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Condition assessment and life expectancy prediction for devices

  • US 7,024,335 B1
  • Filed: 07/25/2003
  • Issued: 04/04/2006
  • Est. Priority Date: 04/15/1998
  • Status: Expired due to Term
First Claim
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1. A method for assessing the condition of a device, comprising:

  • receiving a plurality of signals from a sensor operable to make one or more electrical measurements of a device;

    estimating an expected response of the device in accordance with the received signals by;

    estimating a disturbance from the received signals; and

    calculating the expected response in accordance with the disturbance;

    establishing a measured response of the device in accordance with the received signals;

    calculating an output residual according to the expected response and the measured response; and

    assessing the condition of the device by identifying a fault of the device in accordance with the output residual.

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