Attachable/detachable probing tip system for a measurement probing system

• US 7,056,134 B2
• Filed: 05/27/2004
• Issued: 06/06/2006
• Est. Priority Date: 05/27/2004
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Pollock, Ira G., Hagerup, William A., Martin, Jim L., Law, William Q., Pooley, William R., Gessford, Marc A.
• Primary Examiner(s): Abrams, Neil
• Application Number:
  US10/856,230
• Publication Number:
  US 20050266733A1
• Time in Patent Office: 740 Days
• Field of Search: 439/169, 439/357, 439/358, 439/374, 439/77, 439/354, 324/72.5, 324/149
• US Class Current: 439/169
• CPC Class Codes: G01R 1/06711 Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
• CPC Class Codes: G01R 1/06772 High frequency probes
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).

Claims

1. An attachable/detachable probing tip system for a measurement probe mountable on a device under test comprising:

a housing having a probing tip mounting member and opposing substantially orthogonal attachment arms extending from the probing tip mounting member with the extending attachment arms defining an inner surface of the probing tip mounting member;

at least a first non-compressive set, resilient member disposed in the inner surface of the probing tip mounting member;

first and second probing tips with each respective first and second probing tip having a resistive element disposed between electrically conductive wires extending in opposing directions from the resistive element with one of the electrically conductive wires disposed over the non-compressive set, resilient member; and

latching means for securing the first and second probing tips to the housing.

2. The attachable/detachable probing tip system as recited in claim 1 wherein the non-compressive set, resilient member comprises a non-conductive elastomer.

3. The attachable/detachable probing tip system as recited in claim 2 wherein the non-conductive elastomer comprises silicon.

4. The attachable/detachable probing tip system as recited in claim 1 wherein the first and second probing tips comprise respective first and second resistive elements having electrically conductive wires extending in opposing directions from the resistive elements.

5. The attachable/detachable probing tip system as recited in claim 4 wherein the latching means comprises first and second sets of notches formed in the inner surface of the probe tip mounting member with the notches of each respective set of notches being generally vertically aligned and separated by a recess receiving the non-compressive set, resilient member with one of the notches of each set of notches has a channel portion extending from the inner surface to a substantially circular portion and the other of the notches of each set of notches having bores therein extending to a front surface of the probing tip mounting member such that one of the electrically conductive wires of each of the first and second resistive elements passes through the bores in the probing tip mounting member and is secured in the circular portions of the respective first and second sets of notches by passing through the channel portions of the notches.

6. The attachable/detachable probing tip system as recited in claim 5 wherein the probe tip mounting member has top, bottom and front surfaces and the recess has top and bottom surfaces wherein one of the notches of the first and second sets of notches extends from the top surface of the recess in the inner surface of the probe tip mounting member to the top surface of the probe tip mounting member and the other of the notches of the first and second sets of notches extends from the bottom surface of the recess to a base portion.

7. An attachable/detachable probing tip system for a measurement probe mountable on a device under test comprising:

a housing having a probing tip mounting member and opposing substantially orthogonal attachment arms extending from the probing tip mounting member with the extending attachment arms defining an inner surface of the probing tip mounting member;

at least a first non-compressive set, resilient member disposed in the inner surface of the probing tip mounting member;

first and second probing tips disposed over the compressive, resilient member with the first and second probing tips formed of a flexible substrate material having respective first and second probing tip arms defined by a notch formed in the flexible substrate material and at least first and second electrically conductive traces, with one of the electrically conductive traces extending along one of the probing tip arms and the other electrically conductive trace extending along the other probing tip arm forming the first and second probing tips with the proximal ends of the first and second electrically conductive traces forming respective electrical contact pads on the flexible substrate material that are disposed adjacent to and facing away from the non-compressive set, resilient member and the distal ends of the first and second conductive traces forming electrical contact pads on the respective first and second probing tip arms; and

latching means for securing the first and second probing tips to the housing.

8. The attachable/detachable probing tip system as recited in claim 7 wherein each of the first and second electrically conductive traces further comprises passive electrical elements disposed on the flexible substrate and electrically coupled with the respective first and second conductive traces.

9. The attachable/detachable probing tip system as recited in claim 8 wherein the passive electrical elements comprise discrete surface mounted resistive elements.

10. The attachable/detachable probing tip system as recited in claim 8 wherein the passive electrical elements comprise printed resistive elements formed on the flexible substrate.

11. The attachable/detachable probing tip system as recited in claim 8 wherein the passive electrical elements comprise discrete surface mounted resistive and capacitive elements.

12. The attachable/detachable probing tip system as recited in claim 8 wherein the passive electrical elements comprise printed resistive and capacitive elements formed on the flexible substrate.

13. The attachable/detachable probing tip system as recited in claim 8 wherein the first and second probing tips further comprise respective first and second resistive elements having opposing electrically conductive wire with one of the electrically conductive wires of each respective first and second resistive element electrically coupled to the respective electrical contact pads on the distal ends of the first and second electrically conductive traces and the other of the electrically conductive wires of each respective first and second resistive element forming the respective first and second probing tips.

14. The attachable/detachable probing tip system as recited in claim 13 further comprising electrically conductive apertures formed in the respective electrical contact pads of the first and second probing arms for receiving one of the electrically conductive wires extending from respective first and second resistive elements.

15. The attachable/detachable probing tip system as recited in claim 7 wherein the electrical conductive traces on each of the probing tip arms of the flexible substrate material further comprises a controlled impedance transmission line.

16. The attachable/detachable probing tip system as recited in claim 15 wherein the controlled impedance transmission line further comprises a coplanar waveguide having a signal conductor trace and adjacent ground traces disposed on either side of the signal conductor trace.

17. The attachable/detachable probing tip system as recited in claim 16 wherein each of the signal and ground traces of each coplanar waveguide is coupled to a corresponding electrical contact pad disposed on the electrical contact pad portion of the flexible substrate.

18. The attachable/detachable probing tip system as recited in claim 15 wherein the controlled impedance transmission line further comprises a microstrip waveguide having a signal conductor trace on one surface of the flexible substrate a ground trace disposed below the signal conductor trace on the opposite surface of the flexible substrate.

19. The attachable/detachable probing tip system as recited in claim 18 wherein each of the signal and ground traces of each microstrip waveguide is coupled to a corresponding electrical contact pad disposed on the electrical contact pad portion of the flexible substrate.

20. The attachable/detachable probing tip system as recited in claim 8 further comprising first and second recesses formed in the inner surface of the probing tip mounting member receiving first and second non-compressive set, resilient members.

21. The attachable/detachable probing tip system as recited in claim 8 wherein the attachment arms have a top surface and the latching means comprises:

an aperture formed in the flexible substrate material and lateral extensions forming respective downward facing shoulders on the sides of the flexible substrate material; and

an outwardly extending protrusion on the inner surface of the probing tip mounting member having a shouldered surface and recesses formed in the opposing attachment arms that extend downward from the top surface to form shouldered surfaces in the attachment arms that are adjacent to the probing tip mounting member wherein the outwardly extending protrusion receives the aperture in the flexible substrate material and the recesses receive the lateral extensions of the flexible substrate member with the downward facing shoulders of the lateral extensions engaging the shouldered surfaces of the recesses.