Bulk materials management apparatus and method

• US 6,986,294 B2
• Filed: 08/19/2002
• Issued: 01/17/2006
• Est. Priority Date: 02/17/2000
• Status: Expired due to Term

• Current Assignee: Bintech Lllp
• Original Assignee: Bintech Lllp
• Inventors: Paschen, Dean A., O'Connor, Timothy, Fromme, Guy A., Hirsch, Vincent A., Bradford, Charles, Gutow, David A., Hendershott, Paul, Webb, Leon C., Emerson, Gary, Kolesnikoff, Paul I. II
• Primary Examiner(s): RAEVIS, ROBERT R
• Application Number:
  US10/223,339
• Publication Number:
  US 20040031335A1
• Time in Patent Office: 1,247 Days
• Field of Search: 738/658, 738/66
• US Class Current: 73/865.8
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01F 22/00 Methods or apparatus for measuring volume of fluids or fluent solid material, not otherwise provided for
• CPC Class Codes: G01F 23/284 Electromagnetic waves
• CPC Class Codes: G01F 23/292 Light , e.g. infrared or ultraviolet
• CPC Class Codes: G01F 23/296 Acoustic waves
• CPC Class Codes: G01N 1/2226 Sampling from a closed space, e.g. food package, head space
• CPC Class Codes: G01N 2001/2223 aerosol sampling devices
• CPC Class Codes: G01N 33/10 Starch-containing substances, e.g. dough
• CPC Class Codes: G01S 13/88 Radar or analogous systems specially adapted for specific applications electromagnetic prospecting or detecting of objects, e.g. near-field detection, G01V3/00

Abstract

Bulk material measurement packages are described including the preferred embodiment of an automated instrument package (AIP) suited to mount on the inside ceiling of a large silo. The gimbaled AIP vertical mounting bracket rotates in an approximate 360° azimuth. An instrument housing is mounted to the vertical mounting bracket, and it rotates approximately 190° in a vertical plane. The instrument housing has at least one range finding sensor such as a scanning laser to measure the top surface contours of the bulk material. The instrument housing can also contains other sensors such as air and quality instruments including temperature, humidity, spectral recognition sensor to detect grain/material type and/or flow rate, gas detectors for sniffing off-odors/spoilage/or safety problems, and live video. Optionally grain penetrating radar (GPR), time domain reflectometry (TDR), ultrasonics, and portable sensors are taught as well as alternate packaging.

Claims

1. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

wherein the surface profile scanner further comprises a volume computation sub-system.

2. The AIP of claim 1, wherein the volume computation sub-system further comprises a quantity sub-system based on a density data input.

3. The AIP of claim 1, wherein the bulk material profile scanner further comprises a laser range finder.

4. The AIP of claim 1 further comprising an electronic data sub-system and a remote central processing unit.

5. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

a video camera.

6. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

a spectral recognition sensor to enable identification of bulk material type.

7. The AIP of claim 6, wherein the spectral recognition sensor further comprises a moisture content sub-system.

8. The AIP of claim 7, wherein the spectral recognition sensor further comprises a qualitative and quantitative sub-system for detection of at least one of the following variables;

protein, starch, sugar, and oil content of the bulk material.

9. The AIP of claim 6, wherein the spectral recognition sensor further comprises a dynamic flow measurement sub-system.

10. The AIP of claim 9, wherein the dynamic flow measurement sub-system further comprises a bulk material input routing sub-system based on machine vision identification of incoming bulk materials.

11. The AIP of claim 6, wherein the spectral recognition sensor further comprises a pattern matching sub-system to distinguish among the spectral characteristics of a plurality of bulk materials.

12. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

an environmental gas monitoring system to monitor dust, temperature, humidity, dew point and out-gassing.

13. The AIP of claim 12, wherein the environmental gas monitoring system further comprises an early warning sub-system to detect an out-gas that denotes a problem.

14. The AIP of claim 12, wherein the environmental gas monitoring system further comprises a human safety alarm sub-system.

15. The AIP of claim 14 further comprising a central processing unit and stored table data to classify gas types detected into normal and abnormal classifications.

16. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

a bulk material penetrating scanner having a density calculating sub-system to determine at least one of the following variables;

voids, insects, mold growth, moisture content and volume.

17. The AIP of claim 16, wherein the bulk material penetrating scanner further comprises a ground penetrating radar (GPR).

18. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

an acoustical single point ranger to prevent overfilling.

19. An automated instrumentation package (AIP) for bulk materials monitoring, the AIP comprising:

a bulk material surface profile scanner;

an avalanche warning sub-system connected to the bulk material surface profile scanner; and

a dust ignition proof enclosure comprising a two axis gimbal mount for motion control of the automated instrument package.

20. The AIP of claim 19, wherein the dust-ignition proof enclosure has an instrument lens cleaning apparatus.