Thermometry probe calibration method

• US 6,971,790 B2
• Filed: 10/10/2003
• Issued: 12/06/2005
• Est. Priority Date: 10/11/2002
• Status: Expired due to Term

• Current Assignee: Welch Allyn Incorporated
• Original Assignee: Welch Allyn Incorporated
• Inventors: Quinn, David E., Stone, Ray D., Lane, John, Burdick, Kenneth J., Cuipylo, William N.
• Primary Examiner(s): Verbitsky, Gail
• Assistant Examiner(s): Jagan, Mirellys
• Application Number:
  US10/683,206
• Publication Number:
  US 20040114659A1
• Time in Patent Office: 788 Days
• Field of Search: 374/1, 374/164, 374/169, 600/549, 702/99, 702/104, 702/91
• US Class Current: 374/1
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 7/42 Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature

Abstract

A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.

Claims

1. A method for calibrating a temperature probe for a thermometry apparatus, said method comprising the steps of:

characterizing the preheating data of a temperature probe used with said apparatus;

comparing the characterized preheating data of said temperature probe to that of a nominal temperature probe and normalizing said characterized preheating data based on said comparing step;

storing the normalized preheating data on an EEPROM associated with said apparatus; and

applying the stored normalized preheating data into an algorithm for preheating the probe to a predetermined temperature so as to calibrate said temperature probe.

2. A method as recited in claim 1, wherein said characterizing step includes the additional step of measuring a probe heater gain of said temperature probe, said probe heater gain representing the efficiency of a pre-heating circuit of said probe wherein said probe heater gain is compared to that of a nominal probe'"'"'s similar heating characteristic, said probe heater gain measuring step including the step of pulsing a predetermined voltage to said probe and measuring a temperature rise DELTA. T to the peak of a resulting temperature curve for said probe, said comparing and normalizing step including the step of calculating a probe-specific ratio of .DELTA.T and a DELTA.Tref between the two temperature rises of said probe and a nominal probe, said storing step including the additional step of storing said probe-specific ratio on said EEPROM and applying the probe-specific ratio into said pre-heating algorithm.