Multi-element thermocouple

• US 7,044,638 B2
• Filed: 05/24/2004
• Issued: 05/16/2006
• Est. Priority Date: 05/24/2004
• Status: Active Grant

• Current Assignee: Rosemount Aerospace, Inc. (Raytheon Technologies Corporation d/b/a RTX)
• Original Assignee: Rosemount Aerospace, Inc. (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Phillips, Richard W.
• Primary Examiner(s): Bennett, G. Bradley
• Application Number:
  US10/851,248
• Publication Number:
  US 20050259719A1
• Time in Patent Office: 722 Days
• Field of Search: 374179-182, 136/200, 136/205, 136/230, 136/235
• US Class Current: 374/180
• CPC Class Codes: G01K 2205/04 for measuring exhaust gas temperature
• CPC Class Codes: G01K 7/04 the object to be measured not forming one of the thermoelectric materials
• CPC Class Codes: G01K 7/13 Circuits for cold-junction compensation

Abstract

A multi-element thermocouple circuit includes at least two temperature measuring junctions. A first temperature measuring junction is formed by first and second thermoelements, each of the first and second thermoelements being formed of a noble metal or a noble metal alloy. The second temperature measuring junction, which connects to the distal end of the first thermoelement, is formed by third and fourth thermoelements, neither of which is formed from a noble metal or a noble alloy. A fifth thermoelement connects to the distal end of the second thermoelement and is formed of the same material as the fourth thermoelement. During operation, the distal ends of the third and fourth thermoelements define therebetween a first voltage difference corresponding to a temperature at the second temperature measuring junction, while the distal ends of the fourth and fifth thermoelements define a second voltage difference from which a temperature at the first temperature measuring junction may be obtained.

Claims

1. A multi-element thermocouple circuit comprising:

a first thermocouple comprising first and second thermoelements meeting at a first temperature measuring junction and having respective first and second distal ends, said first and second thermoelements being formed of respective first and second materials;

a second thermocouple comprising third and fourth thermoelements meeting at a second temperature measuring junction that is connected to said first distal end, said third and fourth thermoelements having respective third and fourth distal ends and being formed of respective third and fourth materials, neither of said third and fourth materials being the same as either said first or second material; and

a fifth thermoelement having a fifth proximal end connected to said second distal end and a fifth distal end, the fifth thermoelement being formed of said fourth material;

wherein;

the fourth thermoelement is common to two voltage difference subcircuits.

2. The multi-element thermocouple circuit according to claim 1, wherein each of the first and second materials is a noble metal or a noble-metal alloy.

3. The multi-element thermocouple circuit according to claim 1, further comprising a mating assembly having a first mating junction for connecting the first distal end to the second temperature measuring junction and a second mating junction for connecting the second distal end to the fifth proximal end.

4. The multi-element thermocouple circuit according to claim 2, wherein the mating assembly is configured to electrically isolate the first mating junction from the second mating junction and promote thermal conduction between the first and second mating junctions.

5. The multi-element thermocouple circuit according to claim 1, comprising a multi-wire cable that includes at least portions of the third, fourth and fifth thermoelements.

6. The multi-element thermocouple circuit according to claim 1, wherein the fourth and fifth thermoelements have the same length.

7. The multi-element thermocouple circuit according to claim 1, wherein the second thermocouple is a K-type thermocouple.

8. The multi-element thermocouple circuit according to claim 1, further comprising a sixth thermoelement formed of said third material, said sixth thermoelement and said fifth thermoelement meeting at a third temperature measuring junction to thereby form a third thermocouple.

9. A parallel thermocouple circuit comprising a plurality of identical multi-element thermocouple circuits,

each of said multi-element thermocouple circuits comprising:

a first thermocouple comprising first and second thermoelements meeting at a first temperature measuring junction and having respective first and second distal ends, said first and second thermoelements being formed of respective first and second materials;

a second thermocouple comprising third and fourth thermoelements meeting at a second temperature measuring junction that is connected to said first distal end, said third and fourth thermoelements having respective third and fourth distal ends and being formed of respective third and fourth materials, neither of said third and fourth materials being the same as either said first or second material; and

a fifth thermoelement having a fifth proximal end connected to said second distal end and a fifth distal end, the fifth thermoelement being formed of said fourth material;

wherein;

the third thermoelements of all of said plurality of identical multi-element circuits are connected to a first electrical terminal;

the fourth thermoelements of all of said plurality of identical multi-element circuits are connected to a second electrical terminal; and

the fifth thermoelements of all of said plurality of identical multi-element circuits are connected to a third electrical terminal.

10. The parallel thermocouple circuit according to claim 9, wherein each of the first and second materials is a noble metal or a noble-metal alloy.

11. A thermocouple probe comprising:

a first thermocouple comprising first and second thermoelements meeting at a first temperature measuring junction, said first and second thermoelements being formed of respective first and second materials;

a second thermocouple comprising third and fourth thermoelements meeting at a second temperature measuring junction that is connected to the first thermoelement, said third and fourth thermoelements being formed of respective third and fourth materials, neither of said third and fourth materials being the same as either said first or second material; and

a fifth thermoelement connected to said second thermoelement and being formed of said fourth material;

wherein;

the fourth thermoelement is common to two voltage difference subcircuits.

12. The parallel thermocouple circuit according to claim 11, wherein each of the first and second materials is a noble metal or a noble-metal alloy.

13. The thermocouple probe according to claim 11, further comprising:

a mating assembly into which the first and second thermoelements are received, and from which the third, fourth and fifth thermoelements emerge.

14. The thermocouple probe according to claim 13, wherein the mating assembly comprises an electrically non-conductive plug through which the third, fourth and fifth thermoelements pass, the second temperature measuring junction being located on an upstream side of the plug.

15. The thermocouple probe according to claim 13, wherein the mating assembly comprises an electrically non-conductive plug through which the first and second thermoelements pass, the second temperature measuring junction being located on a downstream side of the plug.

16. The thermocouple probe according to claim 13, wherein the mating assembly comprises an electrically insulating potting material, said second temperature measuring junction being embedded in said electrically insulating potting material.

17. The thermocouple probe according to claim 16, comprising a pigtail assembly provided on a downstream side of the potting material.

18. A thermocouple assembly comprising:

a thermocouple probe comprising;

a first thermocouple comprising first and second thermoelements meeting at a first temperature measuring junction, said first and second thermoelements being formed of respective first and second materials;

a second thermocouple comprising third and fourth thermoelements meeting at a second temperature measuring junction that is connected to the first thermoelement, said third and fourth thermoelements being formed of respective third and fourth materials, neither of said third and fourth materials being the same as either said first or second material; and

a fifth thermoelement connected to said second thermoelement and being formed of said fourth material; and

a cable detachably connected to said third, fourth and fifth thermoelements of said thermocouple probe, said cable comprising first and second conductors formed of said fourth material and connected to said fourth and fifth thermoelements, and a third conductor formed of said third material and connected to said third thermoelement.

19. The thermocouple assembly according to claim 18, wherein each of the first and second materials is a noble metal or a noble-metal alloy.

20. The thermocouple assembly according to claim 18, wherein the fourth thermoelement is common to two voltage difference subcircuits.