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Method and apparatus for monitoring and adjusting chamber impedance

  • US 7,004,107 B1
  • Filed: 12/01/1997
  • Issued: 02/28/2006
  • Est. Priority Date: 12/01/1997
  • Status: Expired due to Fees
First Claim
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1. A substrate processing system comprising:

  • a deposition chamber comprising a reaction zone;

    a substrate holder that positions a substrate in the reaction zone;

    said substrate holder comprising a low frequency (LF) electrode;

    a gas distribution system that includes a gas inlet manifold for supplying one or more process gases to said reaction zone;

    said gas inlet manifold comprising a high frequency (HF) electrode;

    a plasma power source for forming a plasma within the reaction zone of said deposition chamber, the plasma power source comprising a high frequency power supply coupled with the HF electrode and a low frequency power supply coupled with the LF electrode;

    an impedance monitor comprising a first impedance probe electrically coupled to said high frequency electrode to measure the impedance at the HF electrode and a second impedance probe electrically coupled to said low frequency electrode to measure the impedance at the LF electrode; and

    a processor coupled with the impedance monitor for adjusting processing conditions of the deposition chamber based on measurements by the first impedance probe and the second impedance probe.

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