System for evaluating probing networks
First Claim
1. An assembly for use in evaluating signal conditions in a probe measurement network, said probe measurement network being of the type having spaced-apart first, second, and third device-probing ends, said assembly comprising:
- (a) a base having an upper face;
(b) respective first, second, and third conductive planar probing areas located on said upper face in spaced-apart relation to each other and arranged so that said first, second, and third-device probing ends can be simultaneously placed on said first, second, and third conductive planar probing areas, respectively;
(c) a reference junction; and
(d) a high-frequency transmission structure at least partially embedded in said base and connecting said first, second, and third conductive planar probing areas to said reference junction such that for each position that said device-probing ends can occupy while remaining on the corresponding areas, a high-frequency transmission line is provided by said transmission structure between said device-probing ends and said reference junction.
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Abstract
An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.
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Citations
11 Claims
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1. An assembly for use in evaluating signal conditions in a probe measurement network, said probe measurement network being of the type having spaced-apart first, second, and third device-probing ends, said assembly comprising:
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(a) a base having an upper face; (b) respective first, second, and third conductive planar probing areas located on said upper face in spaced-apart relation to each other and arranged so that said first, second, and third-device probing ends can be simultaneously placed on said first, second, and third conductive planar probing areas, respectively; (c) a reference junction; and (d) a high-frequency transmission structure at least partially embedded in said base and connecting said first, second, and third conductive planar probing areas to said reference junction such that for each position that said device-probing ends can occupy while remaining on the corresponding areas, a high-frequency transmission line is provided by said transmission structure between said device-probing ends and said reference junction. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification