Measuring for device for contactless measurement of tires
First Claim
1. Method for characterizing a surface (20) having a localized unevenness (21a, 21b, 22a, 22b), comprising:
- creating (10) a plurality of adjacent contour lines of the surface to create a two-dimensional height representation of the surface, a contour line of the surface being created as a function of a location variable (φ
);
detecting (12) the localized unevenness (21a, 21b, 22a, 22b) in the two-dimensional height representation, wherein the step of detecting (12) comprisescreating a variation representation from the height representation (50),detecting localized points of unevenness delimited by edges using a variation threshold, anddetecting essentially edge-free localized points of unevenness using the variation threshold (52); and
eliminating (14) the detected points of unevenness delimited by edges and the detected essentially edge-free points of unevenness from the height representation, so that an incomplete representation of the surface results which characterizes the surface without the localized unevenness.
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Abstract
In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable. Subsequently, the localized unevenness is detected in the contour line and eliminated from the contour line, so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.
22 Citations
16 Claims
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1. Method for characterizing a surface (20) having a localized unevenness (21a, 21b, 22a, 22b), comprising:
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creating (10) a plurality of adjacent contour lines of the surface to create a two-dimensional height representation of the surface, a contour line of the surface being created as a function of a location variable (φ
);detecting (12) the localized unevenness (21a, 21b, 22a, 22b) in the two-dimensional height representation, wherein the step of detecting (12) comprises creating a variation representation from the height representation (50), detecting localized points of unevenness delimited by edges using a variation threshold, and detecting essentially edge-free localized points of unevenness using the variation threshold (52); and eliminating (14) the detected points of unevenness delimited by edges and the detected essentially edge-free points of unevenness from the height representation, so that an incomplete representation of the surface results which characterizes the surface without the localized unevenness. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 15, 16)
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14. Apparatus for characterizing a surface (20) having a localized unevenness (21a, 21b, 22a, 22b), comprising:
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means for creating (10) a plurality of adjacent contour lines of the surface to create a two-dimensional height representation of the surface, a contour line of the surface being created as a function of a location variable (φ
);means for detecting (12) the localized unevenness (21a, 21b, 22a, 22b) in the two-dimensional height representation, wherein the step of detecting (12) comprises creating a variation representation from the height representation (50), detecting localized points of unevenness delimited by edges using a variation threshold, and detecting essentially edge-free localized points of unevenness using the variation threshold (52); and means for eliminating (14) the detected points of unevenness delimited by edges and the detected essentially edge-free points of unevenness from the height representation, so that an incomplete representation of the surface results which characterizes the surface without the localized unevenness.
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Specification