Method and apparatus for analyzing a distribution

• US 7,016,805 B2
• Filed: 12/14/2001
• Issued: 03/21/2006
• Est. Priority Date: 12/14/2001
• Status: Expired due to Fees

• Current Assignee: Gigamax Technologies Incorporated
• Original Assignee: Wavecrest Corporation
• Inventors: Li, Peng, Wilstrup, Jan Brian, Sun, Jie
• Primary Examiner(s): Tsai, Carol S. W.
• Application Number:
  US10/021,895
• Publication Number:
  US 20030115017A1
• Time in Patent Office: 1,558 Days
• Field of Search: 702/57, 702/58, 702 65- 67, 702181-183, 702/128, 702/69, 702/70, 702/FOR.108, 702/FOR.110, 702/FOR.114, 702/FOR.134, 702/FOR.135, 702/FOR.137, 702/FOR.164, 702/FOR.166, 700/51, 700/52, 700/93, 375/130, 375/226, 375/355, 375/356, 375/371
• US Class Current: 702/181
• CPC Class Codes: G06F 17/18 for evaluating statistical data , e.g. average values, frequency distributions, probability functions, regression analysis forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04
• CPC Class Codes: G06F 18/2415 based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate
• CPC Class Codes: H04L 1/205 jitter monitoring

Abstract

A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.

Claims