Method and apparatus for start-up of analog-to-digital converters

• US 6,970,120 B1
• Filed: 06/12/2004
• Issued: 11/29/2005
• Est. Priority Date: 06/12/2004
• Status: Active Grant

• Current Assignee: Synopsys Incorporated
• Original Assignee: Nordic Semiconductor ASA
• Inventors: Bjornsen, Johnny
• Primary Examiner(s): Mai, Lam T.
• Application Number:
  US10/866,438
• Publication Number:
  US 20050275572A1
• Time in Patent Office: 535 Days
• Field of Search: 341/120, 341/118, 341/155, 341/161
• US Class Current: 341/120
• CPC Class Codes: H03M 3/38 Calibration
• CPC Class Codes: H03M 3/414 having multiple quantisers arranged in cascaded loops, each of the second and further loops processing the quantisation error of the loop preceding it, i.e. multiple stage noise shaping [MASH] type

Abstract

An analog-to-digital (ADC) converter circuit that converts an analog input signal into a digital output circuit includes a calibration coefficient computation circuit for computing calibration coefficients of a calibration filter. The calibration coefficient computation circuit includes a switching device adapted to switch the analog input signal delivered to the ADC circuit between on and off states, and includes a pseudo-random signal generator adapted to input a pseudo-random signal to the ADC circuit. During a start-up phase of the ADC circuit, the ADC circuit, the switching device turns off the analog input signal to the ADC circuit, the pseudo-random signal generator inputs a pseudo-random signal into the ADC circuit, and the calibration coefficient computation circuit computes the calibration coefficients of the calibration filter. This ADC circuit configuration reduces startup time for the calibration filter to only a few clock cycles.

Claims

1. A method of calibrating an analog-to-digital converter circuit, comprising:

disabling an input signal to the analog-to-digital converter circuit;

inputting a pseudo-random signal to the analog-to-digital converter circuit;

measuring at least one of estimated gain and estimated integrator pole of the analog-to-digital converter circuit; and

calculating coefficients of a calibration filter used in the analog-to-digital converter circuit using at least one of the estimated gain and the estimated integrator pole.

2. A method of claim 1, further comprising:

enabling the input signal of the analog-to-digital converter after calculating the coefficients of the calibration filter used in the analog-to-digital converter circuit; and

operating the analog-to-digital converter circuit in a continuous calibration mode.

3. A method of claim 1, further comprising operating the calibration filter using the coefficients of the calibration filter.

4. A method of claim 3, wherein measuring the estimated gain of the analog-to-digital converter circuit comprises:

multiplying a digitized residue of a first stage of the analog-to-digital converter circuit with the pseudo-random signal;

accumulating a sum of the multiplication; and

scaling the sum by an expected magnitude of the pseudo-random signal.

5. A method of claim 4, further comprising calibrating a second stage of the analog-to-digital converter circuit by multiplying a digitized residue of the second stage of the analog-to-digital converter circuit with the pseudo-random signal, accumulating a sum of the multiplication, and scaling the sum by an expected magnitude of the pseudo-random signal.

6. A method of claim 4, wherein a gain-error-correction circuit is used for multiplying a digitized residue of the first stage of the analog-to-digital converter circuit with the pseudo-random signal, for accumulating a sum of the multiplication, and for scaling the sum by an expected magnitude of the pseudo-random signal.

7. A method of claim 6, further comprising dividing an ideal gain of the analog-to-digital converter circuit by the estimated gain of the analog-to-digital converter circuit to determine a calibration coefficient of the calibration filter.

8. A method of claim 1, wherein the calibration filter is used to calibrate output of one of a MASH Δ

_Σ

analog-to-digital converter circuit and a pipelined analog-to-digital converter circuit.

9. A method of claim 8, further comprising:

measuring the estimated gain of the analog-to-digital converter circuit by;

resetting an integrator of the analog-to-digital converter circuit for every clock period;

multiplying a digitized residue of a first stage of the analog-to-digital converter circuit with the pseudo-random signal to get a first multiplication,

accumulating the first multiplication to get a first sum, and

scaling the first sum by an expected magnitude of the pseudo-random signal; and

measuring the integrator pole of the analog-to-digital converter circuit by;

resetting the integrator of the analog-to-digital converter circuit for every second clock period;

multiplying a digitized residue of a first stage of the analog-to-digital converter circuit with a memory of the pseudo-random signal to get a second multiplication,

accumulating the second multiplication to get a second sum,

accumulating a third sum of ratios of a sign of the pseudo-random signal and the sign of the memory of the pseudo-random signal,

subtracting the third sum from the second sum to get a first difference, and

scaling the first difference by a number of measurements.

10. A method of claim 9, further comprising dividing an ideal gain of the analog-to-digital converter circuit by the estimated gain to get a first calibration coefficient of the calibration filter.

11. A method of claim 10, further comprising multiplying the first coefficient of the calibration filter by the estimated integrator pole of the analog-to-digital converter circuit to get a second calibration coefficient of the calibration filter.

12. A method of measuring calibration coefficients of a calibration filter used in a pipelined analog-to-digital converter circuit, the pipelined analog-to-digital converter circuit having a first analog-to-digital converter, a second analog-to-digital converter and a digital-to analog converter in a feedback path of the first analog-to-digital converter, the method comprising:

disabling an input signal to the pipelined analog-to-digital converter circuit;

inputting a pseudo-random signal to the pipelined analog-to-digital converter circuit;

inputting a gained output of the digital-to-analog converter to the second analog-to-digital converter; and

inputting the pseudo-random signal and the output of the second analog-to-digital converter to a calibration coefficient computation circuit to thereby calculate calibration coefficients.

13. A method of claim 12, further comprising filtering an output of the second analog-to-digital converter using the calibration coefficients.

14. A method of claim 12, wherein the calibration coefficient computation circuit computes an estimated gain of the analog to digital converter circuit.

15. A method of claim 12, wherein the calibration coefficient computation circuit correlates an output of the second analog-to-digital converter with the pseudo-random signal.

16. A method of measuring calibration coefficients of a calibration filter used in a Δ

_Σ

analog-to-digital converter circuit, the Δ

_Σ

analog-to-digital converter circuit having a first analog-to-digital converter, a second analog-to-digital converter and a digital-to analog converter in a feed-back path of the first analog-to-digital converter, the method comprising;

disabling an input signal to the Δ

_Σ

analog-to-digital converter circuit;

inputting a pseudo-random signal to the Δ

_Σ

analog-to-digital converter circuit;

inputting an integrated output of the digital-to-analog converter to the second analog-to-digital converter; and

inputting the pseudo-random signal and the output of the second analog-to-digital converter to a calibration coefficient computation circuit to thereby calculate calibration coefficients.

17. A method of claim 16, wherein the calibration coefficient computation circuit computes an estimated gain and an estimated integrator pole of the Δ

_Σ

analog-to-digital converter circuit.

18. A method of claim 17, wherein the calibration coefficients include a first calibration coefficient equal to a ratio of an ideal gain of the Δ

_Σ

analog-to-digital converter circuit and the estimated gain of the Δ

_Σ

analog-to-digital converter circuit.

19. A method of claim 17, wherein the calibration coefficients include a second calibration coefficient equal to the first calibration coefficient multiplied by the estimated integrator pole of the Δ

_Σ

analog-to-digital converter circuit.

20. A method of claim 17, further comprising:

resetting an integrator of the analog-to-digital converter circuit for every clock period for calculating the estimated gain of the Δ

_Σ

analog-to-digital converter circuit; and

resetting an integrator of the analog-to-digital converter circuit for every second clock period for calculating the estimated gain of the Δ

_Σ

analog-to-digital converter circuit.

21. An analog-to-digital converter system for converting an analog input signal to a digital output signal, the circuit comprising:

an analog-to-digital converter circuit;

a switching device for turning on and turning off the analog input signal to the analog-to-digital converter circuit;

a pseudo-random signal generator providing a pseudo-random signal to the analog-to-digital converter circuit,

a calibration coefficient computation circuit to compute calibration coefficients of the analog-to-digital converter circuit; and

a calibration filter circuit for filtering the digital output signal according to the calibration coefficients.

22. An analog-to-digital converter system of claim 21, wherein the analog-to-digital converter circuit is one of a pipelined analog-to-digital converter circuit and a Δ

_Σ

analog-to-digital converter circuit.

23. An analog-to-digital converter system of claim 22, wherein the Δ

_Σ

analog-to-digital converter circuit is a MASH Δ

_Σ

analog-to-digital converter circuit having an integrator with one pole.

24. An analog-to-digital converter system of claim 21, wherein the calibration coefficient computation circuit includes a gain error correction circuit.

25. An analog-to-digital converter system of claim 21, wherein the gain error correction circuit includes a correlator, an accumulator and an inverter.

26. An analog-to-digital converter system of claim 25, wherein the calibration coefficient computation circuit computes at least one of an estimated gain of the analog-to-digital converter circuit and an estimated integrator pole of the analog-to-digital converter circuit.

27. An analog-to-digital converter system of claim 26, wherein the calibration coefficient computation circuit computes a first calibration coefficient as a ratio of an ideal gain of the analog-to-digital converter circuit and the estimated gain of the analog-to-digital converter circuit.

28. An analog-to-digital converter system of claim 27, wherein the calibration coefficient computation circuit computes a second calibration coefficient by multiplying the first calibration coefficient by the estimated integrator pole of the analog-to-digital converter circuit.

29. An analog-to-digital converter system of claim 21, wherein the switching device turns off the input analog signal during a startup phase of the analog-to-digital circuit and the calibration coefficient computation circuit computes the calibration coefficients during the startup phase.

30. An analog-to-digital converter system of claim 21, wherein the analog-to-digital converter circuit is a MASH Δ

_Σ

analog-to-digital converter circuit and the calibration coefficient computation circuit resets the integrator at one of (1) every clock period and (2) every second clock period.

31. A calibration coefficient computation circuit for computing calibration coefficients of a calibration filter used in an analog-to-digital converter circuit, the analog-to-digital circuit converting an analog input signal into a digital output signal, the calibration coefficient computation circuit comprising:

a switching device adapted to turn on and turn off the analog input signal to the analog-to-digital converter and a pseudo-random signal generator adapted to input a pseudo-random signal to the analog-to-digital converter circuit, wherein the switching device turns of the analog input signal to the analog-to-digital converter circuit during a startup phase of the analog-to-digital converter circuit, the pseudo-random signal generator inputs a pseudo-random input signal into the analog-to-digital converter circuit during the startup phase and the calibration coefficient computation circuit computes the calibration coefficients of the calibration filter during the startup phase.

32. A calibration coefficient computation circuit of claim 31, wherein the calibration coefficient computation circuit includes a gain error correction circuit.

33. A calibration coefficient computation circuit of claim 31, wherein the calibration coefficient computation circuit computes at least one of an estimated gain of the analog-to-digital converter circuit and an estimated integrator pole of the analog-to-digital converter circuit.

34. A calibration coefficient computation circuit of claim 31, wherein the calibration coefficient computation circuit computes a first calibration coefficient of the calibration filter as a ratio of an ideal gain of the analog-to-digital converter circuit and the estimated gain of the analog-to-digital converter circuit.

35. A calibration coefficient computation circuit of claim 34, wherein the calibration coefficient computation circuit computes a second calibration coefficient of the calibration filter by multiplying the first calibration coefficient by the estimated integrator pole of the analog-to-digital converter circuit.

36. A calibration coefficient computation circuit of claim 32, wherein the gain error correction circuit includes a correlator, an accumulator and an inverter.

37. A calibration coefficient computation circuit of claim 32, further adapted to compute calibration coefficients of at least one of a pipelined analog-to-digital converter circuit and a Δ

_Σ

analog-to-digital converter circuit.