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Pad conditioner control using feedback from a measured polishing pad roughness level

  • US 7,018,269 B2
  • Filed: 06/18/2003
  • Issued: 03/28/2006
  • Est. Priority Date: 06/18/2003
  • Status: Expired due to Term
First Claim
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1. A method for controlling a pad conditioner in a CMP device, comprising:

  • sensing a roughness of a CMP polishing pad using a roughness-sensing device;

    determining a roughness value of the CMP polishing pad based on the sensed roughness;

    generating a control signal in response to the roughness value; and

    applying the control signal to a pad conditioner control device to non-uniformly condition the polishing pad to a roughness profile with a continuously varying shape.

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