Mirror detection signal generator
First Claim
1. A mirror detection signal generator,which generates a mirror detection signal from an RF signal corresponding the reflected light from a recording medium, comprises the following parts:
- a first peak-hold circuit that holds the bottom level of said RF signal and having a first droop rate and outputs a bottom-hold signal;
a second peak-hold circuit that holds the top level of said RF signal and having a second droop rate and outputs a first envelope signal;
a third peak-hold circuit that holds the bottom level of said RF signal and having a third droop rate and outputs a second envelope signal;
a first reference signal generator that outputs the first reference signal generated on the basis of said bottom-hold signal and said first envelope signal;
a first comparator that compares said first reference signal with said second envelope signal and generates said mirror detection signal;
a fourth peak-hold circuit that holds the top level of said RF signal and having a fourth droop rate and outputs a top-hold signal;
a second reference signal generator that outputs the second reference signal generated on the basis of said top-hold signal and said bottom-hold signal;
and a second comparator that compares said second reference signal and said first envelope signal and generates a defect detection signal, said first droop rate being controlled by said defect detection signal.
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Accused Products
Abstract
An amplitude variation detection circuit that can reliably detect the mirror portion independently of the type of optical recording medium, as well as a type of information regenerating apparatus that contains said amplitude variation detecting circuit. Voltage division of top envelope signal Ste and bottom-hold signal Sbh of RF signal Srf is performed by voltage divider (16); then, after amplification by gain control amplifier (19) with a gain that corresponds to the type of optical disc (1), a prescribed offset is added by offset circuit (22) to the signal, and the resulting signal is input as mirror detection threshold signal Smt to comparator (24). The high-frequency noise component of bottom envelope signal Sbe of RF signal Srf is removed by low-pass filter (21); after amplification by gain control amplifier (20) with a gain that corresponds to the type of optical disc (1), the signal is input to comparator (24). Depending on the result of the comparison of the level of said amplified bottom envelope signal S4 with that of mirror detection threshold signal Smt, mirror detection signal Sm is generated.
29 Citations
12 Claims
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1. A mirror detection signal generator,
which generates a mirror detection signal from an RF signal corresponding the reflected light from a recording medium, comprises the following parts: -
a first peak-hold circuit that holds the bottom level of said RF signal and having a first droop rate and outputs a bottom-hold signal; a second peak-hold circuit that holds the top level of said RF signal and having a second droop rate and outputs a first envelope signal; a third peak-hold circuit that holds the bottom level of said RF signal and having a third droop rate and outputs a second envelope signal; a first reference signal generator that outputs the first reference signal generated on the basis of said bottom-hold signal and said first envelope signal; a first comparator that compares said first reference signal with said second envelope signal and generates said mirror detection signal; a fourth peak-hold circuit that holds the top level of said RF signal and having a fourth droop rate and outputs a top-hold signal; a second reference signal generator that outputs the second reference signal generated on the basis of said top-hold signal and said bottom-hold signal; and a second comparator that compares said second reference signal and said first envelope signal and generates a defect detection signal, said first droop rate being controlled by said defect detection signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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Specification
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- Resources
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Current AssigneeTexas Instruments, Inc.
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Original AssigneeTexas Instruments, Inc.
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InventorsYamanoi, Koyu, Yamauchi, Toshio, Murata, Hironobu
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Primary Examiner(s)Klimowicz, William
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Assistant Examiner(s)SIMPSON, LIXI CHOW
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Application NumberUS10/072,100Publication NumberTime in Patent Office1,425 DaysField of Search369/53.2, 369/53.22, 369/59.15, 369/59.17, 369/53.32, 369/124.15, 369/47.14, 369/53.31, 369/124.11, 369/53.15, 369/55.22US Class Current369/53.22CPC Class CodesG11B 7/08541 involving track counting to...
