Photothermal transducing spectroscopic analyzer

• US 7,036,979 B2
• Filed: 01/29/2001
• Issued: 05/02/2006
• Est. Priority Date: 01/28/2000
• Status: Expired due to Fees

• Current Assignee: Asahi Kasei Kabushiki Kaisha
• Original Assignee: Asahi Kasei Kabushiki Kaisha
• Inventors: Mawatari, Kazuma
• Primary Examiner(s): VERBITSKY, GAIL KAPLAN
• Application Number:
  US10/181,267
• Publication Number:
  US 20030002038A1
• Time in Patent Office: 1,919 Days
• Field of Search: 374/5, 374/45, 374/57, 374/130, 374/131, 356/300, 356302-303, 356/311, 356/326, 356/432, 356/630, 356/213, 356/315, 356/316, 356/317
• US Class Current: 374/130
• CPC Class Codes: G01N 2021/1712 Thermal lens, mirage effect
• CPC Class Codes: G01N 21/171 with calorimetric detection, e.g. with thermal lens detection

Abstract

In a photothermal spectroscopic analyzer in which a probe light is made to fall on a thermal lens produced in a sample by an input of an excitation light and the sample is analyzed in accordance with a change of the probe light which is caused by the thermal lens, a light source of excitation light is composed of semiconductor laser light emitting means, and a light source of the probe light is composed of another semiconductor laser light emitting means, and furthermore a condenser lens for focusing the excitation light upon the sample and a condenser lens for focusing the probe light upon the thermal lens are configured by a common condenser lens. Such a photothermal spectroscopic analyzer according to the present invention satisfies all the requirements of small size, low manufacturing cost, high sensitivity, high precision, maintenance free performance, short start-up time, and automatic measurement for such a device as to perform POC analysis.

Claims

1. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens; and

rounding means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens brings the cross sectional geometry of at least one semiconductor laser beam emitted from the light sources into approximately the shape of a circle,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

4. The photothermal spectroscopic analyzer according to claim 1, further comprising astigmatism correction means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens reduces the astigmatism of at least one of the semiconductor laser beams emitted from the light sources.

5. The photothermal spectroscopic analyzer according to claim 1, wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means whose output is controllable.

6. The photothermal spectroscopic analyzer according to claim 1, wherein a wavelength of the excitation light is in a range of 400 to 700 nm.

7. The photothermal spectroscopic analyzer according to claim 1, wherein the light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

8. The photothermal spectroscopic analyzer according to claim 1, further comprising signal extraction means which extracts signals by synchronous detection.

9. The photothermal spectroscopic analyzer according to claim 1, further comprising

means for adjusting a distance between at least one of focal points of the excitation light and the probe light;

and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell.

2. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens; and

astigmatism correction means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens reduces the astigmatism of the semiconductor laser beam, emitted from the light source of the excitation light or the probe light,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

10. The photothermal spectroscopic analyzer according to claim 2, wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means which output is controllable.

11. The photothermal spectroscopic analyzer according to claim 2, wherein a wavelength of the excitation light is in a range of 400 to 700 nm.

12. The photothermal spectroscopic analyzer according to claim 2, wherein the light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

13. The photothermal spectroscopic analyzer according to claim 2, further comprising signal extraction means which extracts signals by synchronous detection.

14. The photothermal spectroscopic analyzer according to claim 2, further comprising

means for adjusting a distance between at least one of focal points of the excitation light and the probe light;

and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell.

3. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident;

focal point adjustment means in the at least one collimator lens for adjusting a focal point of the semiconductor laser beam by changing a distance in the direction of an optical axis between the at least one collimator lens and the light source of the excitation light or the probe light;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cells,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

15. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

16. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident; and

rounding means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens brings a cross sectional geometry of at least one semiconductor laser beam emitted from the light sources into approximately the shape of a circles,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

17. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident; and

astigmatism correction means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens reduces the astigmatism of at least one of the semiconductor laser beams emitted from the light sources,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

18. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

19. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident;

focal point adjustment means in the at least one collimator lens for adjusting a focal point of the semiconductor laser beam by changing a distance in the direction of an optical axis between the at least one collimator lens and the light source of the excitation light or the probe light; and

rounding means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens brings a cross sectional geometry of at least one semiconductor laser beam emitted from the light sources into approximately the shape of a circle,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

20. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

at least one collimator lens where a semiconductor laser beam emitted from the light source of the excitation light is incident, or where a semiconductor laser beam emitted from the light source of the probe light is incident;

focal point adjustment means in the at least one collimator lens for adjusting a focal point of the semiconductor laser beam by changing a distance in the direction of an optical axis between the at least one collimator lens and the light source of the excitation light or the probe light; and

astigmatism correction means between at least the light source of the excitation light or the light source of the probe light, wherein the condenser lens reduces the astigmatism of at least one of the semiconductor laser beams emitted from the light sources,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.

21. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens; and

at least one detection means of detecting a change in the probe light by the thermal lens;

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means whose output is controllable, and wherein a wavelength of the excitation light is in a range of 400 to 700 nm.

22. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens; and

at least one detection means of detecting a change in the probe light by the thermal lens;

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means whose output is controllable, and wherein the light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

23. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens; and

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means whose output is controllable.

24. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cells,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein the light source of the excitation light and the light source of the probe light are semiconductor laser beam-emitting means whose output is controllable.

25. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens; and

at least one detection means of detecting a change in the probe light by the thermal lens;

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, wherein a wavelength of the excitation light is in a range of 400 to 700 nm, and wherein the light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

26. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens; and

signal extraction means which extracts signals by synchronous detection,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein a wavelength of the excitation light is in a range of 400 to 700 nm.

27. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein a wavelength of the excitation light is in a range of 400 to 700 nm.

28. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens; and

signal extraction means which extracts signals by synchronous detection,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein a light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

29. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m, and wherein a light source of the excitation light is a semiconductor laser beam-emitting means which is adapted to be electrically modulated.

30. A photothermal spectroscopic analyzer in which a probe light is incident on a thermal lens generated in a sample by incidence of an excitation light, and for analyzing the sample on the basis of a change in the probe light by the thermal lens in that case, comprising:

a light source of the excitation light which comprises semiconductor laser beam-emitting means;

a light source of the probe light which comprises another semiconductor laser beam-emitting means, wherein a condenser lens which focuses the excitation light in the sample and a condenser lens which focuses the probe light in the thermal lens are made to be a common lens;

at least one detection means of detecting a change in the probe light by the thermal lens;

signal extraction means which extracts signals by synchronous detection;

means for adjusting a distance between at least one of focal points of the excitation light and the probe light; and

a sample cell which contains the sample, wherein the adjusting means utilizes light reflected from the sample cell,

wherein, when a transmission means, for allowing a part of the probe light which is changed by the thermal lens transmit, is provided between the sample and the at least one detection means, a distance in a direction of an optical axis between the transmission means and the sample is set at 10 cm or less, and a distance in the direction of an optical axis between the at least one detection means and the sample is set at 10 cm or less when a transmission means is not provided, and further a beam diameter in focal points of the excitation light and the probe light which are focused with the condenser lens, is 0.2 to 50 μ

m.