Light beam shaping arrangement and method in electro-optical readers

• US 7,007,843 B2
• Filed: 06/09/2003
• Issued: 03/07/2006
• Est. Priority Date: 06/09/2003
• Status: Expired due to Fees

• Current Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Original Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Inventors: Poloniewicz, Paul R.
• Primary Examiner(s): PAIK, STEVEN SANGYUL
• Application Number:
  US10/457,302
• Publication Number:
  US 20040245338A1
• Time in Patent Office: 1,002 Days
• Field of Search: 235/454, 235/462.14, 235/462.2, 235/462.21, 235/462.24, 235/462.36, 235/462.37, 235/470, 235/472.01, 359/224, 359/291, 359/223
• US Class Current: 235/454
• CPC Class Codes: G06K 7/10653 using flexible or piezoelectric means

Abstract

A micro-electro-mechanical system component is deformed to control a shape and size and orientation of a laser beam spot that is scanned across a symbol to be read by an electro-optical reader.

Claims

1. A beam shaping arrangement, comprising:

a) a light source for emitting a light beam along an optical axis, the light beam having a cross-section in a plane perpendicular to the optical axis;

b) a drive for scanning a target;

c) a deformable, micro-electro-mechanical system (MEMS) mirror located between the light source and the drive for reflecting the light beam along an optical path toward the drive as a reflected beam having a cross-section in a plane perpendicular to the optical path; and

d) means for changing the cross-section of the reflected beam to be different from the cross-section of the light beam emitted by the source by deforming the MEMS mirror between curved configurations, thereby enabling the drive to scan the target with the reflected beam of different cross-section.

2. The arrangement of claim 1, wherein the light source is a solid-state laser.

3. The arrangement of claim 1, and further comprising a substrate and an upright support for supporting the MEMS mirror above the substrate.

4. The arrangement of claim 3, wherein the changing means includes a plurality of electrodes on the substrate at opposite sides of the support and below the MEMS mirror, and a drive circuit for charging the electrodes to generate between the electrodes and the MEMS mirror an electrostatic field of sufficient strength to deform the MEMS mirror.

5. The arrangement of claim 4, wherein the support lies in an upright plane bisecting the MEMS mirror, and wherein the electrodes include a first electrode positioned at one side of the upright plane, and a second electrode positioned at an opposite side of the upright plane, and wherein the drive circuit charges both the first and the second electrodes simultaneously.

6. The arrangement of claim 5, wherein the MEMS mirror has an initial configuration in which the MEMS mirror lies in a plane, and wherein the MEMS mirror has a curved configuration during operation of the changing means.

7. The arrangement of claim 3, wherein the substrate, the support and the MEMS mirror are of one-piece construction.

8. The arrangement of claim 4, wherein the support is an upright post centrally located with respect to the MEMS mirror, and wherein the electrodes are arranged circumferentially about the post, and wherein the drive circuit charges at least one of the electrodes.

9. The arrangement of claim 1, wherein the MEMS mirror is deformed between curved configurations of opposite curvature.

10. The arrangement of claim 1, wherein the changing means deforms the MEMS mirror between a first shape in which the cross-section of the reflected beam has a major axis extending in one direction across the target, and a second shape in which the cross-section of the reflected beam has a major axis extending across the target in a transverse direction perpendicular to said one direction.

11. The arrangement of claim 1, wherein the target is indicia to be electro-optically read, and signal processing circuitry for detecting a type of the indicia being read, and wherein the changing means is responsive to the type of the indicia detected by the signal processing circuitry.

12. The arrangement of claim 1, wherein the cross-section of the light beam emitted by the source is generally circular, and wherein the changing means changes the cross-section of the reflected beam to be elliptical.

13. A beam shaping method, comprising the steps of:

a) emitting a light beam from a light source along an optical axis, the light beam having a cross-section in a plane perpendicular to the optical axis;

b) scanning a target with a drive;

c) positioning a deformable, micro-electro-mechanical system (MEMS) mirror relative to the light beam between the light source and the drive for reflecting the light beam along an optical path toward the drive as a reflected beam having a cross-section in a plane perpendicular to the optical path;

d) changing the cross-section of the reflected beam to be different from the cross-section of the light beam by deforming the MEMS mirror between curved configurations; and

e) enabling the drive to scan the target with the reflected beam of different cross-section.

14. The method of claim 13, and the step of supporting the MEMS mirror above a substrate.

15. The method of claim 14, wherein the changing step is performed by positioning a plurality of electrodes on the substrate below the MEMS mirror, and by charging the electrodes to generate between the electrodes and the MEMS mirror an electrostatic field of sufficient strength to deform the MEMS mirror.

16. The method of claim 15, wherein the charging step is performed by simultaneously charging a plurality of the electrodes.

17. The method of claim 16, wherein the changing step distorts the MEMS mirror between a generally planar configuration and a curved configuration.

18. The method of claim 13, wherein the cross-section of the light beam is generally circular, and wherein the changing step is operative to change the cross-section of the reflected beam to be elliptical.

19. The method of claim 13, wherein the changing step deforms the MEMS mirror between a first shape in which the cross-section of the reflected beam has a major axis extending in one direction across the target, and a second shape in which the cross-section of the reflected beam has a major axis extending across the target in a transverse direction perpendicular to said one direction.

20. The method of claim 13, wherein the target is indicia to be electro-optically read, and the step of detecting a type of the indicia being read, and wherein the changing step is responsive to the type of the indicia detected.