Apparatus for measuring absorption dose distribution

• US 6,998,604 B2
• Filed: 02/07/2003
• Issued: 02/14/2006
• Est. Priority Date: 02/14/2002
• Status: Expired due to Fees

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Inventors: Nishizawa, Hiroshi, Senoo, Satoshi, Shiomi, Tomoyuki
• Primary Examiner(s): Gabor, Otilia
• Application Number:
  US10/359,697
• Publication Number:
  US 20030150983A1
• Time in Patent Office: 1,103 Days
• Field of Search: 250/252.1, 250/367, 250/368, 250/369, 250/363.09, 250/370.08, 378/65, 378/207, 378/19, 378/98.8
• US Class Current: 250/252.1
• CPC Class Codes: A61B 6/583 using calibration phantoms
• CPC Class Codes: A61N 2005/1076 using a dummy object placed in the radiation field, e.g. phantom
• CPC Class Codes: A61N 5/1042 with spatial modulation of the radiation beam within the treatment head
• CPC Class Codes: A61N 5/1048 Monitoring, verifying, controlling systems and methods
• CPC Class Codes: G01T 1/203 the detector being made of plastics

Abstract

An apparatus for measuring absorption dose distribution may be used for radiotherapy, such as intensity modulated radiotherapy and radiosurgery. In the apparatus, measurement or evaluation of the distribution of the radiated dose within a phantom can be achieved accurately and in a relatively short length of time. The apparatus includes a phantom with a plastic plate scintillator having a thickness within the range of 0.15 to 1 mm and plastic blocks sandwiching the plastic scintillator, and an image analyzer. At least one of the plastic blocks is transparent and the image analyzer measures a pattern of intensity distribution of light emitted from the plastic scintillator when the phantom is irradiated.

Claims

1. An apparatus for measuring absorption dose distribution, said apparatus comprising:

a phantom including

a plastic plate scintillator having surfaces and a thickness between the surfaces within a range from 0.15 to 1 mm, the thickness being determined by optical characteristics of the surfaces, limiting crosstalk in a direction perpendicular to thickness direction of the plastic plate scintillator to not more than 1 percent, and providing a spatial resolving power of 1 mm, and

first and second plastic blocks positioned on opposite sides of said plastic plate scintillator in the direction of the thickness of said plastic plate scintillator, sandwiching said plastic plate scintillator, at least one of said first and second plastic blocks being transparent; and

an image analyzer for measuring intensity distribution of light emitted from said plastic plate scintillator when said phantom is irradiated with radiation.

2. The apparatus according to claim 1, wherein the light emitted by said plastic plate scintillator is converted into an absolute value of an absorption dose rate.

3. The apparatus according to claim 1, wherein the surfaces of said plastic plate scintillator are polished to have optical characteristics of optical mirror surfaces.

4. The apparatus according to claim 1, wherein the light emitted by said plastic plate scintillator has a wavelength within the visible region of light, ranging from a green wavelength region to a red wavelength region.

5. The apparatus according to claim 1, further comprising a first optical filter disposed between said image analyzer and said phantom, said first optical filter disturbing passage of light having a wavelength shorter than the wavelength of the light emitted by said plastic plate scintillator.

6. The apparatus according to claim 5, further comprising a second optical filter disposed between said image analyzer and said phantom, said second optical filter disturbing passage of light having a wavelength longer than the wavelength of the light emitted by said plastic plate scintillator.

7. The apparatus according to claim 1, further comprising a plastic optical filter, wherein the one of said first and second plastic blocks that is positioned on a first side of said plastic plate scintillator and adjacent said image analyzer is transparent, and said optical filter is disposed between said transparent block and said image analyzer and disturbs passage of light having a wavelength shorter than the wavelength of the light emitted by said plastic plate scintillator.

8. The apparatus according to claim 7, further comprising an optical filter disposed between said image analyzer and said phantom, said optical filter disturbing passage of light having a wavelength shorter than the wavelength of the light emitted by said plastic plate scintillator.

9. The apparatus according to claim 1, wherein the one of said first and second plastic blocks that is positioned on the side of said plastic scintillator remote from said image analyzer is white in color.

10. The apparatus according to claim 1, wherein the one of said first and second plastic blocks that is positioned on the side of said plastic scintillator remote from said image analyzer is black in color.

11. The apparatus according to claim 1, wherein said plastic plate scintillator has a side surface with a black coating.

12. The apparatus according to claim 1, wherein the one of said first and second plastic blocks that is positioned on the side of said plastic scintillator adjacent said image analyzer is transparent and has a side surface with a black coating.

13. The apparatus according to claim 1, further comprising a linear drive mechanism for linearly driving said phantom and said image analyzer in the direction of the thickness of said plastic plate scintillator.

14. The apparatus according to claim 1, wherein the surfaces of said plastic plate scintillator have optical characteristics of light scattering surfaces.