Methods and apparatus for eddy current inspection of metallic posts
First Claim
Patent Images
1. A method for inspecting a metallic post that is contoured in a single dimension for defects, said method comprising:
- clamping an eddy current probe having at least one jaw with a surface conforming to the contour to the metallic post, said at least one jaw also having a plurality of eddy current coils and said probe further having a sensor configured to sense at least one of position or motion;
operating the eddy current probe while clamped to produce data relating to structural integrity of the metallic post; and
moving the eddy current probe along the post while clamped and while sensing said structural integrity data and at least one of movement or position of the eddy current probe.
1 Assignment
0 Petitions
Accused Products
Abstract
An apparatus for inspecting a metallic post contoured in a single dimension for defects. The apparatus has a clamp having at least one jaw with a surface conforming to the contour to the metallic post. The conforming jaw or jaws also have a plurality of eddy current coils and the probe has at least one sensor configured to sense at least one of position or motion.
-
Citations
22 Claims
-
1. A method for inspecting a metallic post that is contoured in a single dimension for defects, said method comprising:
-
clamping an eddy current probe having at least one jaw with a surface conforming to the contour to the metallic post, said at least one jaw also having a plurality of eddy current coils and said probe further having a sensor configured to sense at least one of position or motion; operating the eddy current probe while clamped to produce data relating to structural integrity of the metallic post; and moving the eddy current probe along the post while clamped and while sensing said structural integrity data and at least one of movement or position of the eddy current probe. - View Dependent Claims (2, 3, 4, 5)
-
-
6. A method for inspecting a metallic post that is contoured in a single dimension for defects, said method comprising:
-
clamping an eddy current probe having at least one jaw with a surface conforming to the contour to the metallic post, said at least one jaw also having a plurality of eddy current coils and said sensor having at least one rubber wheel configured to move the eddy current probe along the metallic post; operating the eddy current probe while clamped to produce data relating to structural integrity of the metallic post; and moving the eddy current probe along the post using the rubber wheel while clamped and while sensing said structural integrity data. - View Dependent Claims (7, 8, 9, 10, 11, 12)
-
- 13. An apparatus for inspecting a metallic post contoured in a single dimension for defects, said apparatus comprising a clamp having at least one jaw with a surface conforming to the contour to the metallic post, said at least one jaw also having a plurality of eddy current coils and said probe having at least one sensor configured to sense at least one of position or motion.
- 18. An apparatus for inspecting a metallic post contoured in a single dimension for defects, said apparatus comprising a clamp having at least one jaw with a surface conforming to the contour to the metallic post, said at least one jaw also having a plurality of eddy current coils and said probe having at least one motorized wheel configured to accurately move said clamp along said metallic post while clamped thereto.
Specification