Integrated circuit burn-in systems

• US 6,980,016 B2
• Filed: 07/02/2001
• Issued: 12/27/2005
• Est. Priority Date: 07/02/2001
• Status: Expired due to Fees

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Kacprowicz, Richard, Pullen, David H.
• Primary Examiner(s): HOLLINGTON, JERMELE M
• Application Number:
  US09/897,252
• Publication Number:
  US 20030001604A1
• Time in Patent Office: 1,639 Days
• Field of Search: 324/760, 324/763, 324/765, 324/158.1, 714/30, 714733-736, 327/512, 327/427, 327430-431, 327434-435
• US Class Current: 324/750.07
• CPC Class Codes: G01R 31/2642 Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
• CPC Class Codes: G01R 31/2849 Environmental or reliability testing, e.g. burn-in or validation tests of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855
• CPC Class Codes: G01R 31/287 Procedures; Software aspects

Abstract

Improved methods for performing burn-in of electronic components, such as integrated circuits (ICs) with on-board thermal sense circuits, are used to obtain a higher bin split. According to one embodiment, a thermal set-point is loaded into each IC. While the ICs are maintained at a constant elevated temperature, the burn-in system checks each IC to determine whether the set-point has been exceeded. If so, it characterizes the IC by that set-point; if not, it decrements the set-point and checks again. The method continues until all ICs have been characterized to a specific set-point. As a result of the method, a junction temperature is obtained for each IC. In addition, a real-time estimate of the burn-in time for each IC is obtained, so that burn-in time can be adjusted to maximize burn-in throughput. Apparatus for implementing improved IC burn-in is also described.

Claims

1. An integrated circuit (IC) burn-in system comprising:

a computer system comprising a processor operating under the control of a computer program; and

at least one IC comprising;

interface circuitry to interface the at least one IC to the computer system; and

a thermal sense circuit, coupled to the interface circuitry, to provide a temperature indication that is proportional to a junction temperature of the at least one IC;

wherein the computer system is to compare the temperature indication with a temperature value determined by the computer program;

wherein if the temperature indication substantially matches the temperature value, the computer system is to bin the at least one IC at that temperature value; and

wherein if the temperature indication is less than the temperature value, the computer system is to decrement the temperature value and compare the temperature indication with the decremented temperature value.

2. The IC burn-in system recited in claim 1, wherein the at least one IC further comprises:

logic circuitry coupled to the interface circuitry; and

wherein the logic circuitry is to be responsive to the temperature indication generated by the thermal sense circuit;

wherein the logic circuit is also to be responsive to a temperature value generated by the computer system as determined by the computer program;

wherein the logic circuitry is to compare the temperature indication with the temperature value;

wherein if the temperature indication substantially matches the temperature value, the logic circuitry is to generate a first indication to the computer system, and the computer system is to bin the at least one IC at that temperature value; and

wherein if the temperature indication is less than the temperature value, the logic circuitry is to generate a second indication to the computer system, and the computer system is to decrement the temperature value and compare the temperature indication with the decremented temperature value.

3. The IC burn-in system recited in claim 1, wherein the interface circuitry is to receive the temperature value from the computer system and to send the temperature indication to the computer.

4. The IC burn-in system recited in claim 3, wherein the at least one IC further comprises a storage circuit coupled to the interface circuitry to store the temperature value.

5. An integrated circuit (IC) burn-in system comprising:

a computer system comprising a processor; and

an IC comprising;

interface circuitry to interface the IC to the computer system; and

a thermal sense circuit, coupled to the interface circuitry, to provide a temperature indication that is proportional to a junction temperature of the IC;

wherein the computer system is to compare the temperature indication with a temperature value;

wherein if the temperature indication substantially matches the temperature value, the computer system is to bin the IC at that temperature value; and

wherein if the temperature indication is less than the temperature value, the computer system is to decrement the temperature value and compare the temperature indication with the decremented temperature value.

6. The IC burn-in system recited in claim 5, wherein the IC further comprises:

logic circuitry coupled to the interface circuitry; and

wherein the logic circuitry is to be responsive to the temperature indication generated by the thermal sense circuit;

wherein the logic circuit is also to be responsive to a temperature value generated by the computer system;

wherein the logic circuitry is to compare the temperature indication with the temperature value;

wherein if the temperature indication substantially matches the temperature value, the logic circuitry is to generate a first indication to the computer system, and the computer system is to bin the IC at that temperature value; and

wherein if the temperature indication is less than the temperature value, the logic circuitry is to generate a second indication to the computer system, and the computer system is to decrement the temperature value and compare the temperature indication with the decremented temperature value.

7. The IC burn-in system recited in claim 5, wherein the interface circuitry is to receive the temperature value from the burn-in system and to send the temperature indication to the burn-in system.

8. The IC burn-in system recited in claim 7, wherein the IC further comprises a storage circuit coupled to the interface circuitry to store the temperature value.