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Wavelength tunable surface plasmon resonance sensor

  • US 7,030,989 B2
  • Filed: 10/28/2003
  • Issued: 04/18/2006
  • Est. Priority Date: 10/28/2002
  • Status: Expired due to Fees
First Claim
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1. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:

  • a polychromatic light source for generating light propagating along an incident light propagation axis;

    a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;

    an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;

    a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and

    a selectably adjustable optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle and distribution of transmitted wavelengths of said optical interference filter.

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