×

Pattern recognition

  • US 6,980,689 B1
  • Filed: 05/11/2000
  • Issued: 12/27/2005
  • Est. Priority Date: 05/26/1999
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method for searching in a search field for a reference pattern characterized by prescribed parameters, said method comprising:

  • separately generating a group of topographic maps of the search field for each parameter, a topographic map being generated for each value which a corresponding parameter can assume, having levels at respective positions determined by a function of a value of the corresponding parameter at a corresponding position in the search field;

    varying the levels of the topographic maps as a function of values of the prescribed parameters of the reference pattern by mutual interaction of the topographic maps of each group;

    combining the levels of corresponding positions of the topographic maps to produce a combined topographic map; and

    determining that the reference pattern has been found at a position of the search field which corresponds to a position of the combined topographic map having a highest level.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×