Semiconductor having reduced configuration pins and method thereof
First Claim
1. A configurable semiconductor device having a plurality of predetermined configurations, comprising:
- a measurement circuit to measure an electrical characteristic of at least one external impedance and to determine a digital value corresponding to the measured electrical characteristic;
a storage circuit including memory locations having contents accessible as a function of the digital value, wherein each of the contents corresponds to a respective one of the predetermined configurations; and
a controller to configure a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value.
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Accused Products
Abstract
A configurable semiconductor device having a plurality of predetermined configurations comprises a measurement circuit to measure an electrical characteristic of at least one external impedance and to determine a digital value corresponding to the measured electrical characteristic. A storage circuit includes memory locations having contents accessible as a function of the digital value. Each of the contents corresponds to a respective one of the predetermined configurations. A controller configures a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value.
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Citations
45 Claims
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1. A configurable semiconductor device having a plurality of predetermined configurations, comprising:
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a measurement circuit to measure an electrical characteristic of at least one external impedance and to determine a digital value corresponding to the measured electrical characteristic;
a storage circuit including memory locations having contents accessible as a function of the digital value, wherein each of the contents corresponds to a respective one of the predetermined configurations; and
a controller to configure a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method of operating a configurable semiconductor device having a plurality of predetermined configurations, comprising:
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measuring an electrical characteristic of at least one external impedance;
determining a digital value corresponding to the measured electrical characteristic;
accessing contents in memory locations as a function of the digital value, wherein each of the contents corresponds to a respective one of the predetermined configurations; and
configuring a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30)
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31. A configurable semiconductor device having a plurality of predetermined configurations, comprising:
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measurement means for measuring an electrical characteristic of at least one external impedance and for determining a digital value corresponding to the measured electrical characteristic;
storing means including memory locations having contents accessible as a function of the digital value, wherein each of the contents corresponds to a respective one of the predetermined configurations; and
control means for configuring a device characteristic of the configurable semiconductor device based on the contents of the memory locations corresponding to the digital value. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45)
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Specification