Capacitive pick-off and electrostatic rebalance accelerometer having equalized gas damping

• US 7,022,543 B2
• Filed: 02/23/2005
• Issued: 04/04/2006
• Est. Priority Date: 11/20/2003
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Eskridge, Mark H., Malametz, David L.
• Primary Examiner(s): Smith, Bradley K.
• Assistant Examiner(s): Fulk, Steven J
• Application Number:
  US11/064,608
• Publication Number:
  US 20050139942A1
• Time in Patent Office: 405 Days
• Field of Search: 438/52, 735/142.3, 735/142.1, 735/141.7, 735/143.2, 735/143.6, 735/143.7, 735/143.8, 257/419
• US Class Current: 438/52
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 2015/0831 the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration

Abstract

A Micro Electro-Mechanical System (MEMS) acceleration sensing device, formed of a an elongated sensing element of substantially uniform thickness suspended for motion relative to a rotational axis offset between first and second ends thereof such that a first portion of the sensing element between the rotational axis and the first end is longer than a shorter second portion between the rotational axis and the second end; a stationary silicon substrate spaced away from the sensing element; a capacitor formed by a surface of the substrate and each of the first and second portions of the sensing element; and a valley formed in the substrate surface opposite from the first longer portion of the sensing element and spaced away from the rotational axis a distance substantially the same as the distance between the rotational axis and the second end of the sensing element.

Claims

1. A method for forming a capacitive pick-off acceleration-sensing device, the method comprising:

operating a first etching process on a silicon substrate for;

i) releasing from a bulk portion of the substrate an elongated teeter-totter type sensing element having substantially planar and parallel surfaces spaced apart by a substantially uniform thickness of the substrate, and a first relatively longer and more massive sensing portion and a second relatively shorter and less massive sensing portion separated by one or more flexures positioned therebetween and arranged substantially crosswise to a longitudinal axis of the sensing element, the first relatively longer and more massive sensing portion having a first sensing portion extended adjacent to the one or more flexures and a length substantially the same as a length of the second relatively shorter and less massive sensing portion and a second mass portion at distal end thereof extended at a length that is greater than the length of the second relatively shorter and less massive sensing portion,

ii) forming one or more mesas integral with the sensing element and supporting the one or more flexures at attachment points integral with the bulk portion of the substrate,

iii) forming first and second relatively narrow gas damping gaps between the bulk portion of the substrate and each of the first and second sensing portions of the teeter-totter type sensing element by forming first and second substantially planar surfaces on the bulk portion of the substrate spaced away a short distance from the respective first and second sensing portions of the sensing element; and

operating a second etching process on a silicon substrate for forming a gap relatively wider than the first and second relatively narrow gas damping gaps and positioned between the bulk portion of the substrate and the second mass portion at the distal end of the first relatively longer and more massive sensing portion of the sensing element.

2. The method of claim 1 wherein the second etching process is operated before the first second etch process.

3. The method of claim 1 wherein the first and second etching processes are operated according to conventional Micro Electro-Mechanical System (MEMS) techniques.

4. The method of claim 1 wherein the first and second etching processes are operated according to conventional High aspect ratio Micro Electro-Mechanical System (HIMEMS) techniques.

5. A method for forming a capacitive pick-off acceleration-sensing device, the method comprising:

forming an elongated sensing element of substantially uniform thickness suspended for motion relative to a rotational axis offset between first and second ends thereof such that a first portion of the sensing element between the rotational axis and the first end is longer than a shorter second portion between the rotational axis and the second end;

forming a stationary substrate surface spaced away from the sensing element;

forming a capacitor between the stationary substrate surface and each of the first and second portions of the sensing element; and

forming a valley in the stationary substrate surface opposite from the first longer portion of the sensing element and spaced away from the rotational axis a distance substantially the same as the distance between the rotational axis and the second end of the sensing element.

6. The method of claim 5 wherein forming a valley in the stationary substrate surface further comprises spacing a floor of the valley away from the longer first portion of the sensing element a distance that is greater than a capacitor gap formed between the stationary substrate surface and the longer first portion of the sensing element.

7. The method of claim 5 wherein forming a valley in the stationary substrate surface further comprises forming the valley over an area of the stationary substrate surface that is substantially commensurate with a portion at the end of the longer first portion of the sensing element that is extended beyond the length of the shorter second portion.

8. The method of claim 5 wherein forming a valley in the stationary substrate surface further comprises forming the valley over an area of the stationary substrate surface that extends beyond the end of the longer first portion of the sensing element.

9. The method of claim 5 wherein forming a valley in the stationary substrate surface further comprises forming the valley over an area of the stationary substrate surface that extends on each side of the longer first portion of the sensing element.

10. The method of claim 5 wherein forming a valley in the stationary substrate surface further comprises forming a floor of the valley that is spaced away from the longer first portion of the sensing element a distance on the order of approximately two or more times greater than spacing between the substrate and each of the first and second portions of the sensing element.

11. A method for forming a capacitive pick-off acceleration-sensing device, the method comprising:

in a silicon substrate having a substantially planar surface, etching a pendulous sensing element of substantially constant cross-section to be suspended in close proximity to the substrate surface for motion relative to a rotational axis that is offset between a longer and a shorter portion of the pendulous sensing element with the longer and shorter portions of the pendulous sensing element being structured forming different capacitors with respective first and second corresponding opposing portions of the substrate surface, the longer portion of the pendulous sensing element including a distal extended portion that is spaced away from the rotational axis at a distance that is substantially the same as the a length of the shorter portion measured between the rotational axis and a distal end thereof;

between respective the longer and shorter portions of the pendulous sensing element and the respective first and second corresponding opposing portions of the substrate surface, etching first and second gaps each structured for gas damping; and

between the distal extended portion of the longer portion of the pendulous sensing element and an opposing third portion of the substrate surface corresponding thereto, etching a third gap structured for gas damping.

12. The method of claim 11 wherein etching first and second gaps further comprises sizing the first and second gaps to space the longer and shorter portions of the pendulous sensing element from respective first and second corresponding opposing portions of the substrate surface for forming different capacitors therebetween.

13. The method of claim 11 wherein etching the third gap further comprises etching the third gap deeper than the first and second gaps.

14. The method of claim 13 wherein etching the third gap further comprises etching a valley in the third portion of the substrate surface corresponding to the distal extended portion of the longer portion of the pendulous sensing element.

15. The method of claim 14 wherein etching the valley that is formed in the third portion of the substrate surface whereof the third gap is formed further comprises etching the valley in a portion of the substrate surface that is extended away from the rotational axis beyond an end of the distal extended portion of the longer portion of the pendulous sensing element.

16. The method of claim 14 wherein etching the valley that is formed in the third portion of the substrate surface whereof the third gap is formed further comprises etching the valley in a portion of the substrate surface that is further extended to either side of the distal extended portion of the longer portion of the pendulous sensing element.

17. The method of claim 14 wherein etching the valley that is formed in the third portion of the substrate surface whereof the third gap is formed further comprises etching the valley in a portion of the substrate surface that is further extended both away from the rotational axis beyond an end of the distal extended portion of the longer portion of the pendulous sensing element and to both sides of the distal extended portion.

18. The method of claim 13 wherein etching the pendulous sensing element further comprises etching a pendulous sensing element that is structured as a pendulous acceleration-sensing element.

19. The method of claim 11, further comprising etching one or more flexures that suspend the pendulous sensing element relative to the substrate surface for motion relative to the rotational axis, the one or more flexures being formed integrally with the pendulous sensing element and respective attachment points formed as mesas elevated above the substrate first and second surfaces opposing the longer and a shorter portion of the pendulous sensing element.

20. The method of claim 11 wherein etching the third gap further comprises etching a gap that is at least significantly larger than the first and second gaps.