Extended input/output measurement facilities

• US 7,000,036 B2
• Filed: 05/12/2003
• Issued: 02/14/2006
• Est. Priority Date: 05/12/2003
• Status: Active Grant

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Yudenfriend, Harry M., Wyman, Leslie W., Riedy, Dale F. Jr., Carlson, Scott M., Lu, Tan, Dyck, Greg A., Rooney, William J., Trotter, John S., Oakes, Kenneth J.
• Primary Examiner(s): Huynh, Kim
• Assistant Examiner(s): Schneider, Joshua D.
• Application Number:
  US10/435,906
• Publication Number:
  US 20040230706A1
• Time in Patent Office: 1,009 Days
• Field of Search: 710 15- 20, 710/58, 710/5, 710/6, 710 8- 14
• US Class Current: 710/18
• CPC Class Codes: G06F 11/3041 where the computing system component is an input/output interface interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units G06F13/00
• CPC Class Codes: G06F 11/3065 Monitoring arrangements determined by the means or processing involved in reporting the monitored data error or fault reporting or logging G06F11/0766
• CPC Class Codes: G06F 11/3419 by assessing time
• CPC Class Codes: G06F 11/3485 for I/O devices
• CPC Class Codes: G06F 13/105 where the programme performs an input/output emulation function
• CPC Class Codes: G06F 13/124 where hardware is a sequential transfer control unit, e.g. microprocessor, peripheral processor or state-machine
• CPC Class Codes: G06F 13/24 using interrupt G06F13/32 takes precedence
• CPC Class Codes: G06F 2201/88 Monitoring involving counting
• CPC Class Codes: G06F 3/0653 Monitoring storage devices or systems
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
• CPC Class Codes: G06F 9/30003 Arrangements for executing specific machine instructions
• CPC Class Codes: H04L 1/0073 Special arrangements for feedback channel

Abstract

Input/output (I/O) measurement facilities are provided. An extended I/O measurement block facility is provided that enables measurement blocks to be stored in discontiguous areas of main storage and to be accessed directly via addresses. In a further aspect, an extended I/O measurement word facility is provided that facilitates the obtaining of measurement data for single I/O operations.

Claims

1. A method for obtaining a bloc of I/O measurement data, the method comprising:

in response to executing a modify subchannel instruction, storing a measurement block address of a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel;

obtaining measurement data the measurement data related to the performance of the I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel;

storing the obtained measurement data comprising a device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field.

2. the method according to claim 1 wherein the measurement block consists of any one of 32 bytes or 64 bytes.

3. the method according to claim 1 wherein the measurement block further comprises a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field and an initial command response time field.

4. the method according to claim 1 wherein the measurement block further comprises fields consisting of any one of a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field or an initial command response time field.

5. the method according to claim 1 wherein the subchannel provides a logical appearance of an I/O device to a program, the subchannel is associated with an I/O device and provides information concerning the associated I/O device and I/O operations and functions involving the associated I/O device.

6. the method according to claim 1 wherein the subchannel comprises internal storage.

7. The method according to claim 1 wherein the subchannel is a z/Architecture subchannel.

8. The method according to claim 1, wherein the measurement data further comprises function pending time, wherein function pending time is the time interval between acceptance of the start function (or resume function if the subchannel is in the suspended state) at the subchannel and acceptance of the first command associated with the initiation of channel program execution at the device comprising the further step of storing the obtained measurement data comprising a function pending time in the measurement block specified by the measurement block address, the measurement block comprising fields consisting of a device busy time field and a function pending time field.

9. The method according to claim 1, wherein the measurement block address comprises an address of storage of a 64 byte measurement block of the subchannel.

10. A computer program product for obtaining a bloc of I/O measurement data, the computer program product comprising:

a storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method comprising;

in response to executing a modify subchannel instruction, storing a measurement block address of a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel;

obtaining measurement data the measurement data related to the performance of the I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel;

storing the obtained measurement data comprising a device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field.

11. the computer program product according to claim 10 wherein the measurement block consists of any one of 32 bytes or 64 bytes.

12. the computer program product according to claim 10 wherein the measurement block further comprises a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field and an initial command response time field.

13. the computer program product according to claim 10 wherein the measurement block further comprises fields consisting of any one of a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field or an initial command response time field.

14. the computer program product according to claim 10 wherein the subchannel provides a logical appearance of an I/O device to a program, the subchannel is associated with an I/O device and provides information concerning the associated I/O device and I/O operations and functions involving the associated I/O device.

15. the computer program product according to claim 10 wherein the subchannel comprises internal storage.

16. The computer program product according to claim 10 wherein the subchannel is a z/Architecture subchannel.

17. A system for obtaining a bloc of I/O measurement data, the system comprising:

a memory;

a computer system in communication with the memory, the computer system comprising an instruction fetching unit for fetching instructions from memory and one or more execution units for executing fetched instructions;

wherein the computer system includes instructions to execute a method comprising;

in response to executing a modify subchannel instruction, storing a measurement block address of a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel;

obtaining measurement data the measurement data related to the performance of the I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel;

storing the obtained measurement data comprising a device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field.

18. the system according to claim 17 wherein the measurement block consists of any one of 32 bytes or 64 bytes.

19. the system according to claim 17 wherein the measurement block further comprises a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field and an initial command response time field.

20. the system according to claim 17 wherein the measurement block further comprises fields consisting of any one of a device connect time field, a function pending time field, a device disconnect time field, a control unit queuing time field, a device active only time field or an initial command response time field.

21. the system according to claim 17 wherein the subchannel provides a logical appearance of an I/O device to a program, the subchannel is associated with an I/O device and provides information concerning the associated I/O device and I/O operations and functions involving the associated I/O device.

22. the system according to claim 17 wherein the subchannel comprises internal storage.

23. The system according to claim 17 wherein the subchannel is a z/Architecture subchannel.