Crystal oscillator emulator

• US 7,042,301 B2
• Filed: 10/15/2002
• Issued: 05/09/2006
• Est. Priority Date: 10/15/2002
• Status: Expired due to Term

• Current Assignee: Marvell Asia Pte Limited (Marvell Technology Group Limited)
• Original Assignee: Marvell International Limited (Marvell Technology Group Limited)
• Inventors: Sutardja, Sehat
• Primary Examiner(s): KINKEAD, ARNOLD M
• Application Number:
  US10/272,247
• Publication Number:
  US 20040071029A1
• Time in Patent Office: 1,302 Days
• Field of Search: 331/1.A, 331/175, 331/176, 331/185, 331/25, 331/74, 331/66, 331/158
• US Class Current: 331/176
• CPC Class Codes: H03B 5/04 Modifications of generator to compensate for variations in physical values, e.g. power supply, load, temperature
• CPC Class Codes: H03L 1/025 and a memory for digitally storing correction values
• CPC Class Codes: H03L 1/026 by using a memory for digitally storing correction values H03L1/025 takes precedence
• CPC Class Codes: H03L 7/08 Details of the phase-locked loop

Abstract

A device for generating an output signal having a frequency. The device having a die temperature and including a first temperature sensor to sense a first temperature. A non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature. A semiconductor oscillator to generate the output signal as a function of the calibration information.

Claims

1. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information; and

a select input to select the output signal frequency as a function of an external passive component.

2. The device of claim 1 wherein the first temperature represents a change in temperature from an initial temperature to a second temperature.

3. The device of claim 1 wherein the first temperature is the die temperature near the semiconductor oscillator.

4. The device of claim 1 further comprising a heater to control the die temperature to a predetermined operating temperature.

5. The device of claim 4 wherein the heater operates in response to the first temperature sensor.

6. The device of claim 4 wherein the heater is selected from a group consisting of transistor heaters and resistive heaters.

7. The device of claim 3 further comprising an insulated package to contain the device.

8. The device of claim 1 further comprising a calibration circuit to generate the calibration information.

9. The device of claim 1 wherein the device is formed on a semiconductor die.

10. The device of claim 1 further comprising a phase lock loop (PLL) to receive the output signal and to generate a phase locked signal.

11. The device of claim 10 further comprising a frequency control device to dynamically vary the output signal frequency.

12. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information;

a second temperature sensor to sense an external temperature;

a heater to control the die temperature; and

a controller, in response to the first and second temperature sensors, to control the heater.

13. A device having an output frequency and a die temperature, comprising:

on a semiconductor die;

a) a first temperature sensor to sense the die temperature and generate a temperature signal;

b) a heater, in response to the temperature signal, to maintain the die temperature at a predetermined operating temperature;

c) a non-volatile memory to store calibration information relating the predetermined operating temperature to the output frequency; and

d) a semiconductor oscillator to generate the output frequency as a function of the calibration information;

e) a select input to select the output frequency as a function of an external passive component.

14. The device of claim 13 wherein the die temperature represents a change in temperature from an initial temperature to a second temperature.

15. The device of claim 13 wherein the heater is selected from a group consisting of transistor heaters and resistive heaters.

16. The device of claim 13 further comprising an insulated package to contain the device.

17. The device of claim 13 further comprising a calibration circuit to generate the calibration information.

18. A method of generating an output signal having a frequency, comprising:

providing a semiconductor oscillator having a die temperature;

sensing a first temperature associated with the semiconductor oscillator;

determining a change in temperature from a calibration temperature to the first temperature;

determining a frequency correction value based on the change in temperature;

generating the output signal frequency as a function of the frequency correction value;

sensing an external temperature; and

adjusting the die temperature to a temperature level greater than the external temperature and for which calibration information is stored.

19. The method of claim 18 further including storing calibration information for controlling the output frequency as a function of the die temperature.

20. The method of claim 19 wherein the calibration information includes frequency values.

21. The method of claim 20 further comprising generating the calibration information.

22. The method of claim 21 wherein generating the calibration information includes sensing the die temperature;

and

determining the frequency correction value to adjust the output signal frequency to a predetermined frequency.

23. The method of claim 22 wherein generating the calibration information further includes controlling the die temperature.

24. The method of claim 23 wherein controlling the die temperature includes increasing the die temperature;

and

25. The method of claim 18 further comprising controlling the die temperature, wherein controlling the die temperature includes heating the semiconductor oscillator.

26. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

first means for sensing a first temperature;

means for storing calibration information for controlling the output signal frequency as a function of the first temperature;

means for generating an oscillatory output signal as a function of the calibration information; and

means for selecting to select the output signal frequency as a function of an external passive component.

27. The device of claim 26 wherein the first temperature represents a change in temperature from an initial temperature to a second temperature.

28. The device of claim 26 wherein the first temperature is the die temperature near the semiconductor oscillator.

29. The device of claim 26 further comprising means for heating to control the die temperature to a predetermined operating temperature.

30. The device of claim 29 wherein the heating means operates in response to the first means.

31. The device of claim 29 wherein the heating means is selected from a group consisting of transistor heaters and resistive heaters.

32. The device of claim 28 further comprising insulating means to thermally isolate the device.

33. The device of claim 26 further comprising means for calibrating to generate the calibration information.

34. The device of claim 26 wherein the device is formed on a semiconductor die.

35. The device of claim 26 further comprising means for phase locking to receive the output signal and to generate a phase locked signal.

36. The device of claim 35 further comprising means for frequency controlling to dynamically vary the output signal frequency.

37. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information;

an active silicon oscillator to generate an output signal having a frequency;

a summer to determine a frequency error between the output signal of the semiconductor oscillator and the output signal of the active silicon oscillator; and

a controller to control the output signal of the active silicon oscillator as a function of the frequency error.

38. The device of claim 37 wherein the active silicon oscillator is a ring oscillator having a supply voltage;

and

further comprising a regulator, responsive to the controller, to control the supply voltage so that the frequency error is reduced.

53. The device of claim 37 wherein the controller further controls the output signal of the active semiconductor oscillator as a function of the first temperature.

54. The device of claim 38 wherein the regulator controls an electrical characteristic of the supply voltage selected from the group consisting of voltage and current.

39. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information;

a charge pump oscillator to generate an output signal having a frequency; and

the semiconductor oscillator in communication with the charge pump oscillator to calibrate the output signal of the charge pump oscillator.

40. The device of claim 39 wherein the charge pump oscillator further includes;

a phase detector to determine a phase error between the output signal of the charge pump oscillator and the output signal of the semiconductor oscillator; and

a voltage controlled oscillator in communication with the phase detector, to generate the output signal of the charge pump oscillator.

41. The device of claim 40 further comprising:

a multiplexer to select one of the output signal of the charge pump oscillator and the output signal of the semiconductor oscillator; and

a phase lock loop in communication with the multiplexer, to generate an output signal.

42. A method of generating an output signal having a frequency, comprising:

providing a semiconductor oscillator having a die temperature;

sensing a first temperature associated with the semiconductor oscillator;

determining a change in temperature from a calibration temperature to the first temperature;

determining a frequency correction value based on the change in temperature;

generating the output signal frequency as a function of the frequency correction value;

generating a periodic signal having a frequency;

calibrating the periodic signal with the output signal; and

intermittently powering down the semiconductor oscillator.

43. The method of claim 42 wherein calibrating includes;

determining a frequency error between the output signal and the periodic signal; and

controlling the frequency of the periodic signal to reduce the frequency error.

44. The method of claim 43 further comprising providing an active silicon oscillator having a supply voltage, to generate the periodic signal;

and

controlling an electrical characteristic of the supply voltage so that the frequency error is reduced.

45. The method of claim 42 further comprising providing a charge pump oscillator to generate the periodic signal.

46. The method of claim 45 further comprising determining a phase error between the periodic signal and the output signal.

47. The method of claim 46 further comprising selecting one of the output signal and the periodic signal;

and

generating a phase locked signal as a function of the selected one of the output signal and the periodic signal.

55. The method of claim 42 further comprising providing calibration information for the periodic signal;

and

when the semiconductor oscillator is powered down, controlling the periodic signal as a function of the first temperature and the periodic signal calibration information.

56. The method of claim 44 wherein the electrical characteristic of the supply voltage is selected from the group consisting of voltage and current.

48. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

first means for sensing a first temperature;

means for storing calibration information for controlling the output signal frequency as a function of the first temperature;

means for generating an oscillatory output signal as a function of the calibration information;

means for generating a periodic signal having a frequency;

means for summing to determine a frequency error between the output signal and the periodic signal; and

means for controlling to control the periodic signal as a function of the frequency error.

49. The device of claim 48 wherein the means for generating a periodic signal is a ring oscillator having a supply voltage;

and

further comprising means for regulating, responsive to the controlling means, to control an electrical characteristic of the supply voltage so that the frequency error is reduced.

57. The device of claim 48 wherein the controlling means further controls the means for generating the periodic signal as a function of the first temperature.

58. The device of claim 49 wherein the electrical characteristic of the supply voltage is selected from the group consisting of voltage and current.

50. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

first means for sensing a first temperature;

means for storing calibration information for controlling the output signal frequency as a function of the first temperature;

means for generating an oscillatory output signal as a function of the calibration information; and

means for generating a periodic signal having a frequency,

wherein the means for generating the oscillatory output signal in communication with the means for generating the periodic signal, to calibrate the output signal.

51. The device of claim 50 wherein the means for generating the periodic signal further includes;

means for determining a phase error between the output signal and the periodic signal; and

means for oscillating in communication with the means for determining the phase error, to generate the periodic signal.

52. The device of claim 51 further comprising means for selecting one of the output signal and the periodic signal;

and

a phase lock loop in communication with the means for selecting, to generate an output signal.

59. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information and independent from a crystal oscillator reference frequency; and

a select input to select the output signal frequency as a function of an external passive component.

60. A device having an output frequency and a die temperature, comprising:

on a semiconductor die;

a) a first temperature sensor to sense the die temperature and generate a temperature signal;

b) a heater, in response to the temperature signal, to maintain the die temperature at a predetermined operating temperature;

c) a non-volatile memory to store calibration information relating the predetermined operating temperature to the output frequency;

d) a semiconductor oscillator to generate the output frequency as a function of the calibration information and independent from a crystal oscillator reference frequency; and

e) a select input to select the output signal frequency as a function of an external passive component.

61. A method of generating an output signal having a frequency, comprising:

providing a semiconductor oscillator having a die temperature;

sensing a first temperature associated with the semiconductor oscillator;

determining a change in temperature from a calibration temperature to the first temperature;

determining a frequency correction value based on the change in temperature;

generating the output signal frequency as a function of the frequency correction value independently from a crystal oscillator reference frequency; and

selecting the output signal frequency as a function of an external passive component.

62. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

first means for sensing a first temperature;

means for storing calibration information for controlling the output signal frequency as a function of the first temperature;

semiconductor oscillating means for generating an oscillatory output signal as a function of the calibration information and independently from a crystal oscillator reference frequency; and

selecting means for selecting the output signal frequency as a function of an external passive component.

63. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

a first temperature sensor to sense a first temperature;

a non-volatile memory to store calibration information for controlling the output signal frequency as a function of the first temperature;

a semiconductor oscillator to generate the output signal as a function of the calibration information wherein the calibration information includes plural pre-stored correction values; and

a select input to select the output signal frequency as a function of an external passive component.

64. A device having an output frequency and a die temperature, comprising:

on a semiconductor die;

a) a first temperature sensor to sense the die temperature and generate a temperature signal;

b) a heater, in response to the temperature signal, to maintain the die temperature at a predetermined operating temperature;

c) a non-volatile memory to store calibration information relating the predetermined operating temperature to the output frequency; and

d) a semiconductor oscillator to generate the output frequency as a function of the calibration information wherein the calibration information includes plural pre-stored correction values; and

e) a select input to select the output signal frequency as a function of an external passive component.

65. A method of generating an output signal having a frequency, comprising:

providing a semiconductor oscillator having a die temperature;

sensing a first temperature associated with the semiconductor oscillator;

determining a change in temperature from a calibration temperature to the first temperature;

determining a frequency correction value based on the change in temperature;

generating the output signal frequency as a function of the frequency correction value wherein the calibration information includes plural pre-stored correction values; and

selecting the output signal frequency as a function of an external Passive component.

66. A device for generating an output signal having a frequency, the device having a die temperature, comprising:

first means for sensing a first temperature;

means for storing calibration information for controlling the output signal frequency as a function of the first temperature;

semiconductor oscillating means for generating an oscillatory output signal as a function of the calibration information wherein the calibration information includes plural pre-stored correction values; and

selecting means for selecting the output signal frequency as a function of an external passive component.