Method for static timing verification of integrated circuits having voltage islands

• US 6,990,645 B2
• Filed: 04/29/2003
• Issued: 01/24/2006
• Est. Priority Date: 04/29/2003
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Lichtensteiger, Susan K., Platt, Timothy M., Normand, Phillip P.
• Primary Examiner(s): WHITMORE, STACY
• Application Number:
  US10/249,661
• Publication Number:
  US 20040221252A1
• Time in Patent Office: 1,001 Days
• Field of Search: 716/6
• US Class Current: 716/113
• CPC Class Codes: G06F 30/3312 Timing analysis

Abstract

A method of analysis of an integrated circuit design having multiple voltage islands, including: (a) determining a clock path through the voltage islands; (b) determining a data path through the voltage islands; (c) determining which voltage islands are independent voltage islands; (d) determining which voltage islands are dependent voltage islands; (e) for the data path and the clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths; and (f) for the data path and the clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths.

Claims

1. A method of analysis of an integrated circuit design having multiple voltage islands, comprising:

(a) determining a clock path through said voltage islands;

(b) determining a data path through said voltage islands;

(c) determining which said voltage islands are independent voltage islands;

(d) determining which said voltage islands are dependent voltage islands;

(e) for said data path and said clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths; and

(f) for said data path and said clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths.

2. The method of claim 1, wherein:

said independent voltage islands are voltage islands that only one of said clock path or said data path passes through; and

said dependent voltage islands being voltage islands that both said clock path and said data path passes through.

3. The method of claim 1, wherein:

said worst case timing analysis is based on worst case conditions applied to all voltage islands, the minimum operating voltage applied to said independent voltage islands, and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island; and

said best case timing analysis is based on best case conditions applied to all voltage islands, the maximum operating voltage applied to said independent voltage islands and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island.

4. The method of claim 3, wherein said worst case and said best case conditions are selected from conditions selected from the group consisting of process conditions, temperature conditions and both process and temperature conditions.

5. The method of claim 4, wherein said worst and best case process conditions are a function of the geometry and the doping of devices comprising said integrated circuit and said worst case temperature conditions are maximum operating temperatures of said integrated circuit and said best case temperature conditions are minimum operating temperatures of said integrated circuit.

6. The method of claim 1, further including determining an arrival time of a clock signal applied to a start point of said clock path at a common endpoint of said clock and data paths and determining an arrival time of a data signal applied at a start point of said data path at said common endpoint of said clock and data paths for each static timing analysis performed in steps (e) and (f).

7. The method of claim 6, further including calculating setup slacks and hold slacks based on said arrival times of said clock and data signals at said common endpoint of said clock and data paths.

8. The method of claim 6, wherein said arrival times of said clock and data signals are based on delays through cells in said clock and data paths respectively.

9. The method of claim 8, wherein said arrival times of said clock and data signals are further based on delays between cells in said clock and data paths respectively.

10. The method of claim 1, wherein said signal path and said data path are determined from a netlist comprising a list of cells in said integrated circuit and a set of nodes interconnecting said cells, each cell having at least one input and one output.

11. The method of claim 1, further including;

during step (a) creating a set of clock path voltage island tags for said clock path, said set of clock voltage island tags indicating each voltage island said clock path passes through;

during step (b) creating a set of data path voltage island tags for said data path, said set of data voltage island tags indicating each voltage island said data path passes through; and

during steps (c) and (d) using said set of clock voltage island tags and said set of data voltage island tags to determine which voltage islands of said integrated circuit are independent voltage islands and which voltage islands of said set of integrated circuit are dependent voltage islands by comparing said set of clock voltage island tags and said set of data voltage island tags.

12. The method of claim 1, wherein step (a) includes determining all cells and their interconnections in said clock path and step (b) includes determining all cells and their interconnections in said data path.

13. A program storage device readable by machine, tangibly embodying a program of instructions executable by the machine to perform method steps for analysis of an integrated circuit design having multiple voltage islands said method steps comprising:

(a) determining a clock path through said voltage islands;

(b) determining a data path through said voltage islands;

(c) determining which said voltage islands are independent voltage islands;

(d) determining which said voltage islands are dependent voltage islands;

(e) for said data path and said clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths; and

(f) for said data path and said clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths.

14. The program storage device of claim 13, wherein:

said independent voltage islands are voltage islands that only one of said clock path or said data path passes through; and

said dependent voltage islands being voltage islands that both said clock path and said data path passes through.

15. The program storage device of claim 13, wherein:

said worst case timing analysis is based on worst case conditions applied to all voltage islands, the minimum operating voltage applied to said independent voltage islands, and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island; and

said best case timing analysis is based on best case conditions applied to all voltage islands, the maximum operating voltage applied to said independent voltage islands and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island.

16. The program storage device of claim 15, wherein said worst case and said best case conditions are selected from conditions selected from the group consisting of process conditions, temperature conditions and both process and temperature conditions.

17. The program storage device of claim 16, wherein said worst and best case process conditions are a function of the geometry and the doping of devices comprising said integrated circuit and said worst case temperature conditions are maximum operating temperatures of said integrated circuit and said best case temperature conditions are minimum operating temperatures of said integrated circuit.

18. The program storage device of claim 13, said method further including determining an arrival time of a clock signal applied to a start point of said clock path at a common endpoint of said clock and data paths and determining an arrival time of a data signal applied at a start point of said data path at said common endpoint of said clock and data paths for each static timing analysis performed in steps (e) and (f).

19. The program storage device of claim 18, said method further including calculating setup slacks and hold slacks based on said arrival times of said clock and data signals at said common endpoint of said clock and data paths.

20. The program storage device of claim 18, wherein said arrival times of said clock and data signals are based on delays through cells in said clock and data paths respectively.

21. The program storage device of claim 20 wherein said arrival times of said clock and data signals are further based on delays between cells in said clock and data paths respectively.

22. The program storage device of claim 13, wherein said signal path and said data path are determined from a netlist comprising a list of cells in said integrated circuit and a set of nodes interconnecting said cells, each cell having at least one input and one output.

23. The program storage device of claim 13, said method further including;

during step (a) creating a set of clock path voltage island tags for said clock path, said set of clock voltage island tags indicating each voltage island said clock path passes through;

during step (b) creating a set of data path voltage island tags for said data path, said set of data voltage island tags indicating each voltage island said data path passes through; and

during steps (c) and (d) using said set of clock voltage island tags and said set of data voltage island tags to determine which voltage islands of said integrated circuit are independent voltage islands and which voltage islands of said set of integrated circuit are dependent voltage islands by comparing said set of clock voltage island tags and said set of data voltage island tags.

24. The program storage device of claim 13, wherein step (a) includes determining all cells and their interconnections in said clock path and step (b) includes determining all cells and their interconnections in said data path.

25. A computer system comprising a processor, an address/data bus coupled to said processor, and a computer-readable memory unit coupled to communicate with said processor, said memory unit containing instructions that when executed implement a method for analysis of an integrated circuit design having multiple voltage islands, said method comprising the computer implemented steps of:

(a) determining a clock path through said voltage islands;

(b) determining a data path through said voltage islands;

(c) determining which said voltage islands are independent voltage islands;

(d) determining which said voltage islands are dependent voltage islands;

(e) for said data path and said clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths; and

(f) for said data path and said clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in said data and clock paths.

26. The computer system of claim 25, wherein:

said independent voltage islands are voltage islands that only one of said clock path or said data path passes through; and

said dependent voltage islands being voltage islands that both said clock path and said data path passes through.

27. The computer system of claim 25, wherein:

said worst case timing analysis is based on worst case conditions applied to all voltage islands, the minimum operating voltage applied to said independent voltage islands, and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island; and

said best case timing analysis is based on best case conditions applied to all voltage islands, the maximum operating voltage applied to said independent voltage islands and every combination of respective minimum and maximum operating voltages applied to each dependent voltage island.

28. The computer system of claim 27, wherein said worst case and said best case conditions are selected from conditions selected from the group consisting of process conditions, temperature conditions and both process and temperature conditions.

29. The computer system of claim 28, wherein said worst and best case process conditions are a function of the geometry and the doping of devices comprising said integrated circuit and said worst case temperature conditions are maximum operating temperatures of said integrated circuit and said best case temperature conditions are minimum operating temperatures of said integrated circuit.

30. The computer system of claim 25, said method further including calculating setup slacks and hold slacks based on arrival times of clock and data signals at a common endpoint of said clock and data paths.