Voltage modulator circuit to control light emission for non-invasive timing measurements

• US 6,995,552 B2
• Filed: 09/24/2002
• Issued: 02/07/2006
• Est. Priority Date: 12/29/2000
• Status: Expired due to Fees

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Rusu, Stefan, Muljono, Harry
• Primary Examiner(s): Deb, Anjan
• Assistant Examiner(s): Teresinski, John
• Application Number:
  US10/252,542
• Publication Number:
  US 20030020448A1
• Time in Patent Office: 1,232 Days
• Field of Search: 324/76.11, 324/76.16, 324/76.52, 324/76.54, 324/76.77, 340/642, 340/956, 340/870.18, 340/870.25, 250/493.1, 250/503.1, 250/504, 438/14, 438/16, 438/17
• US Class Current: 324/76.11
• CPC Class Codes: G01R 29/02 Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937

Abstract

An apparatus accurately measures the time difference between two signal edges by optically detecting the emission from a “beacon device” that is modulated as a function of time difference. Through the use of this modulation it is possible to perform timing measurement accurately. Embodiments of a voltage modulator circuit modulate timing information into emission intensity. The method and system of the present invention can be used in applications such as clock skew and pulse width measurements.

Claims

1. Non-invasive apparatus to accurately measure the time difference between two signals having edges delayed with respect to one another comprising:

a. a voltage modulator circuit to receive the two signals as inputs and providing an output voltage modulated with said timing difference; and

b. a beacon device to receive the output voltage of said modulator circuit and converting it into an emission intensity.

2. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 1 wherein said time difference is a time difference between two timing signals.

3. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 1 wherein said time difference is a clock skew.

4. Non-invasive apparatus to accurately measure the time difference between two signals having edges delayed with respect to one another comprising:

a voltage modulator circuit to receive the two signals as inputs and providing an output voltage modulated with said timing difference; and

a beacon device to receive the output voltage of said modulator circuit and converting it into an emission intensity;

wherein

said modulator circuit comprises;

a. a capacitor to supply said modulated output;

b. a precharge transistor which when actuated couples said capacitor with a supply voltage to precharge it to that voltage; and

c. a discharge circuit coupled to discharge said capacitor for a period equal to said time difference between two signals.

5. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 4 wherein the relationship between said output voltage and said time difference is non-linear and said beacon device has a characteristic relationship between voltage and emission intensity which compensates for said non-linear relationship.

6. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 5 wherein said beacon device comprises a saturated NMOS transistor.

7. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 5 wherein said precharge transistor comprises an NMOS transistor having a source coupled to the supply voltage, a drain coupled to a terminal of said capacitor and a gate, the capacitor having another terminal coupled to ground.

8. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 5 wherein said discharge circuit comprises a series circuit made up two qualifying devices, a PMOS device and an NMOS device, the PMOS device driven by a first of said two signal and the NMOS device driven by a second of said two signals, said PMOS device coupled to one terminal of said capacitor.

9. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 8 wherein said first signal is a “

CLKEarIy”

signal and said second signal is a “

CLKLate”

signal.

10. Non-invasive apparatus to accurately measure the time difference between two signals according to claim 8 and further including first and second switching devices respectively between said PMOS device and said NMOS device and said first and second signals.