Testing MEM device array
First Claim
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1. A system comprising:
- an array of micro-electromechanical (MEM) device assemblies, each MEM device assembly having a MEM device capable of being individually written to but incapable of being electrically read; and
,a testing mechanism situated outside of the array of the MEM device assemblies to test each MEM device assembly for proper operation without directly reading the MEM device of the MEM device assembly.
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Abstract
A system of an embodiment of the invention includes an array of micro-electromechanical (MEM) device assemblies and a testing mechanism situated outside of the array of the MEM device assemblies. Each MEM device assembly includes a MEM device capable of being individually written to, but incapable of being electrically read. The testing mechanism tests each MEM device assembly for proper operation without directly reading the MEM device of the MEM device assembly.
77 Citations
28 Claims
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1. A system comprising:
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an array of micro-electromechanical (MEM) device assemblies, each MEM device assembly having a MEM device capable of being individually written to but incapable of being electrically read; and
,a testing mechanism situated outside of the array of the MEM device assemblies to test each MEM device assembly for proper operation without directly reading the MEM device of the MEM device assembly. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A system comprising:
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an array of nodes organized into rows and columns, each node having a micro-electromechanical (MEM) device incapable of being electrically read, a first switch coupling a column line to the MEM device and a second switch coupling a clear voltage to the MEM device; and
,a testing mechanism situated outside of the array of nodes to test each node for proper operation by selecting a row and a column of the nodes in which the node is located to turn on the first and the second switches of the node and by verifying that an electrical path exists from the column, and through the first and the second switches, to the clear voltage. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A system comprising:
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an array of micro-electromechanical (MEM) device assemblies, each MEM device assembly including a MEM device capable of being individually written to but incapable of being electrically read; and
,means for testing each MEM device assembly for proper operation without directly reading the MEM device of the MEM device assembly. - View Dependent Claims (20, 21, 22)
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23. A method comprising:
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charging a row of an array of micro-electromechanical (MEM) device assemblies organized into rows and columns to turn on a first transistor and a second transistor of each MEM device assembly of the row, each MEM device assembly including a MEM device capable of being individually written to but incapable of being electrically read; charging a column of the array of MEM device assemblies; verifying proper operation of the one MEM device assembly by confirming that an electrical path exists from the column, through the first transistor of the one MEM device assembly, through the second transistor of the one MEM device assembly, and to a clear voltage, wherein a source of the first transistor of each MEM device assembly is connected to a column of the array, a drain of the first transistor of the MEM device assembly is connected to a drain of the second transistor of the MEM device assembly, and a source of the second transistor of the MEM assembly is connected to the clear voltage. - View Dependent Claims (24)
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25. A method comprising:
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turning on one or more columns of an array of micro-electromechanical (MEM) device assemblies organized into rows and columns to charge the column, each MEM device assembly including a MEM device capable of being individually written to but incapable of being electrically read; verifying that the one or more columns of the array of MEM device assemblies properly received the charge; turning off the one or more columns of the array of MEM device assemblies, such that a charge capacitively remains on each MEM device assembly of the one or more columns; turning on a first row line of a row of the array of MEM device assemblies to turn on a first transistor of each MEM device assembly of the row; turning on a second row line of the row of the array of MEM device assemblies to turn on a second transistor of each MEM device assembly of the row; and
,verifying that the one or more columns of the array of MEM device assemblies properly discharged the charge, wherein a source of the first transistor of each MEM device assembly is connected to a column of the array, a drain of the first transistor of the MEM device assembly is connected to a drain of the second transistor of the MEM device assembly, and a source of the second transistor of the MEM assembly is connected to a clear voltage. - View Dependent Claims (26)
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27. A method comprising:
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providing, for each of an array of nodes organized into rows and columns, a micro-electromechanical (MEM) device incapable of being electrically read, a first transistor having a drain coupled to the MEM device, and a second transistor having a drain coupled to the MEM device; and
,situating a testing mechanism outside of the array of nodes that is capable of testing each node for proper operation by selecting a row and a column of the nodes in which the node is located to turn on the first and the second transistors of the node and by verifying that an electrical path exists from the column, through the first and the second transistors, and to a clear voltage. - View Dependent Claims (28)
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Specification