Wavelength tunable surface plasmon resonance sensor
First Claim
1. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
- a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
a selectably adjustable optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle and distribution of transmitted wavelengths of said optical interference filter.
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Abstract
This invention provides methods, devices and device components for sensing, imaging and characterizing changes in the composition of a probe region. More particularly, the present invention provides methods and devices for detecting changes in the refractive index of a probe region positioned adjacent to a sensing surface, preferably a sensing surface comprising a thin conducting film supporting surface plasmon formation. In addition, the present invention provides methods and device for generating surface plasmons in a probe region and characterizing the composition of the probe region by generating one or more surface plasmon resonances curves and/or surface plasmon resonance images of the probe region.
123 Citations
71 Claims
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1. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
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a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
a selectably adjustable optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle and distribution of transmitted wavelengths of said optical interference filter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. A method of sensing the refractive index of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, thereby generating light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through a selectably adjustable optical interference filter positioned in the optical path between said light source and a detector, wherein light having a distribution of transmitted wavelengths is transmitted through said optical interference filter;
detecting said light having said distribution of transmitted wavelengths with said detector, and tuning the center wavelength of said distribution of transmitted wavelengths by adjusting said optical interference filter to transmit light having a continuously tunable distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, thereby sensing said refractive index of said probe region, wherein said adjusting step comprises the step of rotating said optical interference filter about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle of said interference filter and the distribution of wavelengths of light which are transmitted by said interference filter. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40)
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41. A method of sensing the refractive index of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating p-polarized light or s-polarized light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein light is reflected by said optical assembly thereby generating reflected light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through an optical interference filter positioned in the optical path between said light source and a detector, wherein said optical interference filter has a tilt angle with respect to said incident light propagation axis or said reflected light propagation axis selected so that said optical interference filter transmits incident light having a distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer;
detecting said reflected light using said detector, thereby measuring a first intensity of reflected light corresponding to p-polarized light and measuring a second intensity of reflected light corresponding reflected s-polarized light;
calculating an observed percent reflectivity by determining the ratio of said first intensity of reflected light to said second intensity of reflected light;
determining a correction factor by measuring the ratio of the intensity of p-polarized light transmitted by said optical interference filter to s-polarized light transmitted by said optical interference filter having said tilt angle; and
calculating a percent reflectivity corrected for polarization dependent transmission of light transmitted by said optical interference filter by dividing said observed percent reflectivity by said correction factor, thereby sensing the refractive index of said probe region. - View Dependent Claims (42, 43)
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44. A method of generating an image of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating p-polarized light or s-polarized light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein light is reflected by said optical assembly thereby generating reflected light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through an optical interference filter positioned in the optical path between said light source and a detector, wherein said optical interference filter has a tilt angle with respect to said incident light propagation axis or said reflected light propagation axis selected so that said optical interference filter transmits incident light having a distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer;
detecting said reflected light using said detector, thereby measuring a first two-dimensional distribution of reflected light intensities corresponding to p-polarized light and measuring second two-dimensional distribution of reflected light intensities corresponding to s-polarized light;
calculating a two dimensional distribution of observed percent reflectivities by determining the ratios of p-polarized reflected light intensities in said first two-dimensional distribution to s-polarized light intensities in said second two-dimensional distributions of reflected light intensities;
determining a two-dimensional array of correction factors corresponding to said tilt angle by measuring the ratios of the intensity of p-polarized light transmitted by said optical interference filter to s-polarized light transmitted by said optical interference filter having said tilt angle for each element in said two dimensional distribution of reflected light intensities ; and
calculating a two dimensional distribution of percent reflectivities corrected for polarization dependent transmission of light transmitted by said optical interference filter by dividing said observed percent reflectivities by said correction factors in said two dimensional array, thereby generating an image of said probe region. - View Dependent Claims (45, 46, 47)
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48. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
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a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
an optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said reflected light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle and distribution of transmitted wavelengths of said optical interference filter. - View Dependent Claims (49, 50, 51)
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52. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
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a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
an optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the distribution of wavelengths that are substantially prevented from transmitting through said optical interference filter. - View Dependent Claims (53, 54, 55)
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56. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
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a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
an optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter is rotationally adjustable about an axis which is orthogonal to said reflected light propagation axis, wherein rotation of said optical interference filter selectably adjusts the distribution of wavelengths that are substantially prevented from transmitting through said optical interference filter. - View Dependent Claims (57, 58, 59)
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60. A surface plasmon resonance sensor for sensing the refractive index of a probe region comprising:
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a polychromatic light source for generating light propagating along an incident light propagation axis;
a polarizer in optical communication with said polychromatic light source for selecting the polarization state of said light;
an optical assembly in optical communication with said polychromatic light source, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, wherein illumination of said optical assembly with said light generates light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting film comprises the probe region;
a detector in optical communication with said optical assembly for detecting said light propagating along said reflected light axis, thereby sensing the refractive index of said probe region; and
an optical interference filter positioned in the optical path between said light source and said detector for transmitting light having a distribution of transmitted wavelengths selected to generate surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, wherein the distribution of transmitted wavelengths is continuously tunable by adjustment of the optical interference filter, wherein said optical interference filter has first and second substantially parallel ends and said first end has a tilt angle selected over the range of 0°
to about 35°
. - View Dependent Claims (61, 62, 63)
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64. A method of sensing the refractive index of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, thereby generating light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through an optical interference filter positioned in the optical path between said light source and a detector, wherein light having a distribution of transmitted wavelengths is transmitted through said optical interference filter;
detecting said light having said distribution of transmitted wavelengths with said detector, and tuning the center wavelength of said distribution of transmitted wavelengths by adjusting said optical interference filter to transmit light having a continuously tunable distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, thereby sensing said refractive index of said probe regions, wherein said adjusting step comprises the step of rotating said optical interference filter about an axis which is orthogonal to said reflected light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle of said interference filter and the distribution of wavelengths of light which are transmitted by said interference filter. - View Dependent Claims (65, 66)
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67. A method of sensing the refractive index of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, thereby generating light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through an optical interference filter positioned in the optical path between said light source and a detector, wherein light having a distribution of transmitted wavelengths is transmitted through said optical interference filter;
detecting said light having said distribution of transmitted wavelengths with said detector, and tuning the center wavelength of said distribution of transmitted wavelengths by adjusting said optical interference filter to transmit light having a continuously tunable distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, thereby sensing said refractive index of said probe region, wherein said adjusting step comprises the step of rotating said optical interference filter about an axis which is orthogonal to said incident light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle of said interference filter and the distribution of wavelengths that are substantially prevented from transmitting through said optical interference filter. - View Dependent Claims (68, 69)
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70. A method of sensing the refractive index of a probe region comprising the steps of:
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passing light from a polychromatic light source through a polarizer, thereby generating light propagating along an incident light propagation axis;
directing said light onto an optical assembly, said optical assembly comprising a dielectric layer, a dielectric sample layer and a conducting layer positioned between said dielectric layer and said dielectric sample layer, thereby generating light propagating along a reflected light propagation axis, wherein a portion of said dielectric sample layer adjacent to said conducting layer comprises said probe region;
passing said light through an optical interference filter positioned in the optical path between said light source and a detector, wherein light having a distribution of transmitted wavelengths is transmitted through said optical interference filter;
detecting said light having said distribution of transmitted wavelengths with said detector, and tuning the center wavelength of said distribution of transmitted wavelengths by adjusting said optical interference filter to transmit light having a continuously tunable distribution of wavelengths that generates surface plasmons on a surface of said conducting layer in contact with said dielectric sample layer, thereby sensing said refractive index of said probe region, wherein said adjusting step comprises the step of rotating said optical interference filter about an axis which is orthogonal to said reflected light propagation axis, wherein rotation of said optical interference filter selectably adjusts the tilt angle of said interference filter and the distribution of wavelengths that are substantially prevented from transmitting through said optical interference filter. - View Dependent Claims (71)
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Specification