Complex impedance spectrometer using parallel demodulation and digital conversion

• US 6,970,738 B1
• Filed: 01/30/2003
• Issued: 11/29/2005
• Est. Priority Date: 02/04/2002
• Status: Active Grant

• Current Assignee: Critical Perfusion, Inc.
• Original Assignee: Innovamedica S.A. De C.V.
• Inventors: Sacristán Rock, Emilio, Othman, Salah
• Primary Examiner(s): Hindenburg, Max F.
• Assistant Examiner(s): Szmal, Brian
• Application Number:
  US10/354,481
• Time in Patent Office: 1,034 Days
• Field of Search: 600/547, 600/587, 600/402, 600/490, 600/322, 600/309, 600/310, 702/56, 702/190, 341/155, 436/149, 356/317, 324/77.B
• US Class Current: 600/547
• CPC Class Codes: A61B 5/053 Measuring electrical impedance or conductance of a portion of the body
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00

Abstract

A spectrometer for measuring the complex impedance spectrum of tissue comprises: a multi-frequency excitation current generator; a demodulation signal generator; two identical amplification/demodulation circuits; an A/D converter; and a microprocessor for signal processing. In use, the current generator excites the tissue sample and a series-connected reference impedance. The voltages generated in the tissue and reference are measured, demodulated, and digitized in parallel using the demodulation signal generator, the two amplification/demodulation circuits, and the A/D converter. Demodulation is done using the same demodulation signal generated at a frequency with a preset difference from the excitation signal, which allows measurements to be made at a low frequency independent of the excitation frequency. The microprocessor then calculates the complex impedance spectrum in relation to the reference signal. Because the measurements are relative, they are independent of both the excitation current amplitude of the phase of the excitation and demodulation signals.

Claims

1. A system for measuring the complex impedance spectrum of a sample, said system comprising:

a. an excitation circuit comprising;

a sample connection mechanism;

a reference impedance electrically connected in series to the sample connection mechanism; and

a multi-frequency excitation device electrically connected in series to the sample connection mechanism and reference impedance;

b. first and second amplification/demodulation circuits respectively connected in parallel to the sample connection mechanism and reference impedance;

c. a demodulation signal generator electrically connected to the first and second amplification/demodulation circuits; and

d. a signal processor electrically connected to the first and second amplification/demodulation circuits.

2. The system of claim 1 wherein:

a. the first amplification/demodulation circuit comprises;

a first amplifier having an input electrically connected in parallel to the sample connection mechanism;

a first multiplier electrically connected to an output of the first amplifier and to the demodulation signal generator; and

a first bandpass filter electrically connected to the first multiplier and to the signal processor; and

b. the second amplification/demodulation circuit comprises;

a second amplifier having an input electrically connected in parallel to the reference impedance;

a second multiplier electrically connected to an output of the second amplifier and to the demodulation signal generator; and

a second bandpass filter electrically connected to the second multiplier and to the signal processor.

3. The system of claim 1 wherein:

a. the excitation device is configured to generate an excitation signal at a first frequency; and

b. the demodulation signal generator is configured to generate a demodulation signal at a second frequency different from the first frequency, wherein the difference between the first frequency and the second frequency is substantially constant.

4. The system of claim 3 wherein each amplification/demodulation circuit has a bandpass filter set at a third frequency about the same as the difference between the first frequency and the second frequency.

5. The system of claim 3 wherein:

a. the first amplification/demodulation circuit comprises;

a first amplifier having an input electrically connected in parallel to the sample connection mechanism;

a first multiplier electrically connected to an output of the first amplifier and to the demodulation signal generator; and

a first bandpass filter electrically connected to the first multiplier and to the signal processor and set at a third frequency about the same as the difference between the first frequency and the second frequency; and

b. the second amplification/demodulation circuit comprises;

a second amplifier having an input electrically connected in parallel to the reference impedance;

a second multiplier electrically connected to an output of the second amplifier and to the demodulation signal generator; and

a second bandpass filter electrically connected to the second multiplier and to the signal processor and set at the third frequency.

6. A system for measuring the complex impedance spectrum of a sample, said system comprising:

a. an excitation circuit comprising;

a sample connection mechanism;

a reference impedance electrically connected in series to the sample connection mechanism; and

a multi-frequency excitation device electrically connected in series to the sample connection mechanism and reference impedance, said excitation circuit being configured to generate an excitation signal at a first variable frequency;

b. first and second amplification/demodulation circuits respectively connected in parallel to the sample connection mechanism and reference impedance;

c. a demodulation signal generator electrically connected to the first and second amplification/demodulation circuits and configured to generate a demodulation signal at a second variable frequency; and

d. a signal processor electrically connected to the first and second amplification/demodulation circuits;

wherein;

e. the difference between the first variable frequency and the second variable frequency is substantially constant; and

f. each amplification/demodulation circuit comprises;

an amplifier;

a multiplier electrically connected to the amplifier and to the demodulation signal generator; and

a bandpass filter electrically connected to the multiplier and to the signal processor and set at a third frequency about the same as the difference between the first and second variable frequencies.

7. A system for measuring the complex impedance spectrum of a sample, said system comprising:

a. a sample, and a reference impedance electrically connected in series to the sample;

b. at least one signal generator configured to generate an excitation signal at a first variable frequency and a demodulation signal at a second variable frequency different from the first variable frequency, wherein the difference between the first and second variable frequencies is substantially constant, and said signal generator being operably electrically connected to the reference impedance and sample for applying the excitation signal thereto and thereby generating a base reference signal and a base sample signal;

c. a demodulation circuit operably electrically connected to the sample, reference impedance, and signal generator, said demodulation circuit being configured to output a demodulated reference signal and a demodulated sample signal by;

separately multiplying the base reference signal and the base sample signal with the demodulation signal; and

separately filtering out portions of the multiplied signals substantially above and below a bandpass frequency equal to the difference between the first and second variable frequencies; and

d. a signal processor operably electrically connected to the demodulation circuit and configured to calculate the complex impedance spectrum of the sample based on the demodulated reference signal and the demodulated sample signal.

8. The system of claim 7 wherein the signal processor comprises an A/D converter electrically connected to the demodulation circuit and a computer electrically connected to an output portion of the A/D converter.

9. The system of claim 7 wherein the demodulation circuit comprises:

a. a first demodulation sub-circuit comprising;

a first amplifier electrically connected in parallel to the sample and configured to amplify the base sample signal;

a first multiplier electrically connected to the first amplifier and to the signal generator and configured to multiply the amplified base sample signal with the demodulation signal; and

a first bandpass filter electrically connected to the first multiplier and to the signal processor and centered at the bandpass frequency; and

b. a second demodulation sub-circuit substantially identical to the first demodulation sub-circuit and comprising;

a second amplifier electrically connected in parallel to the reference impedance and configured to amplify the base reference signal;

a second multiplier connected to the second amplifier and to the signal generator and configured to multiply the amplified base reference signal with the demodulation signal; and

a second bandpass filter electrically connected to the second multiplier and to the signal processor and centered at the bandpass frequency.

10. A system for measuring the complex impedance spectrum of a sample, said system comprising:

a. a sample, and a reference impedance electrically connected in series to the sample;

b. at least one signal generator operably electrically connected to the reference impedance and sample and configured to generate a base reference signal and a base sample signal by applying an excitation signal to the reference impedance and to the sample;

c. a demodulation circuit operably electrically connected to the sample and reference impedance and configured to output a demodulated reference signal and a demodulated sample signal by separately demodulating the base reference signal and the base sample signal; and

d. a signal processor operably electrically connected to the demodulation circuit and configured to calculate the complex impedance spectrum of the sample based on the demodulated reference signal and the demodulated sample signal.

11. The system of claim 10 wherein the demodulation circuit comprises:

a. a first demodulation sub-circuit electrically connected in parallel to the sample; and

b. a second demodulation sub-circuit electrically connected in parallel to the reference impedance and substantially identical to the first demodulation sub-circuit.

12. The system of claim 10 wherein:

a. the at least one signal generator is configured to generate the excitation signal at a first variable frequency and to generate a demodulation signal at a second variable frequency different from the first variable frequency, wherein the difference between the first variable frequency and the second variable frequency is substantially constant;

b. the demodulation circuit is operably electrically connected to the signal generator for receiving the demodulation signal; and

c. the demodulation circuit is configured to separately demodulate the base reference signal and the base sample signal by;

separately multiplying the base reference signal and the base sample signal with the demodulation signal; and

separately filtering out portions of the multiplied signals substantially above and below a bandpass frequency equal to the difference between the first and second variable frequencies.

13. A system for measuring the complex impedance spectrum of a sample, said system comprising:

a. a sample, and a reference impedance electrically connected in series to the sample;

b. signal generation means for generating an excitation signal having a first variable frequency and a demodulation signal having a second variable frequency different from the first variable frequency, wherein the difference between the first and second variable frequencies is substantially constant, and said signal generation means being operably electrically connected to the sample and to the reference impedance for applying the excitation signal thereto;

c. demodulation means, operably electrically connected to the sample, reference impedance, and signal generation means, for demodulating signals produced across the sample and reference impedance by the excitation signal; and

d. signal processing means, operably electrically connected to the demodulation means, for processing the demodulated signals.

14. A method for measuring the complex impedance spectrum of a sample, said method comprising the steps of:

a. generating a base reference signal and a base sample signal by applying an excitation signal to a sample and to a reference impedance electrically connected in series to the sample;

b. generating a demodulated reference signal and a demodulated sample signal by separately demodulating the base reference signal and the base sample signal; and

c. calculating the complex impedance spectrum of the sample by electronically processing the demodulated reference signal and the demodulated sample signal.

15. The method of claim 14 wherein the step of calculating the complex impedance spectrum of the sample comprises the sub-steps of digitizing the demodulated sample signal and the demodulated reference signal and electronically mathematically calculating the complex impedance spectrum of the sample using the digitized demodulated sample and reference signals.

16. The method of claim 14 wherein:

a. the excitation signal is at a first variable frequency;

b. the method further comprises the step of generating a demodulation signal at a second variable frequency different from the first variable frequency, wherein the difference between the first variable frequency and the second variable frequency is substantially constant; and

c. the base reference signal and the base sample signal are separately demodulated by;

separately multiplying the base sample signal and the base reference signal with the demodulation signal; and

separately filtering out portions of the multiplied signals substantially above and below a bandpass frequency equal to the difference between the first and second variable frequencies.

17. A method for measuring the complex impedance spectrum of a sample, said method comprising the steps of:

a. generating a base sample signal and a base reference signal by applying an excitation signal having a first frequency to a sample and to a reference impedance electrically connected in series to the sample;

b. generating a demodulated sample signal and a demodulated reference signal by;

separately multiplying the base sample signal and the base reference signal with a demodulation signal have a second frequency different from the first frequency, wherein the difference between the first and second frequencies is substantially constant; and

separately filtering out portions of the multiplied signals substantially above and below a bandpass frequency equal to the difference between the first and second frequencies;

c. digitizing and electronically storing the demodulated sample signal and the demodulated reference signal;

d. incrementally changing the first and second frequencies of the excitation and demodulation signals, respectively;

e. repeating steps a–

d across a bandwidth of interest; and

f. electronically processing the stored demodulated sample and reference signals to calculate the complex impedance spectrum of the sample.

18. The method of claim 17 wherein the base sample signal and base reference signal are voltage signals measured in parallel across the sample and reference impedance, respectively.

19. A method for measuring the complex impedance spectrum of a sample using parallel demodulation and digital conversion, said method comprising the steps of:

a. generating a base sample signal and a base reference signal by applying an excitation signal to a sample and to a reference impedance electrically connected in series to the sample, said excitation signal having a first frequency;

b. generating a demodulated reference signal and a demodulated sample signal in parallel by;

i. multiplying the base sample signal with a demodulation signal having a second frequency different from the first frequency, wherein the difference between the first and second frequencies is substantially constant; and

generating an output sample signal by filtering out portions of the multiplied base sample signal and demodulation signal substantially above and below a bandpass frequency equal to the difference between the first and second frequencies; and

ii. multiplying the base reference signal with the demodulation signal; and

generating an output reference signal by filtering out portions of the multiplied base reference signal and demodulation signal substantially above and below the bandpass frequency;

c. digitally converting and storing the output sample signal and the output reference signal;

d. incrementally changing the first and second frequencies of the excitation and demodulation signals, respectively;

e. repeating steps a–

d across a bandwidth of interest; and

f. calculating the complex impedance spectrum of the sample by electronically processing the stored, digitally-converted output sample and output reference signals.

20. A method for measuring the complex impedance spectrum of a sample, said method comprising the steps of:

a. applying an excitation signal to a sample and to a reference impedance electrically connected in series to the sample;

b. demodulating a resulting sample signal appearing across the sample;

c. demodulating a resulting reference signal appearing across the reference impedance; and

d. electronically processing the demodulated reference signal and the demodulated sample signal.