current-related measurements. The diagnostic prediction provided by the prediction engine can provide an estimate of viable life remaining for the device electronics. The diagnostic feature provides on-line status of the overall status of the field transmitter.

Claims

1. A field device, having two terminals coupleable to a 4-20 mA process control loop, the field device comprising:

device electronics drawing a supply current from the 4-20 mA process control loop;

supply current measurement circuitry adapted to measure a parameter related to supply current consumed by the device electronics while the field device is on line;

a memory structure adapted to receive and store data related to a plurality of successively measured supply current parameters; and

a prediction engine coupled to the memory structure to calculate a life estimate for the device electronics based upon the plurality of supply current parameters.

2. The field device of claim 1 wherein the field device is a process control transmitter.

3. The field device of claim 1 wherein the field device is a valve.

4. The field device of claim 1 wherein the prediction engine applies a linear curve-fit to the plurality of stored supply current parameter.

5. The field device of claim 1 wherein the prediction engine applies a non-linear curve-fit to the plurality of stored supply current parameter.

6. The field device of claim 1 wherein the memory structure is an array.

7. The field device of claim 1 wherein the memory structure comprises a plurality of arrays, the first array storing data related to a plurality of successively measured supply currents, and the second array containing data related to measurement time of the first array.

8. The field device of claim 1, wherein the prediction engine is adapted to use neural network analysis for calculation of the life estimate.

9. The field device of claim 1, wherein the prediction engine is adapted to use fuzzy logic for calculation of the life estimate.

10. A method of predicting board electronics lifetime in a field device, the method comprising:

successively measuring a plurality of parameters related to electronics supply current while the field device is on line;

applying a mathematical model to the successively measured supply current parameters; and

calculating a future time when the supply current is anticipated to reach a selected threshold.

11. The method of claim 10 wherein calculating the future time includes employing neural network analysis.

12. The method of claim 10 wherein calculating the future time includes employing fuzzy logic.

13. A field device coupleable to a two-wire 4-20 mA process control loop, the field device comprising:

device electronics;

supply current measurement circuitry coupleable to the 4-20 mA process control loop; and

means for predicting a residual life estimate of the device electronics based upon a plurality of successive supply current measurements while the field device is on line.