Electronic probe extender
First Claim
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1. An electronic probe extender, comprising:
- a probe connector capable of electronic contact to an electronic test probe;
an electronic signal conductor connected electronically to the probe connector; and
an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, wherein the electronic signal conductor is flexible, and wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector.
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Abstract
An electronic probe extender. In representative embodiments, an electronic probe extender is disclosed which includes a probe connector that is capable of electronic contact to an electronic test probe, an electronic signal conductor connected electronically to the probe connector, and an electronic probe tip connected electronically to the signal conductor. The electronic probe tip includes a tapered electronically conductive tip. The electronic probe tip is capable of electronic connection to an electronic test point.
142 Citations
12 Claims
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1. An electronic probe extender, comprising:
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a probe connector capable of electronic contact to an electronic test probe; an electronic signal conductor connected electronically to the probe connector; and an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, wherein the electronic signal conductor is flexible, and wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An electronic probe extender, comprising:
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a probe connector capable of electronic contact to an electronic test probe; an electronic signal conductor connected electronically to the probe connector; an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, wherein the electronic signal conductor is flexible, and wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector; and a tip extension, wherein the tip extension is interposed between the tapered electronically conductive tip and the electronic signal conductor and wherein the tip extension is capable of transferring an electronic signal from the tapered electronically conductive tip to the electronic signal conductor. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification