Method and arrangement for imaging and measuring microscopic three-dimensional structures
First Claim
Patent Images
1. A method for imaging and measuring microscopic three-dimensional structures, comprising the following steps:
- providing a confocal scanning microscopedepicting a data set in three-dimensional form on a display associated with the confocal scanning microscope;
defining at least one arbitrary section position and an arbitrary rotation angle;
rotating the three-dimensional depiction on the display until a structure contained in the three-dimensional form reproduces on the display a depiction that appears suitable to the user for further processing; and
performing an analytical measurement operation on the structure, wherein upon definition of the rotation angle, a transformation matrix is calculated, and upon definition of the section position, corresponding section planes are calculated and wherein the corresponding section planes are depicted on the display, and the depiction of the sectional geometry is implemented in the form of a wire-frame model made up of an outer and an inner cuboid.
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Abstract
The present invention concerns a method and an arrangement for imaging and measuring microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional form on a display (27) associated with the microscope. At least one arbitrary section position and an arbitrary rotation angle are defined by the user. Rotation of the three-dimensional depiction on the display (27) is performed until a structure contained in the three-dimensional form reproduces on the display (27) a depiction that appears suitable to the user. The corresponding analytical operations are then performed on the structure.
28 Citations
14 Claims
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1. A method for imaging and measuring microscopic three-dimensional structures, comprising the following steps:
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providing a confocal scanning microscope depicting a data set in three-dimensional form on a display associated with the confocal scanning microscope; defining at least one arbitrary section position and an arbitrary rotation angle; rotating the three-dimensional depiction on the display until a structure contained in the three-dimensional form reproduces on the display a depiction that appears suitable to the user for further processing; and performing an analytical measurement operation on the structure, wherein upon definition of the rotation angle, a transformation matrix is calculated, and upon definition of the section position, corresponding section planes are calculated and wherein the corresponding section planes are depicted on the display, and the depiction of the sectional geometry is implemented in the form of a wire-frame model made up of an outer and an inner cuboid. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for imaging and measuring microscopic three-dimensional structures, comprising the following steps:
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providing a confocal scanning microscope depicting a data set in three-dimensional form on a display associated with the confocal scanning microscope; defining at least one arbitrary section position and an arbitrary rotation angle; rotating the three-dimensional depiction on the display until a structure contained in the three-dimensional form reproduces on the display a depiction that appears suitable to the user for further processing; and performing an analytical measurement operation on the structure, wherein multiple surfaces are assembled into a stack that represents a three-dimensional volume; and
specific analyses are performed on the volume, wherein the selected volume represents a three-dimensional curve, wherein scan parameters are applied exclusively to the selected volume, and a scanning microscope is controlled in such away that only points on the three-dimensional spatial curve are scanned.
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8. An arrangement for imaging and measuring microscopic three-dimensional structures, comprising:
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a microscope, a display associated with the microscope, a PC, an input device associated with the PC, a first window shown on the display for depicting a plurality of section planes, from viewing directions differing in each case, a second window shown on the display for depicting a rotational view, a third window shown on the display for a visual depiction of the coordinates, the rotation angle, and a section position; and a respective crosshairs is shown in the depiction of each section plane, for interactive modification of the section position, wherein the image content in the first window is updated in accordance with a modification. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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Specification