Probes with perpendicularly disposed spring pins, and methods of making and using same
First Claim
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1. A probe for probing test points on a target board, comprising:
- a first printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument;
a plurality of spring pins for probing the test points on the target board, each spring pin of which is i) disposed perpendicularly to the first PCB, and ii) electrically coupled to at least one signal route of the first PCB; and
a second PCB having a plurality of signal routes, wherein;
i) at least some of the plurality of spring pins are electrically coupled to the signal routes of the second PCB such that their probe tips extend beyond a first edge of the second PCB;
ii) the second PCB is abutted perpendicularly to the first PCB, with an edge of the second PCB opposite said first edge being abutted to the first PCB; and
iii) the signal routes of the second PCB are electrically coupled to the signal routes of the first PCB.
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Abstract
A probe for probing test points on a target board uses a printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument. The probe also has a plurality of spring pins for probing the test points on the target board. Each of the spring pins is i) disposed perpendicularly to the PCB, and ii) electrically coupled to at least one signal route of the PCB. By way of example, the spring pins may be fit into holes in the PCB or, alternately, they may be electrically coupled to signal routes of a second PCB that is perpendicularly abutted to the first PCB. Methods for making and using such probes are also disclosed.
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Citations
16 Claims
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1. A probe for probing test points on a target board, comprising:
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a first printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument; a plurality of spring pins for probing the test points on the target board, each spring pin of which is i) disposed perpendicularly to the first PCB, and ii) electrically coupled to at least one signal route of the first PCB; and a second PCB having a plurality of signal routes, wherein;
i) at least some of the plurality of spring pins are electrically coupled to the signal routes of the second PCB such that their probe tips extend beyond a first edge of the second PCB;
ii) the second PCB is abutted perpendicularly to the first PCB, with an edge of the second PCB opposite said first edge being abutted to the first PCB; and
iii) the signal routes of the second PCB are electrically coupled to the signal routes of the first PCB. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for forming a probe, comprising:
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forming a row of vias in a first PCB; cutting said first PCB along said row of vias, thereby exposing cross-sections of said vias at a cut edge of said first PCB; electrically coupling a plurality of spring pins to a plurality of signal routes of the first PCB, wherein said signal routes of the first PCB are electrically coupled to ones of said vias, and wherein said spring pins are electrically coupled to the first PCB such that their probe tips extend beyond an edge of said first PCB opposite said cut edge; abutting said cut edge of said first PCB to a second PCB, and electrically coupling said signal routes of the first PCB to signal routes of the second PCB, by means of said via cross-sections, so that said first PCB extends perpendicularly from said second PCB. - View Dependent Claims (12)
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13. A method for probing test points on a target board, comprising:
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selecting a test probe comprising a plurality of spring pins that are arranged perpendicularly to a main body portion of the test probe, said main body portion comprising a first printed circuit board (PCB) to which the plurality of spring pins are electrically coupled; moving the test probe over the target board to seat an alignment mechanism of the test probe to a corresponding alignment mechanism of the target board; applying pressure to at least one of the i) test probe or ii) target board to cause the plurality of spring pins to engage the test points on the target board; and routing signals from the test points to a test instrument via the test probe. - View Dependent Claims (14, 15, 16)
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Specification