X-ray inspection system
First Claim
1. An X-ray inspection system constructed and arranged to examine an item under inspection located at an inspection region, the system comprising:
- an X-ray source located at the inspection region to expose the item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of a first dimension, a second dimension and a third dimension;
an X-ray detector to detect X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension;
a controller coupled to each of the X-ray source and the X-ray detector, to control movement of the X-ray source and the X-ray detector in the first and second dimensions; and
a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information;
wherein the controller is also configured to control movement of the X-ray source and the X-ray detector independently of each other in any of collinear directions and different directions to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation; and
wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received.
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Abstract
An X-ray inspection system and methodology is disclosed. The system comprises a conveyor, an X-ray source that exposes an item under inspection to X-ray radiation and at least one X-ray detector that detects X-ray radiation modified by the item. The X-ray source and X-ray detector may be movable in any of first and second dimensions. The X-ray source may also be moved in a third dimension to zoom in and out on regions of interest in the item order inspection. The system further comprises a controller that controls movement of the X-ray source and X-ray detector, independently of each other, in any of collinear and different directions, to provide a plurality of X-ray views of the item at varying examination angles of the X-ray radiation. A processor coupled to the controller may be configured to receive and process detection information from the X-ray detector and to provide processed information to an operator interface. The operator interface may also receive instructions from an operator input and provide the instructions to the controller.
75 Citations
32 Claims
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1. An X-ray inspection system constructed and arranged to examine an item under inspection located at an inspection region, the system comprising:
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an X-ray source located at the inspection region to expose the item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of a first dimension, a second dimension and a third dimension; an X-ray detector to detect X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension; a controller coupled to each of the X-ray source and the X-ray detector, to control movement of the X-ray source and the X-ray detector in the first and second dimensions; and a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information; wherein the controller is also configured to control movement of the X-ray source and the X-ray detector independently of each other in any of collinear directions and different directions to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation; and wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. An X-ray inspection system, comprising:
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an X-ray source to expose an item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of the first dimension, a second dimension and a third dimension; an X-ray detector located at the inspection region to detect X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension; a controller coupled to each of the X-ray source and the X-ray detector, to control movement of the X-ray source and the X-ray detector in the first and second dimensions; and a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information; wherein the controller is also configured to control movement of the X-ray source in the third dimension so as to provide varying levels of zoom of the processed information; and wherein the processor is further configured to receive information about the item under inspection from a remote inspection device and to locate a region of interest in the item under inspection based on the information received. - View Dependent Claims (21, 22, 23, 24)
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25. A high resolution X-ray inspection system constructed and arranged to examine an item under inspection located at an inspection region, the high resolution X-ray inspection system comprising:
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a high resolution X-ray source that exposes the item under inspection to X-ray radiation, the X-ray source having a focal spot size that is less than 100 μ
m, the X-ray source being constructed and arranged to be movable in any of a first dimension, a second dimension, and a third dimension;an X-ray detector located at the inspection region that detects X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension; a controller coupled to each of the X-ray source and the X-ray detector, configured to control movement of the X-ray source and the X-ray detector in the first and second dimensions; and a processor that is configured to; i) receive information on a region of interest in the item under inspection from a remote inspection system; ii) provide input to the controller whereby the controller positions the x-ray source and x-ray detector to image the region of interest; and iii) receive detection information from the X-ray detector on the region of interest, to process the detection information, and to provide processed information. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32)
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Specification