Highly time resolved impedance spectroscopy

• US 7,015,701 B2
• Filed: 03/04/2003
• Issued: 03/21/2006
• Est. Priority Date: 10/12/1999
• Status: Expired due to Fees

• Current Assignee: Erich Sackman, Gerald Wiegand
• Original Assignee: Erich Sackman, Gerald Wiegand
• Inventors: Sackman, Erich, Wiegand, Gerald
• Primary Examiner(s): Nguyen, Vincent Q.
• Application Number:
  US10/382,732
• Publication Number:
  US 20030173976A1
• Time in Patent Office: 1,113 Days
• Field of Search: 324/71.1, 324/603, 324439-453, 324/692, 435/287.2, 435/287.9, 435/817, 435/14, 600/508, 600/515, 257/414
• US Class Current: 324/603
• CPC Class Codes: G01N 27/026 Dielectric impedance spectroscopy electrochemical impedance spectroscopy for measuring corrosion G01N17/02
• CPC Class Codes: G01R 23/16 Spectrum analysis; Fourier analysis
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00

Abstract

A highly time resolved impedance spectroscopy enhances measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage signal is used as the perturbation signal, non-stationary time to frequency transformation algorithms are used when processing the measured time signals of the voltage and current to determine impedance spectra which are localized in time; and the system-characterizing quantities are determined from the impedance spectra using equivalent circuit fitting in a time-resolution-optimized form. Also provided are measuring cells and methods for measuring impedance spectra of biofunctional molecules and aggregates.

Claims

1. An apparatus for measuring impedance spectra with high time resolution comprising:

a measuring cell comprising one or more electrodes, wherein at least one of the electrodes is modified by coupling thereto biofunctional molecules or aggregates;

a memory device configured to store program instructions for generating a perturbation signal and operations to process and evaluate measured data;

at least one analog to digital converter configured to receive a signal representing a perturbation signal and to output a digital value representing the perturbation signal, and to receive a signal representing a system response to the perturbation signal by the measuring cell and to output a digital value representing the system response; and

a processor configured to receive the digital values output by the at least one analog to digital converter, and to receive the program instructions to process and evaluate measured data from the memory device, and to output a perturbation signal and an impedance spectrum, wherein the program instructions to process and evaluate measured data uses a non-stationary time to frequency transformation.

2. The apparatus of claim 1 comprising a plurality of measuring cells.

3. The apparatus of claim 2 wherein the plurality of measuring cells enable parallel data acquisition and analysis.

4. The apparatus of claim 2 wherein the plurality of measuring cells enable sequential data acquisition and analysis.

5. An apparatus for measuring impedance spectra with high time resolution comprising:

a measuring cell comprising a substrate bearing one or more electrodes and a lipid membrane support;

a memory device configured to store program instructions for generating a perturbation signal and operations to process and evaluate measured data;

at least one analog to digital converter configured to receive a signal representing a perturbation signal and to output a digital value representing the perturbation signal, and to receive a signal representing a system response to the perturbation signal by the measuring cell and to output a digital value representing the system response; and

a processor configured to receive the digital values output by the at least one analog to digital converter, and to receive the program instructions to process and evaluate measured data from the memory device, and to output a perturbation signal and an impedance spectrum, wherein the program instructions to process and evaluate measured data uses a non-stationary time to frequency transformation.

6. The apparatus of claim 5 comprising a plurality of measuring cells.

7. The apparatus of claim 6 wherein the plurality of measuring cells enable parallel data acquisition and analysis.

8. The apparatus of claim 6 wherein the plurality of measuring cells enable sequential data acquisition and analysis.