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Method and arrangement for imaging and measuring microscopic three-dimensional structures

  • US 7,015,906 B2
  • Filed: 02/15/2002
  • Issued: 03/21/2006
  • Est. Priority Date: 02/21/2001
  • Status: Expired due to Term
First Claim
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1. A method for imaging and measuring microscopic three-dimensional structures, comprising the following steps:

  • providing a confocal scanning microscopedepicting a data set in three-dimensional form on a display associated with the confocal scanning microscope;

    defining at least one arbitrary section position and an arbitrary rotation angle;

    rotating the three-dimensional depiction on the display until a structure contained in the three-dimensional form reproduces on the display a depiction that appears suitable to the user for further processing; and

    performing an analytical measurement operation on the structure, wherein upon definition of the rotation angle, a transformation matrix is calculated, and upon definition of the section position, corresponding section planes are calculated and wherein the corresponding section planes are depicted on the display, and the depiction of the sectional geometry is implemented in the form of a wire-frame model made up of an outer and an inner cuboid.

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