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Coherent evanescent wave imaging

  • US 6,980,716 B1
  • Filed: 03/29/2002
  • Issued: 12/27/2005
  • Est. Priority Date: 03/30/2001
  • Status: Expired due to Fees
First Claim
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1. A method of gathering information concerning nanostructure characteristics including:

  • (a) providing a waveguide of a first medium having a surface bounding a second medium;

    (b) irradiating the waveguide with an electromagnetic wave to produce a surface wave at the surface bounding the second medium and an evanescent wave in the second medium contiguous with the surface;

    (c) locating at least one nanostructure in the second medium proximate the surface where it will encounter the evanescent wave; and

    (d) determining a characteristic of the nanostructure by observing at least one effect of electromagnetic interactions between the evanescent wave and the at least one nanostructure.

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