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Predictive failure analysis and failure isolation using current sensing

  • US 7,003,409 B2
  • Filed: 08/19/2003
  • Issued: 02/21/2006
  • Est. Priority Date: 08/19/2003
  • Status: Expired due to Fees
First Claim
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1. A method for predicting the failure of an electronic circuit in an electronic device, the method comprising:

  • receiving a measured value for current draw of the electronic circuit from at least one voltage supply;

    receiving at least one measured value for an environmental condition, wherein the environmental condition includes an environment temperature;

    monitoring at least one operating condition of the electronic circuit, wherein the operating condition includes a CPU utilization level;

    determining if the measured current draw is outside a pass range for the measured environmental condition and for the operating condition of the electronic circuit; and

    alerting of a potential failure of the electronic circuit if the measured current draw is outside the pass range.

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