Method and probe structure for implementing a single probe location for multiple signals

• US 6,987,397 B2
• Filed: 10/09/2003
• Issued: 01/17/2006
• Est. Priority Date: 10/09/2003
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Bartley, Gerald Keith, Dahlen, Paul Eric, Maxson, Mark Owen, Maki, Andrew B., Germann, Philip Raymond
• Primary Examiner(s): Nguyen, Vinh
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US10/682,132
• Publication Number:
  US 20050077912A1
• Time in Patent Office: 831 Days
• Field of Search: 324/754, 324/755, 324/757, 324/758, 324/765
• US Class Current: 324/754.03
• CPC Class Codes: G01R 1/07328 for testing printed circuit boards
• CPC Class Codes: G01R 31/2808 Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067
• CPC Class Codes: H05K 3/222 Completing of printed circuits by adding non-printed jumper connections printed jumper connections H05K3/4685

Abstract

A method and a probe structure are provided for implementing multiple signals probing of a printed circuit board. A probe structure is formed on an outside surface of the printed circuit board. A resistor is electrically connected with an associated via with a signal to be monitored. A path to a predefined probe location for monitoring the signal is defined from the resistor using the probe structure.

Claims

1. A method for implementing multiple signals probing of a printed circuit board comprising the steps of:

providing a pattern of vias in the printed circuit board including multiple predefined vias, each said predefined via being connected to a respective signal to be monitored;

forming a probe structure on an outside surface of the printed circuit board including a pattern of a plurality of spaced apart electrically conductive stubs, each stub including an elongated portion extending from at least one pad, and said pattern including one of said plurality of stubs adjacent each said predefined via connected to said respective signal to be monitored;

electrically connecting a resistor between one said predefined via connected to one said respective signal to be monitored and said adjacent stub; and

defining a path to a predefined probe location on the printed circuit board for monitoring said signal from said resistor using said probe structure by placing zero-ohm shorts between selected ones of said pads of said plurality of stubs of said probe structure.

2. A method for implementing multiple signals probing as recited in claim 1 wherein the step of forming said pattern of said plurality of stubs includes the step of etching an electrically conductive material in said pattern of said plurality of stubs to define said probe structure on said outside surface of the printed circuit board.

3. A method for implementing multiple signals probing as recited in claim 2 wherein said electrically conductive material includes copper.

4. A method for implementing multiple signals probing as recited in claim 2 wherein the step of electrically connecting said resistor includes the step of placing said resistor between said predefined via connected to one said respective signal to be monitored and said pad of said adjacent one of said plurality of stubs of said probe structure.

5. A method for implementing multiple signals probing as recited in claim 1 wherein said resistor has a selected high resistance value relative to a characteristic impedance of the printed circuit board at said predefined via connected to one said respective signal to be monitored.

6. A method for implementing multiple signals probing as recited in claim 1 includes the steps of removing said resistor and said path after testing is completed.

7. Apparatus for implementing multiple signals probing of a printed circuit board comprising:

a pattern of vias in the printed circuit board including multiple predefined vias, each said predefined via being connected to a respective signal to be monitored;

a probe structure formed on an outside surface of the printed circuit board;

said probe structure including an electrically conductive material forming a pattern of a plurality of spaced apart stubs defining said probe structure on said outside surface of the printed circuit board, each said stub including an elongated portion extending from at least one pad;

said pattern including one of said plurality of stubs adjacent each said predefined via connected to said respective signal to be monitored;

a resistor electrically connected between one said predefined via connected to one said respective signal to be monitored and said adjacent stub; and

a path defined to a predefined probe location for monitoring said signal from said resistor using said probe structure;

said path being formed by electrically shorting between said pads of selected ones of said plurality of spaced apart stubs.

8. Apparatus for implementing multiple signals probing as recited in claim 7 wherein said resistor and said path are removed after testing is completed.

9. Apparatus for implementing multiple signals probing as recited in claim 7 wherein said probe structure formed on said outside surface of the printed, circuit board includes an electrically conductive material etched to define a grid of a plurality of spaced apart stubs defining said probe structure.

10. Apparatus for implementing multiple signals probing as recited in claim 9 wherein said electrically conductive material is copper.

11. Apparatus for implementing multiple signals probing as recited in claim 7 wherein said resistor has a selected high resistance value relative to a characteristic impedance of the printed circuit board at said predefined via connected to one said respective signal to be monitored.