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Fail judging method and analyzer

  • US 7,008,525 B2
  • Filed: 11/18/2002
  • Issued: 03/07/2006
  • Est. Priority Date: 11/20/2001
  • Status: Expired due to Term
First Claim
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1. A fail judging method for determining properness or improperness of a sensor used for analysis of a sample, the analysis comprising:

  • introducing the sample to a reagent layer of the sensor;

    applying a voltage to the reagent layer and the sample via a pair of electrodes;

    measuring current between the electrodes;

    setting a reference time point as a time point when the current reaches a predetermined threshold for detection of the introduction of the sample; and

    obtaining an analysis result based on current measured after the reference time point;

    wherein the method comprises;

    observing change of the current before and after the reference time point; and

    determining that the sensor is improper when the change in current before the reference time point or the change in current after the reference time point differs from a predetermined change before the reference time point or a predetermined change after the reference time point, respectively.

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