Apparatus and methods for verifying the location of areas of interest within a sample in an imaging system

• US 7,006,674 B1
• Filed: 10/29/1999
• Issued: 02/28/2006
• Est. Priority Date: 10/29/1999
• Status: Expired due to Term

• Current Assignee: Cytyc Corporation (Hologic Incorporated)
• Original Assignee: Cytyc Corporation (Hologic Incorporated)
• Inventors: Geiselman, Theodore S., Zahniser, David J.
• Primary Examiner(s): Ahmed, Samir
• Assistant Examiner(s): KIM, CHONG R
• Application Number:
  US09/430,198
• Time in Patent Office: 2,314 Days
• Field of Search: 382/128, 382/133, 382/134, 382/287, 382/291
• US Class Current: 382/128
• CPC Class Codes: G06V 20/693 Acquisition

Abstract

An apparatus and method for verifying the location of an area of interest within a sample are disclosed. An imaging system includes an optical system and a stage movable relative to the optical system. A computer server is in communication with the imaging system and with a review station. The imaging system is capable of spatially locating a datum mark on the sample and determining a spatial offset value of the mark relative to a nominal position thereof. The coordinate systems of a respective one of the imaging system and the review station can be standardized. The method includes locating a datum mark on the sample, and identifying an area of interest within the sample. The method further includes determining the location of the area of interest relative to the mark. The method further includes locating again the datum, and checking that a dimensional error in locating the datum mark is less than a tolerance value to verify location of the area of interest.

Claims

1. A method for verifying a location of an area of interest within a sample, the method comprising:

locating a datum mark on the sample;

identifying the area of interest within the sample;

determining the location of the area of interest relative to the mark; and

relocating the datum, wherein the location of the area of interest is verified if a dimensional error in locating the datum relative to relocating the datum is less than a tolerance value.

2. The method according to claim 1 wherein the identification of the area of interest within the sample comprises optically scanning the sample.

3. The method according to claim 1 wherein the tolerance value is between about ten microns and one thousand microns.

4. The method according to claim 1 further comprising:

identifying a plurality of areas of interest within the sample; and

ranking the plurality of areas of interest in an order.

5. The method according to claim 1 wherein the sample comprises a cytological specimen deposited on a slide.

6. The method according to claim 5 wherein the area of interest within the sample comprises an abnormal cell.

7. The method according to claim 1 wherein the sample is mounted on a stage.

8. The method according to claim 1 further comprising rejecting the sample if the location of the area of interest is not verified.

9. The method according to claim 1 further comprising placing a visible indicator proximate the area of interest identified within the sample.

10. A method for verifying a location of an area of interest within a sample, the method comprising:

locating a datum mark on the sample;

assigning a reference coordinate value to a location of the mark;

identifying an area of interest within the sample;

assigning a coordinate value to the location of the area of interest; and

spatially relocating the mark, thereby determining a spatial offset value of the relocated mark relative to the reference coordinate value;

wherein the location of the area of interest is verified if the spatial offset value is less than a tolerance value.

11. The method according to claim 10 wherein the first locating of the datum mark comprises centering the mark in a field of view of an optical instrument.

12. The method of claim 10 further comprising storing in memory the coordinate value of the area of interest.

13. The method according to claim 10 further comprising:

transferring the sample to a review station;

locating the datum mark; and

setting a coordinate system of the review station based on a location of the mark.

14. A method for verifying a location of an area of interest within a cytological specimen on a slide located in an automated cytological imaging system, the method comprising:

placing the slide within an optical path of the imaging system;

centering a datum mark on the slide within a field of view of the imaging system;

assigning a reference coordinate value to a location of the mark;

storing in memory the reference coordinate value;

scanning the specimen to identify an area of interest within the specimen;

centering the area of interest within the field of view of the imaging system;

assigning a coordinate value to the area of interest;

returning to the reference coordinate value location;

spatially relocating the mark; and

comparing the reference coordinate value to a coordinate value resulting from spatially relocating the mark, thereby determining a spatial offset value of the mark, wherein the location of the area of interest is verified if the spatial offset value is less than a tolerance value.

15. The method of claim 14 wherein the method is performed while the slide is continuously mounted within the imaging system.

16. A method for verifying a location of an area of interest within a cytological specimen on a slide located in an automated cytological imaging system, the method comprising:

locating a datum mark on the sample;

identifying the area of interest within the sample;

determining the location of the area of interest relative to the mark; and

relocating the datum, wherein the location of the area of interest is verified if a dimensional error in locating the datum relative to relocating the datum is less than a tolerance value.

17. The method of claim 16, wherein the method is performed while the slide is continuously mounted within the imaging system.