Evaluating binding affinities by force stratification and force panning

• US 7,060,448 B2
• Filed: 10/04/2004
• Issued: 06/13/2006
• Est. Priority Date: 10/10/2000
• Status: Expired due to Fees

• Current Assignee: BioForce Nanosciences, Inc.
• Original Assignee: BioForce Nanosciences, Inc.
• Inventors: Henderson, Eric, Mosher, Curtis
• Primary Examiner(s): Le, Long V.
• Assistant Examiner(s): LUM, LEON YUN BON
• Application Number:
  US10/958,092
• Publication Number:
  US 20050059091A1
• Time in Patent Office: 617 Days
• Field of Search: 435/4, 435 71- 72, 435/287.1, 435/287.2, 435/287.9, 436517-518, 436/524, 436/807, 422/55, 422/266, 422/50, 422/57, 422/68.1, 422/99, 73104-105, 250/307, 356/501
• US Class Current: 435/7.1
• CPC Class Codes: C07K 16/065 Purification, fragmentation
• CPC Class Codes: Y10S 436/807 Apparatus included in process claim, e.g. physical support structures

Abstract

The present invention is a method for selectively removing objects from a surface utilizing a probe. The probe is scanned over the surface utilizing a greater and greater relative amount of force so that a certain number of the objects are removed from the surface. The force required to remove the objects from the surface can be calculated utilizing Hook'"'"'s law and the spring constant of the probe. After removal of the objects that have a relatively weaker binding affinity with the surface, the remaining objects can be harvested, characterized, and subjected to further study.

Claims

1. A method for determining a binding affinity between an object and one or more materials using a scanning probe microscope comprising:

(a) obtaining a surface, the surface further comprising one or more materials deposited thereon;

(b) affixing at least one object to the one or more materials deposited on the surface;

(c) applying a force with a tip of the scanning probe microscope to a first object to remove the first object from a first material, wherein the first object is displaced from the first material and the tip; and

(d) calculating the binding affinity between the first object and the first material from the force applied to remove the object from the first material.

2. The method of claim 1, further comprising monitoring the force required to remove the first object from the material.

3. The method of claim 1, further comprising scanning the surface of step (b) to locate a first object.

4. The method of claim 3, wherein scanning the surface and applying the force is performed in a liquid medium.

5. The method of claim 1, further comprising collecting the displaced first object.

6. The method of claim 1, wherein the first object and first material of step (d) are selected from the group of pairs of substances consisting of:

a first protein and a second protein;

a first nucleic acid and a second nucleic acid;

an antibody and an antigen;

a receptor and a ligand;

a drug candidate molecule and its molecular target;

drugs and drug inhibitors;

a first cell and a second cell;

a first virus and a second virus;

a cell and a substrate; and

a virus and a substrate.

7. A method for separating objects based on relative binding affinities using a scanning probe microscope comprising:

(a) depositing at least one material on a surface;

(b) affixing a plurality of objects tote at least one material deposited on the surface; and

(c) applying a first force to the surface with a tip of the scanning probe microscope such tat a first object is removed from a first material deposited on the surface, wherein the first object is displaced from the first material and the tip, and wherein a second object is retained on the first material or on a second material deposited on the surface.

8. The method of claim 7, further comprising scanning the surface of step (c) to locate a first object.

9. The method of claim 7, further comprising collecting the removed first object of step (c).

10. The method of claim 7, further comprising the steps of:

(d) applying a second greater force to the surface with the scanning probe microscope such that the second object is removed from the first or second material deposited on the surface.

11. The method of claim 10, further comprising collecting the removed second object of step (d).

12. The method of claim 10, further comprising:

(e) calculating the relative binding affinities of the first object removed in step (c) and the second object removed in step (d).

13. The method of claim 7 further comprising:

(d) applying an incrementally increased force with the scanning probe microscope to a second object to remove the second object from the first or second material deposited on the surface.

14. The method of claim 13, further comprising collecting the removed second object of step (d).