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Device and method for the early recognition and prediction of unit damage

  • US 7,039,557 B2
  • Filed: 07/03/2002
  • Issued: 05/02/2006
  • Est. Priority Date: 09/07/2001
  • Status: Expired due to Fees
First Claim
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1. A device for early detection and prediction of damage to assemblies in a machine plant, comprising:

  • at least one sensor which senses structure-borne sound in a machine plant that is being monitored, and which emits an analog measuring signal;

    an analog/digital converter device coupled to receive the analog measuring signal and convert it into a digital measuring signal;

    a digital signal processor, including a fast-Fourier transformation device for transforming the digital measuring signal into the frequency domain, and a cepstrum analysis device for generating a cepstrum containing resonance data relating to individual shock pulses in the time domain from the fast-Fourier-transformed digital measuring signal; and

    a storage device having stored therein a reference cepstrum that is representative of a new machine plant, for each of various operating states of the machine plant that is being monitored, together with an empirical value matrix relating to damaged assemblies and assembly components and anticipated remaining service lives;

    wherein,based on rotational speed information and load information the digital signal processor reads from the storage device a reference cepstrum that is representative of a new machine plant which is being operated in a current operating state of the storage device of the machine plant that is being monitored;

    the digital signal processor compares said reference cepstrum that is read from the storage device with a present cepstrum that is generated in the digital signal processor, and outputs a comparison result;

    a monitoring device monitors the comparison result of the present cepstrum and associated reference cepstrum to detect instances in which limiting values are exceeded, and forwards to the digital signal processor event information indicative of said instances in which said limiting values are exceeded; and

    in response to said event information provided by the monitoring device, and by referring to the empirical value matrix, the digital signal processor identifies a damaged assembly or assembly component, as well as its predicted remaining service life, and outputs to a central processor unit for further processing, a diagnostic signal, including information relating to damaged assemblies and their predicted remaining service life.

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