Interferometric method and apparatus for the characterization of optical pulses

• US 7,006,230 B2
• Filed: 05/16/2003
• Issued: 02/28/2006
• Est. Priority Date: 05/16/2003
• Status: Active Grant

• Current Assignee: RPX Corporation
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Kang, Inuk, Dorrer, Christophe J.
• Primary Examiner(s): Lee, Hwa Andrew
• Assistant Examiner(s): CONNOLLY, PATRICK J
• Application Number:
  US10/439,828
• Publication Number:
  US 20040227949A1
• Time in Patent Office: 1,019 Days
• Field of Search: 356/450, 356/451
• US Class Current: 356/451
• CPC Class Codes: G01J 11/00 Measuring the characteristics of individual optical pulses or of optical pulse trains

Abstract

A method and apparatus for the characterization of an optical pulse includes splitting an optical pulse into two replicas separated by a delay, modulating at least one of the two replicas with a linear temporal phase modulation, measuring a spectrum of the modulated replicas, and characterizing the optical pulse using the measured spectra. In one embodiment of the present invention a spectral phase difference between the replicas is obtained from the measured spectrum using Fourier Transform Spectral Interferometry.

Claims

1. A method, comprising:

splitting an optical pulse into two replicas separated by a delay;

modulating said two replicas with a periodic phase modulation having a period substantially equal to twice the delay between the replicas such that each of the replicas experiences a linear temporal phase modulation;

measuring a spectrum of said modulated replicas; and

characterizing said optical pulse using said measured spectra.

2. The method of claim 1, wherein said spectra are measured using an optical spectrum analyzer.

3. The method of claim 1, wherein said spectra are measured using a Fabry-Perot etalon followed by a photodetector.

4. The method of claim 1, wherein one of said replicas is modulated by a linear temporal phase modulation of positive slope and the other of said replicas is modulated by a linear temporal phase modulation of negative slope.

5. The method of claim 1, wherein a clock signal is coupled to an optical source generating said optical pulse and to a modulator driver of said modulator for synchronization.

6. The method of claim 1, wherein an electronic clock signal is recovered from the optical pulses and a harmonic of said electronic clock is used to drive said phase modulator.

7. The method of claim 1, wherein a spectral phase difference between the two replicas is determined from the measured spectrum using Fourier Transform Spectral Interferometry.

8. The method of claim 1, further comprising determining a linear spectral phase difference between the two replicas attributable to the delay, and subtracting said determined linear spectral phase difference from the measured spectral phase.

9. The method of claim 8, wherein the linear spectral phase difference between the two replicas attributable to the delay is determined by turning off the temporal modulation, measuring the spectral phase difference between the two replicas and subtracting the resultant spectral phase from the spectral phase measured for the replicas with the modulation on.

10. The method of claim 8, wherein the linear spectral phase difference between the two replicas attributable to the delay is determined by subtracting spectral phase differences obtained from two interferograms corresponding to two different timing alignment arrangements between the replicas and the phase modulator drive voltage.

11. The method of claim 10, wherein a first of said two replicas is modulated by a linear temporal phase modulation of positive slope and the second of said two replicas is modulated by a linear temporal phase modulation of negative slope, resulting in a first interferogram, and then the first of said two replicas is modulated by a linear temporal phase modulation of negative slope and the second of said two replicas is modulated by a linear temporal phase modulation of positive slope, resulting in a second interferogram.

12. The method of claim 10, wherein the switching between said two different timing alignments is achieved using a voltage controlled phase shifter that adjusts the phase of a phase modulator drive voltage.

13. The method of claim 10, wherein a first of said two replicas is modulated by a linear temporal phase modulation of negative slope and the second of said two replicas is modulated by a linear temporal phase modulation of positive slope, resulting in a first interferogram, and then the first of said two replicas is modulated by a linear temporal phase modulation of positive slope and the second of said two replicas is modulated by a linear temporal phase modulation of negative slope, resulting in a second interferogram.

14. A method for calibrating the linear spectral phase difference attributable to a temporal delay between two replicas of an optical pulse, comprising:

modulating said two replicas with a periodic phase modulation such that each of the replicas experiences a linear temporal phase modulation, and such that a first of said two replicas is modulated by a linear temporal phase modulation of first slope and the second of said two replicas is modulated by a linear temporal phase modulation of second slope;

measuring a first spectrum of said modulated replicas;

determining a first spectral phase difference between said modulated replicas from said first spectrum;

modulating said two replicas such that the first replica is modulated by a linear temporal phase modulation of the second slope and the second replica is modulated by a linear temporal phase modulation of the first slope,

measuring a second spectrum of said modulated replicas;

determining a second spectral phase difference between said modulated replicas from said second spectrum; and

determining and eliminating a linear spectral phase difference between said two replicas attributable to the delay by comparing said two determined spectral phase differences.

15. The method of claim 14, wherein said first slope is a positive slope and said second slope is a negative slope.

16. The method of claim 14, wherein said first slope is a negative slope and said second slope is a positive slope.

17. The method of claim 14, wherein the first of said two replicas experiences a linear temporal phase modulation of substantially zero slope, such that the first of said two replicas is effectively not modulated.

18. The method of claim 14, wherein the second of said two replicas experiences a linear temporal phase modulation of substantially zero slope, such that the second of said two replicas is effectively not modulated.

19. The method of claim 14, wherein said spectra are measured using an optical spectrum analyzer.

20. The method of claim 14, wherein said spectra are measured using a Fabry-Perot etalon followed by a photodetector.

21. The method of claim 14, wherein the spectral phase difference between the two modulated replicas is obtained from the measured spectrum using Fourier Transform Spectral Interferometry.

22. The method of claim 14, wherein a drive signal to a driver of a modulator is adjusted to cause said first of said two replicas to be modulated by a linear temporal phase modulation of positive slope and the second of said two replicas to be modulated by a linear temporal phase modulation of negative slope and then said first of said two replicas to be modulated by a linear temporal phase modulation of negative slope and the second of said two replicas to be modulated by a linear temporal phase modulation of positive slope.

23. The method of claim 14, wherein a clock signal is coupled to an optical source generating said optical pulse and to a modulator driver of a modulator for synchronization.

24. The method of claim 14, wherein an electronic clock signal is recovered from the optical pulse and a harmonic of said electronic clock is used to drive said modulation.

25. An apparatus for characterizing an optical pulse, comprising:

a waveguide interferometer for splitting said optical pulse into two replicas separated by a delay;

at least one waveguide temporal phase modulator for modulating at least one of said replicas; and

a frequency-resolving device for measuring a spectrum of said modulated replicas;

wherein said at least one replica is modulated with a linear temporal phase modulation.

26. The apparatus of claim 25, further comprising a control unit for characterizing said optical pulse using said measured spectra.

27. The apparatus of claim 26, wherein said control unit characterizes said optical pulse from the measured spectrum using Fourier Transform Spectral Interferometry.

28. The apparatus of claim 26, wherein said control unit performs the calibration of the linear spectral phase attributable to the delay between the two replicas.

29. The apparatus of claim 25, wherein said waveguide interferometer and said at least one waveguide temporal phase modulator are integrated such that a waveguide delay line consists of two arms for splitting said optical pulse into said two replicas and at least one of said arms comprises an integrated waveguide temporal phase modulator.

30. The apparatus of claim 29, wherein each of said two arms comprises an integrated waveguide temporal phase modulator for modulating said two replicas.

31. The apparatus of claim 25, wherein said at least one waveguide temporal modulator comprises a LiNbO₃ temporal phase modulator.

32. The apparatus of claim 25, wherein said waveguide interferometer comprises a Mach-Zehnder interferometer.

33. The apparatus of claim 25, wherein said frequency-resolving device comprises an optical spectrum analyzer.

34. The apparatus of claim 25, wherein said frequency-resolving device comprises a Fabry-Perot etalon followed by a photodetector.