Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chips

• US 7,024,066 B1
• Filed: 12/17/2004
• Issued: 04/04/2006
• Est. Priority Date: 04/07/2003
• Status: Active Grant

• Current Assignee: Cisco Technology, Inc. (Cisco Systems, Inc.)
• Original Assignee: Luxtera Incorporated (Cisco Systems, Inc.)
• Inventors: Gunn, Lawrence C. III, Malendevich, Roman, Sussman, Myles
• Primary Examiner(s): HEALY, BRIAN
• Application Number:
  US11/016,497
• Time in Patent Office: 473 Days
• Field of Search: 385/11, 385/14, 385/52, 385/37, 385/129, 385/130, 385/131, 385/132, 356/614, 356/622
• US Class Current: 385/14
• CPC Class Codes: G02B 6/122 Basic optical elements, e.g. light-guiding paths

Abstract

This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical and optoelectronic testing by coupling probe light to/from the top of the wafer. In the described exemplary implementations, wafers are designed with one or more optical alignment features or structures. The alignment structures are alongside the devices to be tested, but are easier to find or locate by optical means, than the devices to be tested. An optical diffraction grating structure such as a Littrow grating may be used as reflective alignment structures. (FIG. 6B and paragraph 56.) A Littrow grating as an alignment structure produces a retro-reflection. A Littrow grating is a one-port optical device, with input and output beams going along the same path. Various exemplary implementations are shown in FIGS. 3C, 5, 6A, 6B, 7A and 7B and described in paragraphs 18–21, 39–40 and 53–64.

Claims

1. An apparatus comprising:

an integrated substrate,

an optical probe with an optical port above the substrate,

a Littrow grating disposed on the integrated substrate, and

a plurality of optical structures disposed on the substrate,

where a light beam is directed down from the optical port of the optical probe to the Littrow grating,

the light beam is retro-reflected up by the Littrow grating to the optical port of the optical probe, and

there is a plurality of positional relationships comprised of a positional relationship between the Littrow grating and each of the plurality of optical structures.

2. An apparatus according to claim 1, wherein the Littrow grating comprises an optical alignment structure used to designate a selected location on the integrated substrate as a reference point.

3. An apparatus according to claim 2, wherein the Littrow grating is used as a reference point to align the optical probe with the integrated substrate.

4. An apparatus according to claim 1, wherein the optical path between the optical probe and the Littrow grating is at an acute angle with respect to the normal to the integrated substrate.

5. An apparatus according to claim 4, wherein the Littrow grating is used as a reference point to align an angled optical beam from the optical probe with the integrated substrate.

6. An apparatus according to claim 4, wherein the optical probe has an angled end facet, where the angled end facet is substantially parallel to the surface of the integrated substrate.

7. An apparatus according to claim 1, wherein at least one of the plurality of positional relationships is used to locate a selected one of the plurality of optical structures, and the optical probe is moved to a position above and aligned with the selected one of the plurality of optical structures.

8. An apparatus according to claim 1, and further comprising a position map, where the plurality of positional relationships between the Littrow grating and the plurality of optical structures is stored in the position map.

9. An apparatus according to claim 1, and further comprising a light source and an optical detector,

where the light source provides the light beam coupled to the optical port of the optical probe, and

the optical detector receives the retro-reflected light beam coupled to the optical port of the optical probe from the Littrow grating.

10. An apparatus according to claim 9, and further comprising a measurement system,

where the optical detector is coupled to the measurement system for the measurement of optical return loss of the light beam retro-reflected up by the Littrow grating to the optical probe.

11. An apparatus according to claim 1, wherein the optical probe is comprised of at least one optical fiber selected from a group comprising:

a single mode fiber,

a polarization maintaining fiber,

a multi-mode fiber and

a lensed fiber.

12. An apparatus according to claim 1, wherein the optical probe comprises a fiber array, where the fiber array comprises a plurality of optical fibers, and at least one of the optical fibers is selected from a group comprising:

a single mode fiber,

a polarization maintaining fiber,

a multi-mode fiber and

a lensed fiber.

13. An apparatus according to claim 1, wherein the optical probe comprises at least one optical waveguide.

14. An apparatus according to claim 1, and further comprising:

an optical probe positioner, where the optical probe positioner controls the position of the optical probe with respect to the integrated substrate,

a substrate positioner, where the substrate positioner controls the position of the substrate with respect to the optical probe,

a control system to control the optical probe positioner and the substrate positioner, where the control system locates the Littrow grating on the integrated substrate, and

a position map, where the plurality of positional relationships between the Littrow grating and the plurality of optical structures is stored in the position map.

15. An apparatus according to claim 14, wherein the control system moves the optical probe to a position above a first one of the plurality of optical structures, by using the position map to provide the positional coordinates of the first optical structure relative to the Littrow grating.

16. An apparatus according to claim 15, wherein the first optical structure is optically coupled to a second optical structure and

the second optical structure is optically coupled to a third optical structure,

where the first optical structure comprises an optical port, and

the second optical structure comprises an optical waveguide.

17. An apparatus according to claim 16, wherein the control system couples a light beam from the optical probe to the third optical structure via the first and second optical structures to test the third optical structure.

18. An apparatus according to claim 1, wherein the Littrow grating has a shape selected from a group comprising:

an optically reflective dot,

an optically reflective line and

an optical structure with spatially varying reflectivity.

19. An apparatus according to claim 1, and further comprising an optical device disposed on the substrate, where a Littrow grating with spatially varying reflectivity surrounds the optical device on the substrate, and the optical device has substantially lower reflectivity than the Littrow grating.

20. An apparatus according to claim 1, wherein the Littrow grating comprises a diffraction grating disposed on the integrated substrate, where the diffraction grating is comprised of a plurality of optical structures.

21. An apparatus according to claim 1, wherein the integrated substrate is selected from a group comprising:

a wafer, a die and an integrated circuit.

22. An apparatus according to claim 1, wherein the substrate is selected from the group comprising:

silicon, silicon on insulator (SOI), silicon on sapphire (SOS), silicon on nothing (SON) and

a first layer of monocrystalline silicon,

a second layer of dielectric material disposed on the first layer,

a third layer of monocrystalline silicon disposed on the second layer,

a fourth layer of dielectric material disposed on the third layer,

a fifth layer of monocrystalline silicon disposed on the fourth layer.