Systems and methods for testing wireless devices

• US 7,057,518 B2
• Filed: 06/22/2001
• Issued: 06/06/2006
• Est. Priority Date: 06/22/2001
• Status: Expired due to Term

• Current Assignee: Intellectual Ventures I LLC (Intellectual Ventures LLC)
• Original Assignee: Gallitzin Allegheny LLC (Intellectual Ventures LLC)
• Inventors: Schmidt, Dominik J.
• Primary Examiner(s): La, Anh V.
• Application Number:
  US09/887,908
• Publication Number:
  US 20020196029A1
• Time in Patent Office: 1,810 Days
• Field of Search: 340/635, 340/634, 324/765, 324/500, 324/754, 324/764, 324/601, 324/605, 714/733, 714/734, 714/30, 714/736, 714/25, 714/46, 714/41
• US Class Current: 340/635
• CPC Class Codes: H04W 24/00 Supervisory, monitoring or testing arrangements
• CPC Class Codes: H04W 88/02 Terminal devices

Abstract

Systems and methods are disclosed for parallel testing one or more wireless devices using a single wireless command, each device including a processor and memory coupled to the processor. The system includes a tester adapted to exercise the wireless devices, including: a transceiver adapted to communicate with each wireless device; and a computer coupled to the transceiver, the computer adapted to test all wireless devices in parallel by issuing a single test command using a wireless signal, the computer adapted to store test patterns and test results.

Claims

1. A method comprising:

wirelessly receiving a single test command on a plurality of wireless devices formed on a wafer via radio frequency circuitry of each of the plurality of wireless devices operable in a test mode and normal operation; and

simultaneously testing the plurality of wireless devices in response to receiving the single test command.

2. The method of claim 1, further comprising switching all of the plurality of wireless devices on to wirelessly receive the single test command.

3. The method of claim 2, further comprising switching on a transistor coupled to each of the plurality of wireless devices to switch all of the plurality of wireless devices on.

4. The method of claim 1, further comprising wirelessly receiving the single test command without an antenna coupled to the plurality of wireless devices.

5. The method of claim 4, further comprising wirelessly receiving the single test command via one or more pads formed on each of the plurality of wireless devices.

6. The method of claim 4, further comprising wirelessly receiving the single test command via a power line formed on each of the plurality of wireless devices.

7. The method of claim 1, further comprising communicating with individual ones of the plurality of wireless devices regarding test results.

8. The method of claim 7, further comprising communicating with the individual ones of the plurality of wireless devices based on a unique identifier.

9. The method of claim 1, further comprising eliminating any of the plurality of the wireless devices that does not identify itself in response to the single test command.

10. The method of claim 9, further comprising next eliminating any of the plurality of wireless devices that fail a volatile memory test.

11. The method of claim 10, further comprising next eliminating any of the plurality of wireless devices that fail a digital circuitry test.

12. The method of claim 11, further comprising next eliminating any of the plurality of wireless devices that fail a mixed signal interface test.

13. A system comprising:

a test unit to issue a single test command for transmission to a plurality of wireless devices formed on a wafer, the single test command to cause testing of the plurality of wireless devices via radio frequency circuitry of each of the plurality of wireless devices operable in a test mode and normal operation of the wireless device in parallel; and

an antenna coupled to the test unit to wirelessly transmit the single test command for receipt by the plurality of wireless devices.

14. The system of claim 13, further comprising a wafer sorter coupled to the test unit.

15. The system of claim 13, wherein the test unit is configured to selectively address selected ones of the plurality of wireless devices to receive test results therefrom.

16. The system of claim 15, wherein the system is configured to provide power in parallel to the plurality of wireless devices via a single power pad on the wafer.

17. An apparatus comprising:

a wafer having a plurality of wireless devices formed thereon, wherein each of the plurality of wireless devices comprises an analog portion including a cellular radio core and a short-range wireless transceiver core coupled to the cellular radio core and a digital portion including a processor coupled to the cellular radio core and the short-range wireless transceiver core to handle a plurality of wireless communication protocols and a memory coupled to the processor, the wafer comprising;

a power pad coupled to each of the plurality of wireless devices to provide a power supply voltage thereto during a test operation; and

a ground pad coupled to each of the plurality of wireless devices to provide a reference voltage thereto during the test operation.

18. The apparatus of claim 17, further comprising a plurality of transistors, each coupled to provide the power supply voltage to a corresponding one of the plurality of wireless devices under control of a voltage on a bit pad.

19. The apparatus of claim 17, wherein each of the wireless devices is configured to directly receive a test command from a tester wirelessly.

20. The apparatus of claim 17, wherein the short-range wireless transceiver core is configured to wirelessly receive signals from a tester without a dedicated antenna.