Cleaving process to fabricate multilayered substrates using low implantation doses
First Claim
1. A method of forming substrates, the method comprising:
- providing a donor substrate;
forming a cleave layer comprising a cleave plane on the donor substrate, the cleave layer comprising silicon germanium;
forming a device layer on the cleave layer, the device layer comprising epitaxial silicon;
introducing particles into the cleave layer to add stress to the cleave plane, where the particles are introduced in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave layer;
redistributing a portion of the particles within the cleave layer to form a higher concentration region of the particles in a region in a vicinity of the cleave plane, where the distribution is carried out in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave layer;
providing selected energy to the donor substrate to cleave the device layer at the cleave plane, whereupon the selected energy is applied to create a controlled cleaving action to remove the device layer from a portion of the cleave layer in a controlled manner.
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Abstract
A method of forming substrates, e.g., silicon on insulator, silicon on silicon. The method includes providing a donor substrate, e.g., silicon wafer. The method also includes forming a cleave layer on the donor substrate that contains the cleave plane, the plane of eventual separation. In a specific embodiment, the cleave layer comprising silicon germanium. The method also includes forming a device layer (e.g., epitaxial silicon) on the cleave layer. The method also includes introducing particles into the cleave layer to add stress in the cleave layer. The particles within the cleave layer are then redistributed to form a high concentration region of the particles in the vicinity of the cleave plane, where the redistribution of the particles is carried out in a manner substantially free from microbubble or microcavity formation of the particles in the cleave plane. That is, the particles are generally at a low dose, which is defined herein as a lack of microbubble or microcavity formation in the cleave plane. The method also includes providing selected energy to the donor substrate to cleave the device layer from the cleave layer at the cleave plane, whereupon the selected energy is applied to create a controlled cleaving action to remove the device layer from a portion of the cleave layer in a controlled manner.
289 Citations
16 Claims
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1. A method of forming substrates, the method comprising:
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providing a donor substrate;
forming a cleave layer comprising a cleave plane on the donor substrate, the cleave layer comprising silicon germanium;
forming a device layer on the cleave layer, the device layer comprising epitaxial silicon;
introducing particles into the cleave layer to add stress to the cleave plane, where the particles are introduced in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave layer;
redistributing a portion of the particles within the cleave layer to form a higher concentration region of the particles in a region in a vicinity of the cleave plane, where the distribution is carried out in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave layer;
providing selected energy to the donor substrate to cleave the device layer at the cleave plane, whereupon the selected energy is applied to create a controlled cleaving action to remove the device layer from a portion of the cleave layer in a controlled manner. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 16)
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11. A method of forming a multilayered substrate, the method comprising:
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providing a donor substrate;
forming a cleave layer comprising a cleave plane on the donor substrate, the cleave layer comprising silicon germanium;
forming a device layer on the cleave layer, the device layer comprising epitaxial silicon;
introducing particles into the cleave layer to add stress in the cleave layer, where the particles are introduced in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave layer;
bonding a handle substrate on the cleave layer;
redistributing a portion of the particles within the cleave layer to form a higher concentration of the particles in a region in the vicinity of the cleave plane, where the redistribution is carried out in a manner substantially free from microbubble or microcavity formation of the particles along the cleave plane within the cleave plane;
providing selected energy to the donor substrate to cleave the device layer at the cleave plane, whereupon the selected energy is applied to create a controlled cleaving action to remove the device layer from a portion of the cleave layer in a controlled manner to separate the handle substrate that has the device layer from the donor substrate. - View Dependent Claims (12)
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13. A method of forming substrates, the method comprising;
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providing a donor substrate;
forming a cleave layer comprising a cleave plane on the donor substrate, the cleave layer comprising silicon germanium;
forming a device layer on the cleave layer, the device layer comprising epitaxial silicon;
introducing particles into the cleave layer to add stress to the cleave plane, where the particles are selected from those species that are derived free from hydrogen gas, helium gas, or any other species that forms microbubbles or microcavities; and
separating the device layer from the donor substrate at the cleave plane of the donor substrate by a controlled cleaving action. - View Dependent Claims (14, 15)
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Specification