Multi-function probe card
First Claim
1. A multi-function probe card, comprising:
- a PCB (41);
a plurality of probe needles (47), an end of each of the probe needles (47) is connected to the PCB (41);
a counter (71), for detecting the probe needles (47) to count the piece of the DUT bare die (46) and generate a “
piece sequence parameter”
;
a signal-measuring device (72), for measuring the current and voltage passing through the probe needles (47) to generate current and voltage parameters; and
a parameter processing system (74), further comprising an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57);
whereby, the “
piece sequence parameter”
as well as the current and voltage parameters can be input into the processing unit (52) through the I/O unit (51)/(59);
the processing unit (52) employs the “
piece sequence parameter”
as a datum for piece of DUT while the “
time providing unit”
(55) provides processing unit (52) with a time datum for each of the DUT bare dies (46);
thereafter, the processing unit (52) sets up a parametric data structure in terms of the piece datum of the DUT bare die (46), current parameter, voltage parameter, and time datum for recording the service process and condition of the probe;
subsequently, the processing unit (52) real timely calculate the conditions of the probe card (40) and display the service process and conditions of the probe card (40).
2 Assignments
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Accused Products
Abstract
A multi-function probe card (40) includes a PCB (41), a plurality of probe needles (47), a counter (71) to acquire a “piece sequence parameter”, a signal-measuring device (72) via the probe needles (71) to acquire a current, and a voltage parameters etc. as well as a parametric processing system (74). The parametric processing system (74) includes an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit (52) through the I/O unit (51)/(59). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card (40) through the real time display unit (56).
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Citations
10 Claims
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1. A multi-function probe card, comprising:
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a PCB (41); a plurality of probe needles (47), an end of each of the probe needles (47) is connected to the PCB (41); a counter (71), for detecting the probe needles (47) to count the piece of the DUT bare die (46) and generate a “
piece sequence parameter”
;a signal-measuring device (72), for measuring the current and voltage passing through the probe needles (47) to generate current and voltage parameters; and a parameter processing system (74), further comprising an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57); whereby, the “
piece sequence parameter”
as well as the current and voltage parameters can be input into the processing unit (52) through the I/O unit (51)/(59);
the processing unit (52) employs the “
piece sequence parameter”
as a datum for piece of DUT while the “
time providing unit”
(55) provides processing unit (52) with a time datum for each of the DUT bare dies (46);
thereafter, the processing unit (52) sets up a parametric data structure in terms of the piece datum of the DUT bare die (46), current parameter, voltage parameter, and time datum for recording the service process and condition of the probe;
subsequently, the processing unit (52) real timely calculate the conditions of the probe card (40) and display the service process and conditions of the probe card (40). - View Dependent Claims (2, 3, 4, 5)
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6. A multi-function probe card, comprising:
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a PCB (41); a plurality of probe needles (47), an end of each of the probe needles (47) is connected to the PCB (41); a counter (71), for detecting the probe needles (47) to count the piece of the DUT bare die (46) and generate a “
piece sequence parameter”
; anda parameter processing system (74), further comprising an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57); whereby, the “
piece sequence parameter”
as well as the current and voltage parameters can be input into the processing unit (52) through the I/O unit (51)/(59);
the processing unit (52) employs the “
piece sequence parameter”
as a datum for piece of DUT while the “
time providing unit”
(55) provides processing unit (52) with a time datum for each of the DUT bare dies (46);
thereafter, the processing unit (52) sets up a parametric data structure in terms of the piece datum of the DUT bare die (46), current parameter, voltage parameter, and time datum for recording the service process and condition of the probe;
subsequently, the processing unit (52) real timely calculate the conditions of the probe card (40) and display the service process and conditions of the probe card (40). - View Dependent Claims (7, 8, 9, 10)
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Specification